JPS6359273B2 - - Google Patents

Info

Publication number
JPS6359273B2
JPS6359273B2 JP58053490A JP5349083A JPS6359273B2 JP S6359273 B2 JPS6359273 B2 JP S6359273B2 JP 58053490 A JP58053490 A JP 58053490A JP 5349083 A JP5349083 A JP 5349083A JP S6359273 B2 JPS6359273 B2 JP S6359273B2
Authority
JP
Japan
Prior art keywords
wafer
chamber
measurement
wafer tray
measurement chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58053490A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59181076A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP58053490A priority Critical patent/JPS59181076A/ja
Publication of JPS59181076A publication Critical patent/JPS59181076A/ja
Publication of JPS6359273B2 publication Critical patent/JPS6359273B2/ja
Granted legal-status Critical Current

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Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
JP58053490A 1983-03-31 1983-03-31 低温自動テスタ− Granted JPS59181076A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58053490A JPS59181076A (ja) 1983-03-31 1983-03-31 低温自動テスタ−

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58053490A JPS59181076A (ja) 1983-03-31 1983-03-31 低温自動テスタ−

Publications (2)

Publication Number Publication Date
JPS59181076A JPS59181076A (ja) 1984-10-15
JPS6359273B2 true JPS6359273B2 (cs) 1988-11-18

Family

ID=12944277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58053490A Granted JPS59181076A (ja) 1983-03-31 1983-03-31 低温自動テスタ−

Country Status (1)

Country Link
JP (1) JPS59181076A (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2517243B2 (ja) * 1986-09-11 1996-07-24 東京エレクトロン株式会社 プロ−ブ装置
US6213636B1 (en) * 1998-08-21 2001-04-10 Winbond Electronics Corp. Furnace for testing integrated circuits

Also Published As

Publication number Publication date
JPS59181076A (ja) 1984-10-15

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