JPS6350847Y2 - - Google Patents

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Publication number
JPS6350847Y2
JPS6350847Y2 JP13748684U JP13748684U JPS6350847Y2 JP S6350847 Y2 JPS6350847 Y2 JP S6350847Y2 JP 13748684 U JP13748684 U JP 13748684U JP 13748684 U JP13748684 U JP 13748684U JP S6350847 Y2 JPS6350847 Y2 JP S6350847Y2
Authority
JP
Japan
Prior art keywords
developer
rotary table
wafer
outlet
discharge port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13748684U
Other languages
Japanese (ja)
Other versions
JPS6151733U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13748684U priority Critical patent/JPS6350847Y2/ja
Publication of JPS6151733U publication Critical patent/JPS6151733U/ja
Application granted granted Critical
Publication of JPS6350847Y2 publication Critical patent/JPS6350847Y2/ja
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 産業上の利用分野 この考案は半導体ウエーハの表面のレジスト膜
に半導体素子形成用パターンを露光転写した後、
現像してパターンを形成するために用いられる半
導体装置の製造装置であつて、特に廃液の処理を
容易に行えるようにした製造装置に関するもので
ある。
[Detailed description of the invention] Industrial application field This invention is based on the following method: After exposing and transferring a pattern for forming semiconductor elements onto a resist film on the surface of a semiconductor wafer,
The present invention relates to a manufacturing apparatus for semiconductor devices used for developing and forming patterns, and in particular to a manufacturing apparatus that facilitates the treatment of waste liquid.

従来の技術 IC等の半導体装置は半導体ウエーハ(以下単
にウエーハと称す)を基板としてこれに各種の加
工を施すことによつて製造されているが、その製
造工程の中にウエーハの表面のフオトレジスト
(以下単にレジストと称す)に半導体素子形成用
パターンを露光転写し、現像して穴明けを行う工
程がある。この工程はウエーハの表面にレジスト
を塗布し、この後マスクを被せて露光させ、露光
後現像処理を行つてレジストの不要部分を除去し
てパターンに沿つた穴明けを行う工程である。
2. Description of the Related Art Semiconductor devices such as ICs are manufactured using semiconductor wafers (hereinafter simply referred to as wafers) as substrates, which are subjected to various processes. There is a step of exposing and transferring a pattern for forming a semiconductor element onto a resist (hereinafter simply referred to as a resist), developing it, and making holes. This step is a step in which a resist is applied to the surface of the wafer, then a mask is placed on the wafer, the wafer is exposed to light, and after the exposure, a development process is performed to remove unnecessary portions of the resist and to form holes along the pattern.

ところで、前記現像処理時にウエーハの表面に
現像液を付着させるには、従来作業性の点からキ
ヤリヤに多数のウエーハを収容させておき、キヤ
リヤごとウエーハを現像液に浸漬させて行つてい
る。その為大量の現像液が必要であつた。
By the way, in order to attach a developer to the surface of a wafer during the development process, conventionally, a large number of wafers are housed in a carrier from the viewpoint of workability, and the wafers are immersed together with the carrier in the developer. Therefore, a large amount of developer was required.

一方現像液にはレジストに対応してネガ形とポ
ジ形とがあり、近時、集積度の増大に伴つて微細
なパターンを形成できるポジ形レジストが多用さ
れ、これに応じてポジ形現像液が用いられるよう
になつてきた。このポジ形現像液は、例えばテト
ラメチルアンモニウムハイドロオキサイドを含有
した現像液を用いており、毒性が非常に強く有害
である為にその使用量を抑える必要があり、従来
装置の改善が望まれていた。
On the other hand, there are two types of developer, negative type and positive type, depending on the resist.Recently, as the degree of integration has increased, positive type resists, which can form fine patterns, are often used, and accordingly, positive type developers has come to be used. This positive developing solution uses a developer containing, for example, tetramethylammonium hydroxide, which is highly toxic and harmful, so it is necessary to reduce the amount used, and improvements to conventional equipment are desired. Ta.

そこで、現像液の使用量を少なくする装置とし
て第5図に示す様に、ウエーハ1を支持する回転
テーブル2を処理容器3内に回転自在に設け、前
記回転テーブル2をモータ4にて回転させるよう
にした装置が用いられるようになつてきた。この
装置は露光を完了したウエーハ1を回転テーブル
2上に載せて真空吸引力で固定し、この後ウエー
ハ1の中央部に現像液を適当量供給し、供給後、
モータ4にて回転テーブル2を、現像液を拡散さ
せるのに適当な速さで回転させ、回転時の遠心力
でもつて現像液をウエーハ1の表面全面に拡げて
付着させ、現像液がウエーハ1の表面全面に拡が
ると回転テーブル2を静止または低速回転させて
所定時間保持して現像処理を施す。現像処理が完
了すると、回転テーブル2を高速回転させて、ウ
エーハ1の周縁から遠心力で飛ばされた現像液を
処理容器3の側壁3aに沿つて降下させて集めて
底部3bに形成した排出口5から排出させる。こ
の後、回転テーブル2を高速回転させたまま、ウ
エーハ1の表面に大量の洗浄水を供給し、洗浄水
にて現像液を洗い流し、遠心力で飛ばされた現像
液と洗浄水との混合液を処理容器3の側壁3aに
沿つて降下させて集め、排出口5から排出させ、
浄化装置にて排水処理している。
Therefore, as a device for reducing the amount of developer used, as shown in FIG. Such devices have come into use. In this device, a wafer 1 that has been exposed is placed on a rotary table 2 and fixed by vacuum suction, and then an appropriate amount of developer is supplied to the center of the wafer 1.
The rotary table 2 is rotated by the motor 4 at an appropriate speed to diffuse the developer, and the centrifugal force during rotation causes the developer to spread and adhere to the entire surface of the wafer 1. When the color spreads over the entire surface, the rotary table 2 is kept stationary or rotated at low speed for a predetermined period of time to perform development processing. When the development process is completed, the rotary table 2 is rotated at high speed, and the developer liquid blown away by centrifugal force from the periphery of the wafer 1 is collected by descending along the side wall 3a of the processing container 3, and is collected through a discharge port formed in the bottom part 3b. Discharge from 5. After this, a large amount of cleaning water is supplied to the surface of the wafer 1 while the rotary table 2 is kept rotating at high speed, the developer is washed away with the cleaning water, and a mixture of the developer and the cleaning water is blown away by centrifugal force. is lowered along the side wall 3a of the processing container 3, collected, and discharged from the discharge port 5,
Wastewater is treated with a purification device.

考案が解決しようとする問題点 上記装置によれば、ウエーハ1上に現像液を適
当量供給し、遠心力にて拡げてウエーハ1の全面
に供給するものであるから、浸漬式に較べて現像
液の使用量が著しく減少する。しかし、上記装置
では現像後及び洗浄時に排出される現像液及び洗
浄水を共に処理容器3の排出口5から排出させて
浄化装置にて浄化させている為に、大量の現像液
及び洗浄水が混合されて浄化装置に送られ、排水
処理が困難で、現像液の分離回収も困難であつ
た。その為大型の浄化装置となつていた。
Problems to be Solved by the Invention According to the above device, an appropriate amount of developer is supplied onto the wafer 1, and the developer is spread by centrifugal force and supplied to the entire surface of the wafer 1. Therefore, compared to the immersion method, the developing solution is The amount of liquid used is significantly reduced. However, in the above device, the developer and cleaning water discharged after development and during cleaning are both discharged from the outlet 5 of the processing container 3 and purified in the purification device, so a large amount of developer and cleaning water are used. The waste water was mixed and sent to a purification device, making it difficult to treat the wastewater and also difficult to separate and recover the developer. Therefore, it became a large purification device.

問題点を解決するための手段 この考案はウエーハを保持する回転テーブル
と、回転テーブルを回転させる回転制御可能な第
1の駆動モータと、底部の2個所に廃液を排出さ
せる第1及び第2の排出口を形成し、回転テーブ
ルの周囲を囲繞する外容器と、回転テーブルと外
容器との間に回動自在に配されて回転テーブルの
周囲を囲繞し、底部に前記外容器の第1の排出口
或いは第2の排出口と一致する第3の排出口を形
成した内容器と、内容器を回動させる第2の駆動
モータとで製造装置を構成する。
Means for Solving the Problems This invention consists of a rotary table that holds a wafer, a first drive motor whose rotation can be controlled to rotate the rotary table, and first and second drive motors that discharge waste liquid to two locations at the bottom. an outer container that forms a discharge port and surrounds the rotary table; and an outer container that is rotatably disposed between the rotary table and the outer container and surrounds the rotary table; A manufacturing apparatus is constituted by an inner container having a discharge port or a third discharge port that coincides with the second discharge port, and a second drive motor that rotates the inner container.

作 用 現像液の供給時及び現像後には外容器の第1の
排出口と内容器の第3の排出口とを一致させて、
現像液を含む廃液を第3の排出口から第1の排出
口を経て排出させ、洗浄時には外容器の第2の排
出口と内容器の第3の排出口とを一致させて、洗
浄水と現像液とを含む廃液を第3の排出口から第
1の排出口を経て排出させ、現像液の濃度の濃い
廃液と濃度の薄い廃液とを夫々別個に排出させて
処理するようにしたものである。
Function When supplying the developer and after development, align the first outlet of the outer container with the third outlet of the inner container,
The waste liquid containing the developer is discharged from the third discharge port via the first discharge port, and when cleaning, the second discharge port of the outer container and the third discharge port of the inner container are aligned, and the cleaning water and The waste liquid containing the developer is discharged from the third discharge port through the first discharge port, and the waste liquid with a high concentration of the developer and the waste liquid with a low concentration are discharged and treated separately. be.

実施例 第1図及び第2図は本考案の一実施例を示す断
面図及び平面図で、図において、10は回転テー
ブルで、ウエーハ1を保持する載置台11と支柱
12とよりなり、載置台11にはウエーハ1を固
定する適宜の真空チヤツク手段(図示せず)を設
けてある。この回転テーブル10は支柱12によ
つて回転自在に支持されている。13は回転テー
ブル10を回転させる第1の駆動モータで、その
出力軸を回転テーブル10の支柱12に連結して
ある。この第1の駆動モータ13は回転制御可能
な構造を有し、回転数を任意に設定して回転テー
ブル10の回転送度を可変できるようになつてい
る。14は回転テーブル10を囲繞する有底円筒
形の外容器で、底部14aの同心円上の2個所に
廃液を排出するための第1の排出口15及び第2
の排出口16を形成し、側壁14bを適当な高さ
まで形成してある。前記外容器14の第1の排出
口15及び第2の排出口16は夫々別個の処理系
の浄化装置に接続されている。17は回転テーブ
ル10の支柱12を覆う円筒形の回転筒で、外容
器14の底部14aの中央部を貫通させて回動自
在に取付けてある。18は回転テーブル10と外
容器14との間に設けた内容器で、外容器14よ
り小径の有底円筒形で底部18aに外容器14の
第1の排出口15及び第2の排出口16と対応さ
せてこれらより小径の第3の排出口19を形成し
てある。また内容器18は底部18aを第3の排
出口19が最下位置に来るように傾斜させてあ
り、且つ側壁18bを回転テーブル10より十分
に高い位置まで延長形成してあり、上端周縁18
b′を中心側へ傾斜させてこれに当つた廃液が内側
下方に反射して外部へ飛び出さないようにしてあ
る。この内容器18は底部18aの中央部を回転
筒17に貫通させて一体に結合してある。20は
回転筒17を回転させる第2の駆動モータで、そ
の出力軸20aと回転筒17の下部とを適宜の動
力伝達手段21にて連結してある。従つて第2の
駆動モータ20が動作すると、動力伝達手段21
を介して回転筒17が回動し、さらに内容器18
が回動する。
Embodiment FIGS. 1 and 2 are a sectional view and a plan view showing an embodiment of the present invention. In the figures, 10 is a rotary table, which is composed of a mounting table 11 for holding a wafer 1 and a column 12. The mounting table 11 is provided with suitable vacuum chuck means (not shown) for fixing the wafer 1. This rotary table 10 is rotatably supported by a support 12. A first drive motor 13 rotates the rotary table 10, and its output shaft is connected to the column 12 of the rotary table 10. The first drive motor 13 has a rotationally controllable structure, and the rotation speed of the rotary table 10 can be varied by arbitrarily setting the rotation speed. Reference numeral 14 denotes a bottomed cylindrical outer container that surrounds the rotary table 10, and has a first outlet 15 and a second outlet for discharging waste liquid to two locations on a concentric circle of the bottom 14a.
A discharge port 16 is formed, and the side wall 14b is formed to an appropriate height. The first outlet 15 and the second outlet 16 of the outer container 14 are each connected to a purification device of a separate treatment system. Reference numeral 17 denotes a cylindrical rotary tube that covers the column 12 of the rotary table 10, and is rotatably attached to the outer container 14 by penetrating the center of the bottom 14a. Reference numeral 18 denotes an inner container provided between the rotary table 10 and the outer container 14, which has a bottomed cylindrical shape with a smaller diameter than the outer container 14, and has a first outlet 15 and a second outlet 16 of the outer container 14 at the bottom 18a. A third outlet 19 having a smaller diameter than these is formed in correspondence with the above. Further, the inner container 18 has a bottom portion 18a inclined so that the third discharge port 19 is at the lowest position, a side wall 18b extending to a position sufficiently higher than the rotary table 10, and an upper end periphery 18.
b' is tilted toward the center to prevent the waste liquid that hits it from being reflected downward to the inside and splashing out to the outside. The inner container 18 is integrally connected to the rotary cylinder 17 by penetrating the central part of the bottom 18a. A second drive motor 20 rotates the rotary cylinder 17, and its output shaft 20a and the lower part of the rotary cylinder 17 are connected by an appropriate power transmission means 21. Therefore, when the second drive motor 20 operates, the power transmission means 21
The rotary cylinder 17 rotates through the inner container 18.
rotates.

上記構造の製造装置は、現像液の供給時、第2
の駆動モータ20が動作して動力伝達手段21を
介して回転筒17を回転させ、これにより内容器
18を所定角度回動させて内容器18の第3の排
出口19と外容器14の第1の排出口15とを一
致させる。この後第2の駆動モータ20の動作を
停止させ、露光後のウエーハ1を回転テーブル1
0の載置台11上に載せて固定する。次にウエー
ハ1の中央部へ現像液を適当量供給し、続いて第
1の駆動モータ13を低い回転数で回転させ、回
転テーブル10を、現像液を拡散するのに最適な
速度で回転させ、回転時に生じる遠心力でもつて
現像液をウエーハ1の表面全面に拡げる。現像液
がウエーハ1の表面全面に拡がると、回転テーブ
ル10を静止または低速回転させて所定時間保持
して現像処理を施す。現像処理が完了すると、回
転テーブル10を高速回転させて、ウエーハ1の
周縁から遠心力にて飛ばされた現像液は内容器1
8の側壁18bに当つて下方に落ち、廃液となつ
て底部18aを流れて第3の排出口19から外容
器14の第1の排出口15へ排出され、さらに第
1の排出口15から外部へ排出され、現像液が回
収される。
The manufacturing device having the above structure has a second
The drive motor 20 operates to rotate the rotary cylinder 17 via the power transmission means 21, thereby rotating the inner container 18 by a predetermined angle to connect the third outlet 19 of the inner container 18 and the third outlet port 19 of the outer container 14. 1 and the discharge port 15 of No. 1. Thereafter, the operation of the second drive motor 20 is stopped, and the exposed wafer 1 is transferred to the rotary table 1.
0 and fixed on the mounting table 11. Next, an appropriate amount of developer is supplied to the center of the wafer 1, and then the first drive motor 13 is rotated at a low rotation speed, and the rotary table 10 is rotated at an optimum speed for spreading the developer. The developer is spread over the entire surface of the wafer 1 by the centrifugal force generated during rotation. Once the developer has spread over the entire surface of the wafer 1, the rotary table 10 is kept stationary or rotated at low speed for a predetermined period of time to perform the development process. When the development process is completed, the rotary table 10 is rotated at high speed, and the developer blown away from the periphery of the wafer 1 by centrifugal force is transferred to the inner container 1.
It hits the side wall 18b of the outer container 14 and falls downward, becomes waste liquid, flows through the bottom 18a, is discharged from the third discharge port 19 to the first discharge port 15 of the outer container 14, and is further discharged from the first discharge port 15 to the outside. and the developer is collected.

ウエーハ1上の現像液の洗浄時には第2の駆動
モータ20が再動作して回転筒17及び内容器1
8を所定角度回動させて、第3図及び第4図に示
す様に内容器18の第3の排出口19と外容器1
4の第2の排出口16とを一致させる。この後第
1の駆動モータ13を高い回転数で回転させて回
転テーブル10を高速回転させ、ウエーハ1に強
い遠心力を発生させる。この状態でウエーハ1に
大量の洗浄水を供給し、遠心力でもつて洗浄液を
ウエーハ1上で流して現像液を洗い流す。そして
ウエーハ1の周縁から遠心力で飛ばされた洗浄水
及び現像液は内容器18の側壁18bに当つて落
ち、廃液となつて底部18aを流れて第3の排出
口19から外容器14の第2の排出口16へ排出
され、さらに第2の排出口16から外部へ排出さ
れ、浄化装置にて排水処理されて洗浄水と現像液
とが夫々分離される。
When cleaning the developer on the wafer 1, the second drive motor 20 operates again to clean the rotating cylinder 17 and the inner container 1.
8 by a predetermined angle to connect the third outlet 19 of the inner container 18 and the outer container 1 as shown in FIGS. 3 and 4.
4 and the second discharge port 16 of No. 4. Thereafter, the first drive motor 13 is rotated at a high rotational speed to rotate the rotary table 10 at high speed, thereby generating a strong centrifugal force on the wafer 1. In this state, a large amount of cleaning water is supplied to the wafer 1, and the cleaning liquid is flowed over the wafer 1 by centrifugal force to wash away the developer. The cleaning water and developer that are blown away by centrifugal force from the periphery of the wafer 1 fall against the side wall 18b of the inner container 18, become waste liquid, flow through the bottom 18a, and flow through the third outlet 19 to the third outlet of the outer container 14. The waste water is discharged to the second discharge port 16, further discharged to the outside from the second discharge port 16, and is treated as waste water in a purification device to separate the cleaning water and the developer.

ウエーハ1の洗浄が完了すると、第1の駆動モ
ータ13の回転を停止させ、ウエーハ1を回転テ
ーブル10の載置台11から取出し、続いて上記
した動作を繰返えしてウエーハ1の現像処理を行
う。
When the cleaning of the wafer 1 is completed, the rotation of the first drive motor 13 is stopped, the wafer 1 is taken out from the mounting table 11 of the rotary table 10, and the above-described operation is repeated to develop the wafer 1. conduct.

なお、第1の排出口15と第2の排出口16と
は図示するように、180゜異なる個所に設ける必要
はなく隣接させてもよい。
It should be noted that the first outlet 15 and the second outlet 16 do not need to be provided at 180° different locations as shown in the figure, but may be adjacent to each other.

考案の効果 この考案はウエーハへ現像液を供給したとき及
び現像後に生じる廃液と、洗浄水を供給したとき
に生じる廃液を内容器の回動により夫々振り分け
て別個に排出させて別個に浄化処理することがで
き、しかも前者の廃液はその殆んどが現像液であ
るので現像液の除去を簡単に行え、且つ後者の廃
液はその殆んどが洗浄水であるので、排水処理を
簡単に行えて有害成分を除去することができる。
また廃液の処理能力が高くなるので、結果的に現
像能力も高くなり、作業性が向上する。さらに廃
液から現像液と洗浄水との分離を確実に行えるの
で、ランニングコストを低減させることもでき
る。
Effects of the invention This invention separates the waste liquid generated when the developer is supplied to the wafer, the waste liquid generated after development, and the waste liquid generated when cleaning water is supplied by rotating the inner container, discharges them separately, and purifies them separately. Moreover, since most of the former waste liquid is developer, the developer can be easily removed, and the latter waste liquid is mostly cleaning water, so wastewater treatment can be easily performed. can remove harmful components.
Furthermore, since the waste liquid processing capacity is increased, the developing ability is also increased as a result, and workability is improved. Furthermore, since the developer and washing water can be reliably separated from the waste liquid, running costs can also be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係る製造装置の断面図、第2
図はその平面図、第3図は製造装置の洗浄時の断
面図、第4図は洗浄時の平面図、第5図は従来の
製造装置の断面図である。 1……ウエーハ、10……回転テーブル、11
……載置台、12……支柱、13……第1の駆動
モータ、14……外容器、15……第1の排出
口、16……第2の排出口、17……回転筒、1
8……内容器、19……第3の排出口、20……
第2の駆動モータ。
Figure 1 is a sectional view of the manufacturing equipment according to the present invention, Figure 2
3 is a sectional view of the manufacturing apparatus during cleaning, FIG. 4 is a plan view of the manufacturing apparatus during cleaning, and FIG. 5 is a sectional view of the conventional manufacturing apparatus. 1...Wafer, 10...Rotary table, 11
...Placement table, 12... Strut, 13... First drive motor, 14... Outer container, 15... First discharge port, 16... Second discharge port, 17... Rotating tube, 1
8...Inner container, 19...Third outlet, 20...
A second drive motor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ウエーハを保持する回転テーブルと、回転テー
ブルを回転させる回転制御可能な第1の駆動モー
タと、底部の2個所に廃液を排出する第1及び第
2の排出口を有し、回転テーブルの周囲を囲繞す
る外容器と、回転テーブルと外容器との間に回動
自在に設けられ、回転テーブルを囲繞すると共に
底部の前記外容器の第1の排出口或いは第2の排
出口と一致する個所に廃液を排出する第3の排出
口を形成した内容器と、内容器を回動させる第2
の駆動モータとで構成したことを特徴とする半導
体装置の製造装置。
It has a rotary table that holds a wafer, a first drive motor that rotates the rotary table and can control its rotation, and a first and second outlet for discharging waste liquid at two places at the bottom. A surrounding outer container is rotatably provided between the rotary table and the outer container, surrounds the rotary table, and is provided at a location on the bottom that coincides with the first outlet or the second outlet of the outer container. An inner container forming a third outlet for discharging waste liquid, and a second inner container for rotating the inner container.
1. A semiconductor device manufacturing apparatus comprising: a drive motor;
JP13748684U 1984-09-10 1984-09-10 Expired JPS6350847Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13748684U JPS6350847Y2 (en) 1984-09-10 1984-09-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13748684U JPS6350847Y2 (en) 1984-09-10 1984-09-10

Publications (2)

Publication Number Publication Date
JPS6151733U JPS6151733U (en) 1986-04-07
JPS6350847Y2 true JPS6350847Y2 (en) 1988-12-27

Family

ID=30695901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13748684U Expired JPS6350847Y2 (en) 1984-09-10 1984-09-10

Country Status (1)

Country Link
JP (1) JPS6350847Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07105332B2 (en) * 1988-03-09 1995-11-13 東京エレクトロン株式会社 Liquid treatment method
JP2002329705A (en) * 2001-04-26 2002-11-15 Shibaura Mechatronics Corp Spin treatment unit

Also Published As

Publication number Publication date
JPS6151733U (en) 1986-04-07

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