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Sharp Corp
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Sharp Corp
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Application filed by Sharp CorpfiledCriticalSharp Corp
Priority to JP58160685ApriorityCriticalpatent/JPS6050938A/ja
Publication of JPS6050938ApublicationCriticalpatent/JPS6050938A/ja
Publication of JPS6339100B2publicationCriticalpatent/JPS6339100B2/ja
Semiconductor device capable of shortening test time and suppressing increase in chip area, and method of manufacturing semiconductor integrated circuit device