JPS63277769A - Device for utilizing photochemical reaction - Google Patents

Device for utilizing photochemical reaction

Info

Publication number
JPS63277769A
JPS63277769A JP11268687A JP11268687A JPS63277769A JP S63277769 A JPS63277769 A JP S63277769A JP 11268687 A JP11268687 A JP 11268687A JP 11268687 A JP11268687 A JP 11268687A JP S63277769 A JPS63277769 A JP S63277769A
Authority
JP
Japan
Prior art keywords
light incident
window part
incident window
reaction
reaction chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11268687A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Sakai
善行 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP11268687A priority Critical patent/JPS63277769A/en
Publication of JPS63277769A publication Critical patent/JPS63277769A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J19/00Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J19/08Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor
    • B01J19/12Processes employing the direct application of electric or wave energy, or particle radiation; Apparatus therefor employing electromagnetic waves
    • B01J19/121Coherent waves, e.g. laser beams

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To prevent cloudiness of a light incident window part and to stably advance chemical reaction on the surface of a substrate by providing a means for heating the light incident window part of a reaction chamber. CONSTITUTION:In a device for utilizing photochemical reaction wherein a silicon oxide film or the like is formed on a silicon substrate 1, electrically-conductive substance 14 is coated in a band-shape on quartz glass constituting the light incident window part 12 of a reaction chamber 2. The light incident window part 12 is heated by allowing current to flow through the electrically-conductive substance 14. Further a heater may be provided around the light incident window part 12. The deposition velocity onto the light incident window part 12 of a reaction product in the reaction chamber 2 is lowered by the rise in temp. of the light incident window part 12 and the cloudiness of the light incident window part 12 is inhibited.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、光を利用して化学反応を誘起する装置、特に
その光入射窓部の曇りを防止する技術に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a device that uses light to induce a chemical reaction, and particularly to a technique for preventing fogging of a light entrance window thereof.

〔従来の技術〕[Conventional technology]

この種の光化学反応利用装置として、従来より第2図に
示すような装置が知られている。すなわち、この装置は
内部に半導体基板1を設置した反応チャンバ2と、レー
ザ光源3、ミラー4、レンズ5より成り半導体基板1上
をレーザ光6で照射するための光化学系と、反応チャン
バ2を排気するための真空ポンプ7と、ガスボンベ8〜
10、マスプローメータ11より成り反応チャンバ2に
反応性ガスを供給するガス系とから構成されている。ガ
スボンベ9.10より反応チャンバ2内に導入された反
応性ガスは反応チャンバ2の上部の光入射窓部12より
照射されるレーザー光6のエネルギーを吸収して分解し
、例えばガスボンベlOより供給された5iHnガスと
ガスボンベ9より供給された0、ガスとより5iO1を
生成し、半導体基板1の表面上に酸化シリコン膜を堆積
する。この装置を使用すると、半導体基板1の温度が1
00〜200℃と極めて低くても、成長速度を低下させ
ることなく良質の薄膜を得ることができる。
As this type of photochemical reaction utilization device, a device as shown in FIG. 2 has been known. That is, this device includes a reaction chamber 2 in which a semiconductor substrate 1 is installed, a photochemical system consisting of a laser light source 3, a mirror 4, and a lens 5 for irradiating the semiconductor substrate 1 with laser light 6, and a reaction chamber 2. Vacuum pump 7 for evacuation and gas cylinder 8~
10, and a gas system consisting of a mass probe meter 11 for supplying reactive gas to the reaction chamber 2. The reactive gas introduced into the reaction chamber 2 from the gas cylinder 9.10 absorbs the energy of the laser beam 6 irradiated from the light entrance window 12 at the upper part of the reaction chamber 2, decomposes, and decomposes the reactive gas supplied from the gas cylinder 10, for example. 5iO1 is generated from the 5iHn gas and the 0 gas supplied from the gas cylinder 9, and a silicon oxide film is deposited on the surface of the semiconductor substrate 1. When this device is used, the temperature of the semiconductor substrate 1 is 1
Even at extremely low temperatures of 00 to 200°C, high-quality thin films can be obtained without reducing the growth rate.

しかし上記化学反応が表面反応でない場合、し−ザ光6
の通過する領域では反応が進行し、反応生成物が堆積す
る。すなわち、反応チャンバ2の光入射窓部12におい
てチャンバ内部に反応生成物が付着し、時間の経過とと
もにレーザ光6を遮蔽するようになり、半導体基板1上
の反応を押さえてしまうことになる。したがってレーザ
ー光入射窓部の反応生成物付着防止は、光化学反応利用
装置にとって必要不可欠な技術である。このため従来は
、反応チャンバ2内の光入射窓部12に向は曇り防止ノ
ズル13を開口させ、ガスボンベ8より窒素等の不活性
ガスを光入射窓部12にのみ局所的に吹き付け、反応性
ガスが光入射窓部12の近傍に流れ込まないようにする
方法が考えられている。しかしこのような単純な方法で
は、気体の乱流が発生し、反応性ガスを光入射窓部から
完全に除去することは困難である。したがって、長時間
のレーザ光照射後には光入射窓部に曇りが生じ始め、膜
の成長速度の経時変化を押さえることはできないという
問題点があった。
However, if the above chemical reaction is not a surface reaction, then
The reaction proceeds in the region through which it passes, and reaction products are deposited. That is, reaction products adhere to the interior of the light entrance window 12 of the reaction chamber 2, and over time they begin to block the laser beam 6, thereby suppressing the reaction on the semiconductor substrate 1. Therefore, preventing reaction products from adhering to the laser beam entrance window is an essential technology for photochemical reaction utilization devices. For this reason, conventionally, an anti-fogging nozzle 13 is opened toward the light entrance window 12 in the reaction chamber 2, and an inert gas such as nitrogen is locally sprayed from the gas cylinder 8 only onto the light entrance window 12, thereby reducing the reactivity. Methods have been considered to prevent gas from flowing into the vicinity of the light entrance window 12. However, with such a simple method, gas turbulence occurs and it is difficult to completely remove the reactive gas from the light entrance window. Therefore, after a long period of laser beam irradiation, the light entrance window begins to become cloudy, and there is a problem in that it is not possible to suppress changes in the film growth rate over time.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明の目的は、光入射窓部の曇りを長時間にわたって
防止し、基板表面上の化学反応を安定に進行させること
が可能な光化学反応利用装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a photochemical reaction utilizing device that can prevent fogging of a light entrance window portion for a long period of time and allow a chemical reaction on a substrate surface to proceed stably.

〔問題点を解決するための手段〕[Means for solving problems]

この目的は本発明によれば、反応チャンバの光入射窓部
を加熱可能に構成することによって達成される。
This object is achieved according to the invention by configuring the light entrance window of the reaction chamber to be heatable.

光入射窓部の加熱温度は200〜500°Cに選ぶと有
利である。
The heating temperature of the light entrance window is advantageously selected to be between 200 and 500°C.

〔作用〕[Effect]

本発明においては、光入射窓部を加熱することにより光
入射窓部の温度が高まり、反応チャンバ内の反応生成物
の光入射窓部上への堆積速度が低下することによって光
入射窓部の曇りが抑制されるものである。
In the present invention, the temperature of the light entrance window increases by heating the light entrance window, and the deposition rate of reaction products in the reaction chamber on the light entrance window decreases, thereby increasing the temperature of the light entrance window. Clouding is suppressed.

〔実施例〕〔Example〕

次に本発明の実施例を図面について説明する。 Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の実施例の構成配置図を示し、第2図と
同等部分には同符号を付しである。第1図の構成が第2
図のものと異なる点は、曇り防止ノズル13を有せず、
それに代えて、光入射窓部12を構成する石英ガラスに
導電性物質14が帯状にコーティングしてあり、この導
電性物質14に電流を流すことにより加熱して光入射窓
部12の温度を上げ得るようになっていることである。
FIG. 1 shows a configuration diagram of an embodiment of the present invention, and the same parts as in FIG. 2 are given the same reference numerals. The configuration in Figure 1 is the second
The difference from the one in the figure is that it does not have the anti-fog nozzle 13,
Instead, the quartz glass constituting the light entrance window 12 is coated with a conductive substance 14 in the form of a band, and by passing an electric current through the conductive substance 14, it is heated and the temperature of the light entrance window 12 is raised. That's what you're supposed to get.

次に本装置を使用して、シリコン基板上に酸化シリコン
膜を形成する方法について説明する。
Next, a method of forming a silicon oxide film on a silicon substrate using this apparatus will be described.

シリコン基板lは反応チャンバ2の200°Cに加熱さ
れた底板上に載置されている0反応を誘起するために光
源3としてArFエキシマレーザを使用し、波長193
nmの発振レーザ光6をミラー4により変向させレンズ
5に入射する。レンズ5により絞り込まれたレーザ光6
は、光入射窓部12を通って反応チャンバ2内に入り、
シリコン基板1の表面上で焦点を結ぶ。
The silicon substrate l is placed on the bottom plate heated to 200°C in the reaction chamber 2. An ArF excimer laser is used as the light source 3 to induce the reaction, and the wavelength is 193°C.
The oscillation laser beam 6 of nm wavelength is deflected by a mirror 4 and enters a lens 5. Laser light 6 narrowed down by lens 5
enters the reaction chamber 2 through the light entrance window 12,
Focus on the surface of silicon substrate 1.

反応ガスとしては、マスフローメータ11により流量制
御されてボンベ10から5d/分のSiH4ガス、ボン
ベ9から8001d/分のN、Oガス、ボンベ8から6
5d/分のN、ガスが導入される0反応チャンバ2内は
真空ポンプ7により排気され、ITorr前後の圧力に
保たれている。
The reaction gases include SiH4 gas at 5 d/min from cylinder 10, N, O gas at 8001 d/min from cylinder 9, and N, O gas from cylinder 8 to 6, whose flow rate is controlled by mass flow meter 11.
The inside of the reaction chamber 2 into which N gas is introduced at 5 d/min is evacuated by a vacuum pump 7 and maintained at a pressure around ITorr.

上記反応ガスを10分間流すと、シリコン基板1の上に
は2000人の厚さの酸化シリコン膜が堆積する。これ
に対し光入射窓部12はその導電性物質14に電流が流
されることにより加熱され温度が上昇しているから、光
入射窓部12上への酸化シリコン膜の仕着速度は抑制さ
れ、はとんど堆積しない。
When the above reaction gas is allowed to flow for 10 minutes, a silicon oxide film with a thickness of 2000 nm is deposited on the silicon substrate 1. On the other hand, since the light entrance window 12 is heated and its temperature rises due to the current flowing through the conductive material 14, the deposition rate of the silicon oxide film on the light entrance window 12 is suppressed. rarely accumulates.

なお光入射窓部を加熱する方法としては、上述の例に限
ることなく、光入射窓部の周辺にヒータを配置し加熱す
るようにしてもよい。
Note that the method of heating the light entrance window is not limited to the above-mentioned example, and heating may be performed by disposing a heater around the light entrance window.

また、上述の実施例では酸化シリコン膜を堆積する場合
について説明したが、それに限ることなく、例えばC2
8ガスによるポリシリコンの光エッチングにも適用でき
、さらに光による堆積、工ッチングばかりでなく、光に
よるドーピング、洗浄等、光化学反応を利用するすべて
の装置に・適用できることは言うまでもない。
Furthermore, although the above-described embodiment describes the case where a silicon oxide film is deposited, the present invention is not limited thereto, for example, C2
It goes without saying that it can be applied to photoetching of polysilicon using 8 gases, and can also be applied not only to photodeposition and etching, but also to all devices that utilize photochemical reactions, such as photodoping and cleaning.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、反応チャンバの光入射窓部を加熱する
ことにより反応生成物の窓部への付着速度を低下させた
ものであるから、窓部の曇りを長時間にわたって防止し
、基板表面上の化学反応を安定に進行させることができ
、また窓部の寿命が長くなるため、設備の稼動率を向上
させることが可能となるものである。
According to the present invention, the rate of adhesion of reaction products to the window is reduced by heating the light incident window of the reaction chamber, which prevents fogging of the window for a long period of time and improves the substrate surface. Since the above chemical reaction can proceed stably and the life of the window is extended, it is possible to improve the operating rate of the equipment.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の構成配置図、第2図は従来
装置の構成配置図である。 1・・・シリコン基板、 2・・・反応チャンバ、 3
・・・レーザ光源、  7・・・真空ポンプ、  8〜
10・・・ガスボンベ、  12・・・反応チャンバの
光入射窓部、14・・・光入射窓部の導電性物質。 第1図 刀ズボン■
FIG. 1 is a structural layout diagram of an embodiment of the present invention, and FIG. 2 is a structural layout diagram of a conventional device. 1... Silicon substrate, 2... Reaction chamber, 3
...Laser light source, 7...Vacuum pump, 8-
DESCRIPTION OF SYMBOLS 10... Gas cylinder, 12... Light incidence window part of reaction chamber, 14... Electrically conductive material of light incidence window part. Figure 1 Sword pants■

Claims (1)

【特許請求の範囲】 1)光を利用して化学反応を誘起する装置において、反
応チャンバの光入射窓部を加熱可能に構成したことを特
徴とする光化学反応利用装置。 2)特許請求の範囲第1項記載の装置において、反応チ
ャンバの光入射窓部の加熱温度が200〜500℃であ
ることを特徴とする光化学反応利用装置
[Scope of Claims] 1) A photochemical reaction utilization device that uses light to induce a chemical reaction, characterized in that a light entrance window of a reaction chamber is configured to be heatable. 2) A photochemical reaction utilization device according to claim 1, wherein the heating temperature of the light entrance window of the reaction chamber is 200 to 500°C.
JP11268687A 1987-05-08 1987-05-08 Device for utilizing photochemical reaction Pending JPS63277769A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11268687A JPS63277769A (en) 1987-05-08 1987-05-08 Device for utilizing photochemical reaction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11268687A JPS63277769A (en) 1987-05-08 1987-05-08 Device for utilizing photochemical reaction

Publications (1)

Publication Number Publication Date
JPS63277769A true JPS63277769A (en) 1988-11-15

Family

ID=14592937

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11268687A Pending JPS63277769A (en) 1987-05-08 1987-05-08 Device for utilizing photochemical reaction

Country Status (1)

Country Link
JP (1) JPS63277769A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0379068A2 (en) * 1989-01-18 1990-07-25 Mitsui Engineering and Shipbuilding Co, Ltd. Optical molding method and apparatus

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60212220A (en) * 1984-04-06 1985-10-24 Ushio Inc Photochemical reaction apparatus
JPS61234532A (en) * 1985-04-11 1986-10-18 Nec Corp Device for photochemical gas phase growth of silicon oxide film
JPS6252921A (en) * 1985-09-02 1987-03-07 Toshiba Corp Light exitation film forming device
JPS62127469A (en) * 1985-11-27 1987-06-09 Hitachi Ltd Vapor growth apparatus
JPS63168027A (en) * 1986-12-29 1988-07-12 Matsushita Electric Ind Co Ltd Film forming device
JPS63271920A (en) * 1987-04-28 1988-11-09 Matsushita Electric Ind Co Ltd Optical pumping epitaxial growth equipment

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60212220A (en) * 1984-04-06 1985-10-24 Ushio Inc Photochemical reaction apparatus
JPS61234532A (en) * 1985-04-11 1986-10-18 Nec Corp Device for photochemical gas phase growth of silicon oxide film
JPS6252921A (en) * 1985-09-02 1987-03-07 Toshiba Corp Light exitation film forming device
JPS62127469A (en) * 1985-11-27 1987-06-09 Hitachi Ltd Vapor growth apparatus
JPS63168027A (en) * 1986-12-29 1988-07-12 Matsushita Electric Ind Co Ltd Film forming device
JPS63271920A (en) * 1987-04-28 1988-11-09 Matsushita Electric Ind Co Ltd Optical pumping epitaxial growth equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0379068A2 (en) * 1989-01-18 1990-07-25 Mitsui Engineering and Shipbuilding Co, Ltd. Optical molding method and apparatus

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