JPS6338077U - - Google Patents
Info
- Publication number
- JPS6338077U JPS6338077U JP13188986U JP13188986U JPS6338077U JP S6338077 U JPS6338077 U JP S6338077U JP 13188986 U JP13188986 U JP 13188986U JP 13188986 U JP13188986 U JP 13188986U JP S6338077 U JPS6338077 U JP S6338077U
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- constant temperature
- electronic component
- transfer section
- contacts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 238000012360 testing method Methods 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Description
第1図は本考案の電子部品試験装置に係る一実
施例の構造を概略的に示す側面図、第2図は第1
図の―線矢視図、第3図は第2図の方向矢
視図、第4図は第1図〜第3図に示す装置に組込
まれている治具の斜視図、第5図は同側面断面図
である。
1……試験装置、2……恒温槽、7,11……
恒温室、18……チエーンコンベア、21……チ
エーン、23……基板、26……給電用端子、2
7……測定用端子、29……IC、36……給電
バスバー、38……断線部、43,44……計測
用プローバ、45……測定ヘツド、46……試験
機。
FIG. 1 is a side view schematically showing the structure of an embodiment of the electronic component testing device of the present invention, and FIG.
Fig. 3 is a view taken in the direction of Fig. 2, Fig. 4 is a perspective view of the jig incorporated in the device shown in Figs. 1 to 3, and Fig. 5 is a It is the same side sectional view. 1... Test equipment, 2... Constant temperature chamber, 7, 11...
Constant temperature room, 18... Chain conveyor, 21... Chain, 23... Board, 26... Power supply terminal, 2
7...Measurement terminal, 29...IC, 36...Power supply bus bar, 38...Disconnection portion, 43, 44...Measurement prober, 45...Measurement head, 46...Testing machine.
Claims (1)
恒温室が画成された恒温槽内にコンベアが設けら
れ、該コンベアは、その回動移送部が前記複数の
恒温室内を通るように配置され、該回動移送部に
は、電子部品を保持し且つ該電子部品への給電用
端子と測定用端子とを有する基板が該回動移送部
の回動方向に並べられて複数取付けられるととも
に、前記回動移送部の周りには、その移送経路に
おける前記複数の恒温室の各々に関し対応的に配
設された給電遮断部を除いて前記給電用端子に接
触する給電部材と、前記給電遮断部において前記
測定用端子に接触し前記電子部品との導通により
その特性を測定する試験機へ該電子部品を導通さ
せる導通部材とが配設されてなる電子部品試験装
置。 A conveyor is provided in a constant temperature chamber in which a plurality of constant temperature chambers are defined, each of which is maintained at a constant temperature at a different temperature, and the conveyor is arranged such that its rotary transfer section passes through the plurality of constant temperature chambers, A plurality of substrates that hold electronic components and have power supply terminals and measurement terminals for the electronic components are attached to the rotational transfer section and are arranged in the rotational direction of the rotational transfer section. Around the dynamic transfer section, a power supply member that contacts the power supply terminal except for a power supply cutoff section correspondingly arranged for each of the plurality of constant temperature rooms on the transfer route, and a power supply member that contacts the power supply terminal in the power supply cutoff section are arranged. An electronic component testing device comprising: a conductive member that contacts a measurement terminal and conducts the electronic component to a tester that measures the characteristics of the electronic component through conduction with the electronic component.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13188986U JPS6338077U (en) | 1986-08-28 | 1986-08-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13188986U JPS6338077U (en) | 1986-08-28 | 1986-08-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6338077U true JPS6338077U (en) | 1988-03-11 |
Family
ID=31030761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13188986U Pending JPS6338077U (en) | 1986-08-28 | 1986-08-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6338077U (en) |
-
1986
- 1986-08-28 JP JP13188986U patent/JPS6338077U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6338077U (en) | ||
JPS63153481A (en) | Connecting device for measuring integrated circuit | |
JPH0191261U (en) | ||
JPS62108874U (en) | ||
JPH02129876U (en) | ||
JPS6280333U (en) | ||
JPS59123346U (en) | semiconductor equipment | |
JPS61162758A (en) | Measuring node relaying device for intercircuit tester | |
JPH0128466Y2 (en) | ||
JPH01263572A (en) | Apparatus for testing semiconductor mounted substrate | |
JPS6283979U (en) | ||
JPS61135489U (en) | ||
JPS61102042U (en) | ||
JPS6373672U (en) | ||
JPS63181969U (en) | ||
JPS63181970U (en) | ||
JPH0335488U (en) | ||
JPS62106162U (en) | ||
JPS6310469U (en) | ||
JPH02253178A (en) | Test board | |
JPS6218676U (en) | ||
JPS6251277U (en) | ||
JPS61178482U (en) | ||
JPS6148380U (en) | ||
JPS61189278U (en) |