JPS6331880B2 - - Google Patents

Info

Publication number
JPS6331880B2
JPS6331880B2 JP55089229A JP8922980A JPS6331880B2 JP S6331880 B2 JPS6331880 B2 JP S6331880B2 JP 55089229 A JP55089229 A JP 55089229A JP 8922980 A JP8922980 A JP 8922980A JP S6331880 B2 JPS6331880 B2 JP S6331880B2
Authority
JP
Japan
Prior art keywords
signal
flip
flop
data
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55089229A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5715297A (en
Inventor
Toshihiro Okabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8922980A priority Critical patent/JPS5715297A/ja
Publication of JPS5715297A publication Critical patent/JPS5715297A/ja
Publication of JPS6331880B2 publication Critical patent/JPS6331880B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP8922980A 1980-07-02 1980-07-02 Memory element Granted JPS5715297A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8922980A JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8922980A JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Publications (2)

Publication Number Publication Date
JPS5715297A JPS5715297A (en) 1982-01-26
JPS6331880B2 true JPS6331880B2 (enrdf_load_stackoverflow) 1988-06-27

Family

ID=13964908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8922980A Granted JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Country Status (1)

Country Link
JP (1) JPS5715297A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0654186B2 (ja) * 1985-11-18 1994-07-20 ダイキン工業株式会社 冷凍装置

Also Published As

Publication number Publication date
JPS5715297A (en) 1982-01-26

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