JPS6336281Y2 - - Google Patents

Info

Publication number
JPS6336281Y2
JPS6336281Y2 JP1981144559U JP14455981U JPS6336281Y2 JP S6336281 Y2 JPS6336281 Y2 JP S6336281Y2 JP 1981144559 U JP1981144559 U JP 1981144559U JP 14455981 U JP14455981 U JP 14455981U JP S6336281 Y2 JPS6336281 Y2 JP S6336281Y2
Authority
JP
Japan
Prior art keywords
sample
chip
contact piece
reed relay
shaped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981144559U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5849272U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14455981U priority Critical patent/JPS5849272U/ja
Publication of JPS5849272U publication Critical patent/JPS5849272U/ja
Application granted granted Critical
Publication of JPS6336281Y2 publication Critical patent/JPS6336281Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP14455981U 1981-09-29 1981-09-29 チツプ状試料装着ヘツド Granted JPS5849272U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14455981U JPS5849272U (ja) 1981-09-29 1981-09-29 チツプ状試料装着ヘツド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14455981U JPS5849272U (ja) 1981-09-29 1981-09-29 チツプ状試料装着ヘツド

Publications (2)

Publication Number Publication Date
JPS5849272U JPS5849272U (ja) 1983-04-02
JPS6336281Y2 true JPS6336281Y2 (US06826419-20041130-M00005.png) 1988-09-27

Family

ID=29937518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14455981U Granted JPS5849272U (ja) 1981-09-29 1981-09-29 チツプ状試料装着ヘツド

Country Status (1)

Country Link
JP (1) JPS5849272U (US06826419-20041130-M00005.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6506552B2 (ja) * 2014-12-26 2019-04-24 株式会社ヒューモラボラトリー チップ電子部品検査選別装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59632Y2 (ja) * 1979-05-30 1984-01-09 横河・ヒユ−レツト・パツカ−ド株式会社 回路素子挾持装置

Also Published As

Publication number Publication date
JPS5849272U (ja) 1983-04-02

Similar Documents

Publication Publication Date Title
US5446393A (en) Electrical measuring and testing probe having a malleable shaft facilitating positioning of a contact pin
JPS592332B2 (ja) ロ−ドセル秤
US4308498A (en) Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components
JPS6336281Y2 (US06826419-20041130-M00005.png)
US4812745A (en) Probe for testing electronic components
JPS612338A (ja) 検査装置
JPS6236139Y2 (US06826419-20041130-M00005.png)
JPS6231888Y2 (US06826419-20041130-M00005.png)
JPS6228782Y2 (US06826419-20041130-M00005.png)
JPS6217728Y2 (US06826419-20041130-M00005.png)
SU1128310A1 (ru) Зондовое устройство
JPS6228783Y2 (US06826419-20041130-M00005.png)
JP2528910Y2 (ja) コンタクトプローブ支持カバー
JPH0745020Y2 (ja) プローブの接点構造
JPH08304486A (ja) 四端子測定用接触子構造
US6271659B1 (en) Integrated circuit sample package for checking electrical functionality and alignment of checking devices and corresponding checking method
JPH0569188B2 (US06826419-20041130-M00005.png)
JPH06294815A (ja) 実装部品の検査方法
JPS6023315B2 (ja) 多探針形プロ−ブ
JPS62120001A (ja) 抵抗器
JPS6338103B2 (US06826419-20041130-M00005.png)
JPH073160U (ja) プリント配線板のテストパターン
JPS6140041A (ja) 電子部品の検査装置
JPH05203672A (ja) 電子部品の測定方法及びその装置
JPH0656772U (ja) 電子計測器用コンタクトプローブの保持装置