JPS6315823Y2 - - Google Patents

Info

Publication number
JPS6315823Y2
JPS6315823Y2 JP7541778U JP7541778U JPS6315823Y2 JP S6315823 Y2 JPS6315823 Y2 JP S6315823Y2 JP 7541778 U JP7541778 U JP 7541778U JP 7541778 U JP7541778 U JP 7541778U JP S6315823 Y2 JPS6315823 Y2 JP S6315823Y2
Authority
JP
Japan
Prior art keywords
circuit
detection
segment
detection mask
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7541778U
Other languages
English (en)
Japanese (ja)
Other versions
JPS54176379U (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7541778U priority Critical patent/JPS6315823Y2/ja
Publication of JPS54176379U publication Critical patent/JPS54176379U/ja
Application granted granted Critical
Publication of JPS6315823Y2 publication Critical patent/JPS6315823Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP7541778U 1978-06-01 1978-06-01 Expired JPS6315823Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7541778U JPS6315823Y2 (enrdf_load_html_response) 1978-06-01 1978-06-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7541778U JPS6315823Y2 (enrdf_load_html_response) 1978-06-01 1978-06-01

Publications (2)

Publication Number Publication Date
JPS54176379U JPS54176379U (enrdf_load_html_response) 1979-12-13
JPS6315823Y2 true JPS6315823Y2 (enrdf_load_html_response) 1988-05-06

Family

ID=28989804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7541778U Expired JPS6315823Y2 (enrdf_load_html_response) 1978-06-01 1978-06-01

Country Status (1)

Country Link
JP (1) JPS6315823Y2 (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPS54176379U (enrdf_load_html_response) 1979-12-13

Similar Documents

Publication Publication Date Title
US4996659A (en) Method of diagnosing integrated logic circuit
US7085408B1 (en) Method and system for testing image sensor system-on-chip
JPS6315823Y2 (enrdf_load_html_response)
JP2000009810A (ja) 半導体試験用デ―タ処理装置及び方法並びに半導体試験装置
JPS6186638A (ja) 配線パターン欠陥検査方法
JPS61205811A (ja) 欠陥検出方法
JP2501436B2 (ja) パタ−ンデ−タ検査装置
JPS5821110A (ja) パタ−ン検査装置
JP3029634B2 (ja) プリント配線基板の検査装置
JPH09172300A (ja) プリント板ユニットの外観検査方法及び装置
SU1312580A1 (ru) Устройство дл контрол и диагностики цифровых блоков
JPS58132648A (ja) 印刷配線板の自動検査方法およびその装置
JPS5821107A (ja) パタ−ン検査装置
JPH04365045A (ja) レチクルパターン検査装置
JP2022147313A (ja) 外観検査用画像学習装置及び外観検査装置
JPS6022609A (ja) 計測機器におけるテレビカメラ位置ずれ検知方法及び装置
JPS61198069A (ja) 集積回路の試験方法および試験装置
JPH0418684A (ja) 画像処理装置
JPS59132076A (ja) 液晶パネルのパタ−ン検査装置
JPS62293133A (ja) ミラ−歪測定装置
JPH03227100A (ja) 印刷配線板の布線試験データ処理装置
JPS62239038A (ja) プリント回路板検査機
JPH0397079A (ja) 重心検出装置
JPH0916766A (ja) 画像位置同定装置
JPS59165183A (ja) パタ−ン認識装置