JPS63285962A - Electrode for surface mounting electronic component - Google Patents

Electrode for surface mounting electronic component

Info

Publication number
JPS63285962A
JPS63285962A JP12070487A JP12070487A JPS63285962A JP S63285962 A JPS63285962 A JP S63285962A JP 12070487 A JP12070487 A JP 12070487A JP 12070487 A JP12070487 A JP 12070487A JP S63285962 A JPS63285962 A JP S63285962A
Authority
JP
Japan
Prior art keywords
electrode
electronic component
recess
probe
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12070487A
Other languages
Japanese (ja)
Inventor
Takashi Ichikawa
孝 市川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP12070487A priority Critical patent/JPS63285962A/en
Publication of JPS63285962A publication Critical patent/JPS63285962A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Landscapes

  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To easily bring the probe of a measuring instrument of an electrode into contact by forming a recess or a hole. CONSTITUTION:The external electrode 2 of a surface mounting electronic component is secured by solder 6 to an electrode pattern 5 arranged on a substrate 4. A recess 3 is formed on the reverse face of the opposite surface to the substrate 4 on the electrode 2. After the component is completely mounted on the substrate, when the electric characteristics of the substrate is inspected, a probe 7 of a measuring instrument is positioned on the recess 3. The probe 7 is not displaced to be dropped from the electrode 2 due to the presence of the recess 3 to easily inspect the characteristics.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は基板の一面に表面実装される電子部品の外部取
り出し電極の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an improvement in an external lead-out electrode of an electronic component that is surface-mounted on one surface of a substrate.

〔従来の技術〕[Conventional technology]

従来の表面実装用の電子部品の形状の一例としてICパ
ッケージを第2図に示す。即ちプラスチックあるいはセ
ラミックのケース1に収められた半導体チップの電極は
電極2に接続されて外部に取り出されている。第2図に
示すICの形状はスモール・アウトライン・パッケージ
あるいはフラット・パッケージと呼ばれ、回路基板の表
面に実装されるものである。
FIG. 2 shows an IC package as an example of the shape of a conventional surface-mounted electronic component. That is, the electrodes of a semiconductor chip housed in a plastic or ceramic case 1 are connected to electrodes 2 and taken out to the outside. The shape of the IC shown in FIG. 2 is called a small outline package or flat package, and is mounted on the surface of a circuit board.

〔発明が解決しようとする間層点〕[The interlayer point that the invention attempts to solve]

近年、回路基板の高集積化の要望が強く、表面実装電子
部品の需要は拡大しているが、一般に回路基板には回路
基板のチェック、調整等を行なうための電極(テストポ
イント)が必要である。電子部品のTri極がちょうど
このテストポイントとなった際、従来の電極は測定器の
プローブを接触させるのに適当でない。特にテストポイ
ントのチェックを回路基板の製造ラインで行なう場合、
従来の電極はプローブの位置決めが困難である。
In recent years, there has been a strong demand for higher integration of circuit boards, and the demand for surface-mounted electronic components is expanding.However, circuit boards generally require electrodes (test points) to check and adjust the circuit board. be. When the Tri-pole of the electronic component just becomes this test point, the conventional electrode is not suitable for contacting the probe of the measuring instrument. Especially when checking test points on a circuit board manufacturing line,
Conventional electrodes make probe positioning difficult.

またプローブを接触させ易いように回路基板上にテスト
ポイント用の電極を別途形成するとなると電子部品の高
密度実装の妨げとなる。
Further, if electrodes for test points are separately formed on the circuit board so that the probes can easily be contacted with the electrodes, this will impede high-density mounting of electronic components.

本発明はこの様な問題点を克服した、プローブを接触し
やすい表面電子部品を提供せんとするものである。
The present invention aims to overcome these problems and provide a surface electronic component that is easy to contact with a probe.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、表面実装部品の電極に、(ぼみあるいは穴を
形成したことを特徴とする。
The present invention is characterized in that a recess or hole is formed in the electrode of the surface mount component.

(実施例〕 第1図は本発明の1実施例を示す図である。プラスチッ
クのケース1に納められた半導体チップの電極は外部に
取り出された電極2に接続されている。電極2には(ぼ
み3が形成されており、測定器のプローブを接触させた
時、プローブが電極からずれ落ちないようになっている
。この様子を第3図に更に詳しく示す。プラスチックケ
ース1と外部電極2からなる表面実装電子部品は、基板
40表面に実装される。即ち、基板40表面に配された
電極バター75に対し、表面実装電子部品の外部電極2
がハンダ6によって固定される。外部tX極2には基板
4と相対する面の逆面にくぼみ3が形成されている。基
板上への電子部品の実装を終えた後、基板の電気的特性
を検査する際、測定器のプローブ7は前述のくぼみ3に
対し位置決めされる。プローブ7はくぼみ3の存在によ
り外部電極2からずれ落ちることがない。
(Embodiment) Fig. 1 is a diagram showing one embodiment of the present invention.The electrodes of a semiconductor chip housed in a plastic case 1 are connected to an electrode 2 taken out to the outside. (A recess 3 is formed to prevent the probe of the measuring instrument from slipping off the electrode when it comes into contact with the electrode. This situation is shown in more detail in Figure 3.Plastic case 1 and external electrode The surface mount electronic component consisting of 2 is mounted on the surface of the board 40. That is, the external electrode 2 of the surface mount electronic component is mounted on the electrode butter 75 arranged on the surface of the board 40.
is fixed with solder 6. A recess 3 is formed in the external tX pole 2 on a surface opposite to the surface facing the substrate 4 . After the electronic components have been mounted on the board, the probe 7 of the measuring instrument is positioned relative to the recess 3 when testing the electrical characteristics of the board. The presence of the recess 3 prevents the probe 7 from slipping off from the external electrode 2.

次に第4図は表面実装電子部品の外部電極2に穴8を設
けた例である。外部電極2を基板4上に電極パターン5
にハンダ付けする際、ハンダは六8内にも侵入し表面張
力に応じた形状で冷却固化する。この場合は既に述べた
プローブ位置決めの効果のみならず、外部電極2とハン
ダ6の接触面積の増大による固定力の増大が得られる。
Next, FIG. 4 shows an example in which a hole 8 is provided in the external electrode 2 of a surface-mounted electronic component. An electrode pattern 5 is formed on the external electrode 2 on the substrate 4.
When soldering, the solder also penetrates into the 68 and cools and solidifies in a shape according to the surface tension. In this case, not only the probe positioning effect described above but also an increase in fixing force due to an increase in the contact area between the external electrode 2 and the solder 6 can be obtained.

〔発明の効果〕〔Effect of the invention〕

本発明の構成によれば、表面実装電子部品の電極に測定
器のプローブを接触させ易く、回路基板のチェックが容
易になる。また回路基板上にチェック、調整のためのテ
ストポイントを別途設ける必要がなくなり回路の一層の
高密度実装が可能になる。
According to the configuration of the present invention, it is easy to bring the probe of the measuring device into contact with the electrode of the surface-mounted electronic component, making it easy to check the circuit board. Furthermore, there is no need to separately provide test points for checking and adjustment on the circuit board, allowing higher density mounting of circuits.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による一実施例の表面実装電子部品の外
形図。 第2図は従来の表面実装用ICの外形図。 第3図は本発明の一実施例を説明する図。 第4図は本発明の他の実施例を説明する図。 第2図 4 黍穣 7 70−゛λ 斗 第41図
FIG. 1 is an outline diagram of a surface-mounted electronic component according to an embodiment of the present invention. FIG. 2 is an outline drawing of a conventional surface mount IC. FIG. 3 is a diagram illustrating an embodiment of the present invention. FIG. 4 is a diagram illustrating another embodiment of the present invention. Fig. 2 4 Fertilization 7 70-゛λ Do Fig. 41

Claims (1)

【特許請求の範囲】[Claims] くぼみあるいは穴を形成したことを特徴とする表面実装
電子部品の電極。
An electrode for a surface-mounted electronic component characterized by having a depression or a hole formed therein.
JP12070487A 1987-05-18 1987-05-18 Electrode for surface mounting electronic component Pending JPS63285962A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12070487A JPS63285962A (en) 1987-05-18 1987-05-18 Electrode for surface mounting electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12070487A JPS63285962A (en) 1987-05-18 1987-05-18 Electrode for surface mounting electronic component

Publications (1)

Publication Number Publication Date
JPS63285962A true JPS63285962A (en) 1988-11-22

Family

ID=14792919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12070487A Pending JPS63285962A (en) 1987-05-18 1987-05-18 Electrode for surface mounting electronic component

Country Status (1)

Country Link
JP (1) JPS63285962A (en)

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