JPS63277769A - Device for utilizing photochemical reaction - Google Patents
Device for utilizing photochemical reactionInfo
- Publication number
- JPS63277769A JPS63277769A JP11268687A JP11268687A JPS63277769A JP S63277769 A JPS63277769 A JP S63277769A JP 11268687 A JP11268687 A JP 11268687A JP 11268687 A JP11268687 A JP 11268687A JP S63277769 A JPS63277769 A JP S63277769A
- Authority
- JP
- Japan
- Prior art keywords
- light incident
- window part
- incident window
- reaction
- reaction chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006552 photochemical reaction Methods 0.000 title claims abstract description 8
- 238000006243 chemical reaction Methods 0.000 claims abstract description 30
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 239000000758 substrate Substances 0.000 abstract description 14
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 6
- 239000007795 chemical reaction product Substances 0.000 abstract description 6
- 229910052710 silicon Inorganic materials 0.000 abstract description 6
- 239000010703 silicon Substances 0.000 abstract description 6
- 229910052814 silicon oxide Inorganic materials 0.000 abstract description 6
- 239000000126 substance Substances 0.000 abstract description 4
- 230000008021 deposition Effects 0.000 abstract description 3
- 239000007789 gas Substances 0.000 description 21
- 239000010408 film Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000002256 photodeposition Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000006557 surface reaction Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/08—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
- B01J19/12—Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
- B01J19/121—Coherent waves, e.g. laser beams
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、光を利用して化学反応を誘起する装置、特に
その光入射窓部の曇りを防止する技術に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a device that uses light to induce a chemical reaction, and particularly to a technique for preventing fogging of a light entrance window thereof.
この種の光化学反応利用装置として、従来より第2図に
示すような装置が知られている。すなわち、この装置は
内部に半導体基板1を設置した反応チャンバ2と、レー
ザ光源3、ミラー4、レンズ5より成り半導体基板1上
をレーザ光6で照射するための光化学系と、反応チャン
バ2を排気するための真空ポンプ7と、ガスボンベ8〜
10、マスプローメータ11より成り反応チャンバ2に
反応性ガスを供給するガス系とから構成されている。ガ
スボンベ9.10より反応チャンバ2内に導入された反
応性ガスは反応チャンバ2の上部の光入射窓部12より
照射されるレーザー光6のエネルギーを吸収して分解し
、例えばガスボンベlOより供給された5iHnガスと
ガスボンベ9より供給された0、ガスとより5iO1を
生成し、半導体基板1の表面上に酸化シリコン膜を堆積
する。この装置を使用すると、半導体基板1の温度が1
00〜200℃と極めて低くても、成長速度を低下させ
ることなく良質の薄膜を得ることができる。As this type of photochemical reaction utilization device, a device as shown in FIG. 2 has been known. That is, this device includes a reaction chamber 2 in which a semiconductor substrate 1 is installed, a photochemical system consisting of a laser light source 3, a mirror 4, and a lens 5 for irradiating the semiconductor substrate 1 with laser light 6, and a reaction chamber 2. Vacuum pump 7 for evacuation and gas cylinder 8~
10, and a gas system consisting of a mass probe meter 11 for supplying reactive gas to the reaction chamber 2. The reactive gas introduced into the reaction chamber 2 from the gas cylinder 9.10 absorbs the energy of the laser beam 6 irradiated from the light entrance window 12 at the upper part of the reaction chamber 2, decomposes, and decomposes the reactive gas supplied from the gas cylinder 10, for example. 5iO1 is generated from the 5iHn gas and the 0 gas supplied from the gas cylinder 9, and a silicon oxide film is deposited on the surface of the semiconductor substrate 1. When this device is used, the temperature of the semiconductor substrate 1 is 1
Even at extremely low temperatures of 00 to 200°C, high-quality thin films can be obtained without reducing the growth rate.
しかし上記化学反応が表面反応でない場合、し−ザ光6
の通過する領域では反応が進行し、反応生成物が堆積す
る。すなわち、反応チャンバ2の光入射窓部12におい
てチャンバ内部に反応生成物が付着し、時間の経過とと
もにレーザ光6を遮蔽するようになり、半導体基板1上
の反応を押さえてしまうことになる。したがってレーザ
ー光入射窓部の反応生成物付着防止は、光化学反応利用
装置にとって必要不可欠な技術である。このため従来は
、反応チャンバ2内の光入射窓部12に向は曇り防止ノ
ズル13を開口させ、ガスボンベ8より窒素等の不活性
ガスを光入射窓部12にのみ局所的に吹き付け、反応性
ガスが光入射窓部12の近傍に流れ込まないようにする
方法が考えられている。しかしこのような単純な方法で
は、気体の乱流が発生し、反応性ガスを光入射窓部から
完全に除去することは困難である。したがって、長時間
のレーザ光照射後には光入射窓部に曇りが生じ始め、膜
の成長速度の経時変化を押さえることはできないという
問題点があった。However, if the above chemical reaction is not a surface reaction, then
The reaction proceeds in the region through which it passes, and reaction products are deposited. That is, reaction products adhere to the interior of the light entrance window 12 of the reaction chamber 2, and over time they begin to block the laser beam 6, thereby suppressing the reaction on the semiconductor substrate 1. Therefore, preventing reaction products from adhering to the laser beam entrance window is an essential technology for photochemical reaction utilization devices. For this reason, conventionally, an anti-fogging nozzle 13 is opened toward the light entrance window 12 in the reaction chamber 2, and an inert gas such as nitrogen is locally sprayed from the gas cylinder 8 only onto the light entrance window 12, thereby reducing the reactivity. Methods have been considered to prevent gas from flowing into the vicinity of the light entrance window 12. However, with such a simple method, gas turbulence occurs and it is difficult to completely remove the reactive gas from the light entrance window. Therefore, after a long period of laser beam irradiation, the light entrance window begins to become cloudy, and there is a problem in that it is not possible to suppress changes in the film growth rate over time.
本発明の目的は、光入射窓部の曇りを長時間にわたって
防止し、基板表面上の化学反応を安定に進行させること
が可能な光化学反応利用装置を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a photochemical reaction utilizing device that can prevent fogging of a light entrance window portion for a long period of time and allow a chemical reaction on a substrate surface to proceed stably.
この目的は本発明によれば、反応チャンバの光入射窓部
を加熱可能に構成することによって達成される。This object is achieved according to the invention by configuring the light entrance window of the reaction chamber to be heatable.
光入射窓部の加熱温度は200〜500°Cに選ぶと有
利である。The heating temperature of the light entrance window is advantageously selected to be between 200 and 500°C.
本発明においては、光入射窓部を加熱することにより光
入射窓部の温度が高まり、反応チャンバ内の反応生成物
の光入射窓部上への堆積速度が低下することによって光
入射窓部の曇りが抑制されるものである。In the present invention, the temperature of the light entrance window increases by heating the light entrance window, and the deposition rate of reaction products in the reaction chamber on the light entrance window decreases, thereby increasing the temperature of the light entrance window. Clouding is suppressed.
次に本発明の実施例を図面について説明する。 Next, embodiments of the present invention will be described with reference to the drawings.
第1図は本発明の実施例の構成配置図を示し、第2図と
同等部分には同符号を付しである。第1図の構成が第2
図のものと異なる点は、曇り防止ノズル13を有せず、
それに代えて、光入射窓部12を構成する石英ガラスに
導電性物質14が帯状にコーティングしてあり、この導
電性物質14に電流を流すことにより加熱して光入射窓
部12の温度を上げ得るようになっていることである。FIG. 1 shows a configuration diagram of an embodiment of the present invention, and the same parts as in FIG. 2 are given the same reference numerals. The configuration in Figure 1 is the second
The difference from the one in the figure is that it does not have the anti-fog nozzle 13,
Instead, the quartz glass constituting the light entrance window 12 is coated with a conductive substance 14 in the form of a band, and by passing an electric current through the conductive substance 14, it is heated and the temperature of the light entrance window 12 is raised. That's what you're supposed to get.
次に本装置を使用して、シリコン基板上に酸化シリコン
膜を形成する方法について説明する。Next, a method of forming a silicon oxide film on a silicon substrate using this apparatus will be described.
シリコン基板lは反応チャンバ2の200°Cに加熱さ
れた底板上に載置されている0反応を誘起するために光
源3としてArFエキシマレーザを使用し、波長193
nmの発振レーザ光6をミラー4により変向させレンズ
5に入射する。レンズ5により絞り込まれたレーザ光6
は、光入射窓部12を通って反応チャンバ2内に入り、
シリコン基板1の表面上で焦点を結ぶ。The silicon substrate l is placed on the bottom plate heated to 200°C in the reaction chamber 2. An ArF excimer laser is used as the light source 3 to induce the reaction, and the wavelength is 193°C.
The oscillation laser beam 6 of nm wavelength is deflected by a mirror 4 and enters a lens 5. Laser light 6 narrowed down by lens 5
enters the reaction chamber 2 through the light entrance window 12,
Focus on the surface of silicon substrate 1.
反応ガスとしては、マスフローメータ11により流量制
御されてボンベ10から5d/分のSiH4ガス、ボン
ベ9から8001d/分のN、Oガス、ボンベ8から6
5d/分のN、ガスが導入される0反応チャンバ2内は
真空ポンプ7により排気され、ITorr前後の圧力に
保たれている。The reaction gases include SiH4 gas at 5 d/min from cylinder 10, N, O gas at 8001 d/min from cylinder 9, and N, O gas from cylinder 8 to 6, whose flow rate is controlled by mass flow meter 11.
The inside of the reaction chamber 2 into which N gas is introduced at 5 d/min is evacuated by a vacuum pump 7 and maintained at a pressure around ITorr.
上記反応ガスを10分間流すと、シリコン基板1の上に
は2000人の厚さの酸化シリコン膜が堆積する。これ
に対し光入射窓部12はその導電性物質14に電流が流
されることにより加熱され温度が上昇しているから、光
入射窓部12上への酸化シリコン膜の仕着速度は抑制さ
れ、はとんど堆積しない。When the above reaction gas is allowed to flow for 10 minutes, a silicon oxide film with a thickness of 2000 nm is deposited on the silicon substrate 1. On the other hand, since the light entrance window 12 is heated and its temperature rises due to the current flowing through the conductive material 14, the deposition rate of the silicon oxide film on the light entrance window 12 is suppressed. rarely accumulates.
なお光入射窓部を加熱する方法としては、上述の例に限
ることなく、光入射窓部の周辺にヒータを配置し加熱す
るようにしてもよい。Note that the method of heating the light entrance window is not limited to the above-mentioned example, and heating may be performed by disposing a heater around the light entrance window.
また、上述の実施例では酸化シリコン膜を堆積する場合
について説明したが、それに限ることなく、例えばC2
8ガスによるポリシリコンの光エッチングにも適用でき
、さらに光による堆積、工ッチングばかりでなく、光に
よるドーピング、洗浄等、光化学反応を利用するすべて
の装置に・適用できることは言うまでもない。Furthermore, although the above-described embodiment describes the case where a silicon oxide film is deposited, the present invention is not limited thereto, for example, C2
It goes without saying that it can be applied to photoetching of polysilicon using 8 gases, and can also be applied not only to photodeposition and etching, but also to all devices that utilize photochemical reactions, such as photodoping and cleaning.
本発明によれば、反応チャンバの光入射窓部を加熱する
ことにより反応生成物の窓部への付着速度を低下させた
ものであるから、窓部の曇りを長時間にわたって防止し
、基板表面上の化学反応を安定に進行させることができ
、また窓部の寿命が長くなるため、設備の稼動率を向上
させることが可能となるものである。According to the present invention, the rate of adhesion of reaction products to the window is reduced by heating the light incident window of the reaction chamber, which prevents fogging of the window for a long period of time and improves the substrate surface. Since the above chemical reaction can proceed stably and the life of the window is extended, it is possible to improve the operating rate of the equipment.
第1図は本発明の一実施例の構成配置図、第2図は従来
装置の構成配置図である。
1・・・シリコン基板、 2・・・反応チャンバ、 3
・・・レーザ光源、 7・・・真空ポンプ、 8〜
10・・・ガスボンベ、 12・・・反応チャンバの
光入射窓部、14・・・光入射窓部の導電性物質。
第1図
刀ズボン■FIG. 1 is a structural layout diagram of an embodiment of the present invention, and FIG. 2 is a structural layout diagram of a conventional device. 1... Silicon substrate, 2... Reaction chamber, 3
...Laser light source, 7...Vacuum pump, 8-
DESCRIPTION OF SYMBOLS 10... Gas cylinder, 12... Light incidence window part of reaction chamber, 14... Electrically conductive material of light incidence window part. Figure 1 Sword pants■
Claims (1)
応チャンバの光入射窓部を加熱可能に構成したことを特
徴とする光化学反応利用装置。 2)特許請求の範囲第1項記載の装置において、反応チ
ャンバの光入射窓部の加熱温度が200〜500℃であ
ることを特徴とする光化学反応利用装置[Scope of Claims] 1) A photochemical reaction utilization device that uses light to induce a chemical reaction, characterized in that a light entrance window of a reaction chamber is configured to be heatable. 2) A photochemical reaction utilization device according to claim 1, wherein the heating temperature of the light entrance window of the reaction chamber is 200 to 500°C.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11268687A JPS63277769A (en) | 1987-05-08 | 1987-05-08 | Device for utilizing photochemical reaction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11268687A JPS63277769A (en) | 1987-05-08 | 1987-05-08 | Device for utilizing photochemical reaction |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63277769A true JPS63277769A (en) | 1988-11-15 |
Family
ID=14592937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11268687A Pending JPS63277769A (en) | 1987-05-08 | 1987-05-08 | Device for utilizing photochemical reaction |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63277769A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0379068A2 (en) * | 1989-01-18 | 1990-07-25 | Mitsui Engineering and Shipbuilding Co, Ltd. | Optical molding method and apparatus |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60212220A (en) * | 1984-04-06 | 1985-10-24 | Ushio Inc | Photochemical reaction apparatus |
JPS61234532A (en) * | 1985-04-11 | 1986-10-18 | Nec Corp | Device for photochemical gas phase growth of silicon oxide film |
JPS6252921A (en) * | 1985-09-02 | 1987-03-07 | Toshiba Corp | Light exitation film forming device |
JPS62127469A (en) * | 1985-11-27 | 1987-06-09 | Hitachi Ltd | Vapor growth apparatus |
JPS63168027A (en) * | 1986-12-29 | 1988-07-12 | Matsushita Electric Ind Co Ltd | Film forming device |
JPS63271920A (en) * | 1987-04-28 | 1988-11-09 | Matsushita Electric Ind Co Ltd | Optical pumping epitaxial growth equipment |
-
1987
- 1987-05-08 JP JP11268687A patent/JPS63277769A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60212220A (en) * | 1984-04-06 | 1985-10-24 | Ushio Inc | Photochemical reaction apparatus |
JPS61234532A (en) * | 1985-04-11 | 1986-10-18 | Nec Corp | Device for photochemical gas phase growth of silicon oxide film |
JPS6252921A (en) * | 1985-09-02 | 1987-03-07 | Toshiba Corp | Light exitation film forming device |
JPS62127469A (en) * | 1985-11-27 | 1987-06-09 | Hitachi Ltd | Vapor growth apparatus |
JPS63168027A (en) * | 1986-12-29 | 1988-07-12 | Matsushita Electric Ind Co Ltd | Film forming device |
JPS63271920A (en) * | 1987-04-28 | 1988-11-09 | Matsushita Electric Ind Co Ltd | Optical pumping epitaxial growth equipment |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0379068A2 (en) * | 1989-01-18 | 1990-07-25 | Mitsui Engineering and Shipbuilding Co, Ltd. | Optical molding method and apparatus |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6210277A (en) | Apparatus for adhering substance to substrate | |
KR850001974B1 (en) | Improved photochemical vapor deposition apparatus and method | |
JPS63277769A (en) | Device for utilizing photochemical reaction | |
JPS5943816B2 (en) | Method for manufacturing silicon semiconductor devices | |
JP3258121B2 (en) | CVD equipment | |
JPS5940525A (en) | Growth of film | |
JPS60128265A (en) | Device for forming thin film in vapor phase | |
JPS63277768A (en) | Device for utilizing photochemical reaction | |
JPH02208925A (en) | Formation of semiconductor film | |
JPH01104776A (en) | Precipitation of predetermined fine structure by laser beam | |
JPS5852473A (en) | Surface treatment of metallic material | |
JPS63114209A (en) | Equipment utilizing photochemical reaction | |
JPS60241219A (en) | Method for forming thin film by utilizing laser | |
JP4094127B2 (en) | Amorphous silicon production equipment | |
JPS61160926A (en) | Photo-excited thin film former | |
JPS63114972A (en) | Photochemical reaction utilizing device | |
JPS6386880A (en) | Photochemical reaction utilizing device | |
JPS6393108A (en) | Formation of optically pumped film | |
JPS60124816A (en) | Thin film growth method | |
JP3554032B2 (en) | Film formation method from low-temperature condensed phase | |
JP3826194B2 (en) | Method for forming silicon oxide film by light irradiation to compound containing Si-O-Si bond | |
JPS6252921A (en) | Light exitation film forming device | |
JPS61183920A (en) | Apparatus for treating semiconductor or metal with laser beam or light | |
JPH0114313B2 (en) | ||
JPH08134654A (en) | Formation of thin film of metallic compound and method for patterning same |