JPS6334548A - Substrate for photomask - Google Patents
Substrate for photomaskInfo
- Publication number
- JPS6334548A JPS6334548A JP61179754A JP17975486A JPS6334548A JP S6334548 A JPS6334548 A JP S6334548A JP 61179754 A JP61179754 A JP 61179754A JP 17975486 A JP17975486 A JP 17975486A JP S6334548 A JPS6334548 A JP S6334548A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- photomask
- recesses
- recess
- jigs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 36
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 4
- 238000000206 photolithography Methods 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000000428 dust Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/60—Substrates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体写真製版工程に用いるホトマスク用
基板に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a photomask substrate used in a semiconductor photolithography process.
集積回路などの半導体装置6′製造工程では、ホトマス
ク上に形成されであるパターンを半導体ウェハに転写す
るが、半導体ウェハの大口径化に伴い、ウェハプロセス
に用いられるホトマスクのサイズも更に大きくする必要
がある。In the manufacturing process of semiconductor devices such as integrated circuits, a pattern formed on a photomask is transferred onto a semiconductor wafer, but as the diameter of semiconductor wafers becomes larger, the size of the photomask used in the wafer process also needs to be further increased. There is.
この種の従来のホトマスク基板は、第2図に上面図で示
すような四辺形、もしくはウェハ様の形状をしていた。Conventional photomask substrates of this type have a quadrilateral or wafer-like shape, as shown in top view in FIG.
また、ウェハへの転写、あるいはホトマスクの製造工程
において、このホトマスクの保持、運搬は、一部で自動
装置によって行われているが、かなりの部分は人間の手
、もしくは治具によって行われる。しかも、ホトマスク
の保持、運搬の際。Further, in the process of transferring onto a wafer or manufacturing a photomask, some of the holding and transportation of the photomask is performed by automatic equipment, but a considerable part of it is performed by human hands or by jigs. Moreover, when holding and transporting photomasks.
ホトマスクの表面あるいは裏面に塵埃が付着することは
橿力避けなければならず、従ってマスクの周辺側面を挟
持する必要がある。It is necessary to avoid dust from adhering to the front or back surface of the photomask, and therefore it is necessary to clamp the peripheral side surfaces of the mask.
しかしながら、ホトマスクの基板サイズが6インチ程度
までであれば周辺側面を挟持する方法によって片手で保
持することは可能であるが、6インチより大きいホトマ
スクになると、片手では保持できない、しかし、ホトマ
スクを操作するために両手を使うのは極めて作業性が悪
く、不自然な動作が生じ、作業スピードも著しく低下す
る。However, if the photomask substrate size is up to about 6 inches, it is possible to hold it with one hand by holding the peripheral sides, but if the photomask is larger than 6 inches, it is not possible to hold it with one hand, but it is difficult to operate the photomask. Using both hands to do this is extremely inefficient, results in unnatural movements, and significantly reduces work speed.
この発明は上記のような問題点を解消するためになされ
たもので、6インチより大きい基板サイズでも片手での
操作が可能であり、治具の使用が容易となるホトマスク
用基板を得ることを目的とする。This invention was made to solve the above-mentioned problems, and aims to provide a photomask substrate that can be operated with one hand even when the substrate size is larger than 6 inches, and that makes it easy to use a jig. purpose.
この発明に係るホトマスク用基板は、基板側辺に基板を
その側面から挟持し得るように、少なくとも1つの凹部
を設けたものである。The photomask substrate according to the present invention is provided with at least one recess on the side of the substrate so that the substrate can be held between the sides.
この発明においては、基板側辺に凹部を設けることによ
り、6インチより大きい基板サイズでも片手でその側面
を挟持し操作することができ、従来の治具の使用が容易
となる。In this invention, by providing a recessed portion on the side of the substrate, even if the size of the substrate is larger than 6 inches, the side surface can be held and manipulated with one hand, and conventional jigs can be easily used.
以下、この発明の一実施例を図について説明する。第1
図はこの発明の一実施例によるホトマスク用基板を示す
上面図であり、1はホトマスク用基板であり、その側辺
に凹部2が設けられている。An embodiment of the present invention will be described below with reference to the drawings. 1st
The figure is a top view showing a photomask substrate according to an embodiment of the present invention. Reference numeral 1 designates the photomask substrate, and a recess 2 is provided on the side of the photomask substrate.
本実施例の基板1では、ホトマスクを片手で保持するに
は、凹部2に指を入れて挟持するか、治具を凹部2には
め込めばよい。In the substrate 1 of this embodiment, in order to hold the photomask with one hand, the photomask can be held by inserting a finger into the recess 2 or by fitting a jig into the recess 2.
なお、ホトマスク用基板1に設ける凹部の深さは、ホト
マスクを保持できる程度であればよい。Note that the depth of the recess provided in the photomask substrate 1 may be as long as it can hold the photomask.
また、凹部2の形状は、ホトマスクを指で挟持しやすく
、治具で容易に支持できれば、どんな形状でもよい、さ
らに、凹部2は、基板側辺に何箇所設けてもよい。Further, the shape of the recess 2 may be any shape as long as the photomask can be easily held between fingers and supported with a jig. Furthermore, the recess 2 may be provided at any number of locations on the side of the substrate.
また、上記実施例では、ホトマスク用基板の形状は四辺
形であるが、ウェハ様であってもよい。Further, in the above embodiment, the shape of the photomask substrate is quadrilateral, but it may be wafer-like.
また、上記実施例ではホトマスク用基板の場合について
説明したが、ウェハやグラスウェハであってもよく、上
記実施例と同様の効果を奏する。Further, in the above embodiments, the case of a photomask substrate has been described, but a wafer or a glass wafer may be used, and the same effects as in the above embodiments can be obtained.
以上のように、この発明によれば、ホトマスク用基板の
側辺に凹部を設けたので、6インチより大きい基板サイ
ズでも、片手でその側面を挟持することが可能となり、
保持、運搬が容易となる効果がある。As described above, according to the present invention, since the recessed portion is provided on the side of the photomask substrate, it is possible to hold the side of the substrate with one hand even if the size of the substrate is larger than 6 inches.
This has the effect of making it easier to hold and transport.
第1図はこの発明の一実施例によるホトマスク用基板を
示す上面図、第2図は従来のホトマスク用基板を示す上
面図である。
1はホトマスク用基板、2は凹部である。
なお図中同一符号は同−又は相当部分を示す。FIG. 1 is a top view showing a photomask substrate according to an embodiment of the present invention, and FIG. 2 is a top view showing a conventional photomask substrate. 1 is a photomask substrate, and 2 is a recess. Note that the same reference numerals in the figures indicate the same or equivalent parts.
Claims (1)
おいて、 該基板側辺に、これをその側面から挟持するための少な
くとも1つの凹部を設けたことを特徴とするホトマスク
用基板。(1) A photomask substrate used in a semiconductor photolithography process, characterized in that at least one recess is provided on a side of the substrate for holding it from the side.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61179754A JPS6334548A (en) | 1986-07-29 | 1986-07-29 | Substrate for photomask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61179754A JPS6334548A (en) | 1986-07-29 | 1986-07-29 | Substrate for photomask |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6334548A true JPS6334548A (en) | 1988-02-15 |
Family
ID=16071295
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61179754A Pending JPS6334548A (en) | 1986-07-29 | 1986-07-29 | Substrate for photomask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6334548A (en) |
-
1986
- 1986-07-29 JP JP61179754A patent/JPS6334548A/en active Pending
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