JPS63140520A - Heteroepitaxy method of gaas on different type substrate - Google Patents

Heteroepitaxy method of gaas on different type substrate

Info

Publication number
JPS63140520A
JPS63140520A JP9427986A JP9427986A JPS63140520A JP S63140520 A JPS63140520 A JP S63140520A JP 9427986 A JP9427986 A JP 9427986A JP 9427986 A JP9427986 A JP 9427986A JP S63140520 A JPS63140520 A JP S63140520A
Authority
JP
Japan
Prior art keywords
gaas
substrate
heteroepitaxy
stress
impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9427986A
Other languages
Japanese (ja)
Inventor
Yasutomo Kajikawa
靖友 梶川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP9427986A priority Critical patent/JPS63140520A/en
Publication of JPS63140520A publication Critical patent/JPS63140520A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make GaAs with very few dislocation grow on a different type substrate by heteroepitaxy by doping the GaAs with an impurity at the time of epitaxy. CONSTITUTION:An Si substrate is used as a substrate. In is employed as a dopant and added to GaAs with a concentration of about 5X10<19>cm<-3>. As a dislocation caused by a stress is difficult to be introduced into the GaAs by adding In with the concentration of about 5X10<19>cm<-3>, when the GaAs is made to grow by heteroepitaxy on the Si substrate which has a lattice constant and a thermal expansion coefficient different from those of the GaAs, a crystal in which very few dislocations are induced even if a stress is created can be obtained. It is to be noted that the substrate can be made of other materials such as Ge. Also, if a donor impurity such as S or Si is employed, the same effect can be obtained. The impurity concentration of 5X10<18>cm<-3> or higher is effective.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明け、例えば81基版などの異称基板上のGaA
gへテロエピタキシー法、特に、そのGaAs 結晶の
低転位化を達成できる方法に関するものである。
[Detailed Description of the Invention] [Industrial Field of Application] This invention is applicable to GaA on heterogeneous substrates such as 81 substrates.
The present invention relates to a g-heteroepitaxy method, and in particular to a method capable of achieving low dislocations in GaAs crystals.

〔従来の技術〕[Conventional technology]

図は、例えばアプライF・フィジックス・レター第45
巻(Appl、Phys、Lett、 Vol、45)
 (1984) P。
The figure is, for example, Applied F. Physics Letter No. 45.
Volume (Appl, Phys, Lett, Vol, 45)
(1984) P.

1107に示さねた従来技術によって81基板上にヘテ
ロエピタキシャルIilさせた無添加のGaAIIの断
面透過顕微競写真である。
1107 is a cross-sectional transmission micrograph of additive-free GaAII formed heteroepitaxially on the 81 substrate by the conventional technique shown in FIG.

この写真け、GaAsとSlの界面から転位が発生し、
GaA一層の内部へ伝播している様子を示している。こ
の転位は、GaAsと81との格子定数及び熱膨張係数
が異なるので、応力が生じ、発生するものである。
In this photo, dislocations occur from the interface between GaAs and Sl.
The figure shows the propagation into the inside of the GaA layer. This dislocation occurs because stress is generated because GaAs and 81 have different lattice constants and coefficients of thermal expansion.

〔発明が解決しようさする問題点〕[Problems that the invention attempts to solve]

このように、異種基板上に無添加のGaAsをヘテロエ
ピタキシャル成長させると、一般に基板とGaAsは格
子定数及び熱膨張係数が異なり、応力が生じるが、無添
加のGaA8t/′i応力に対し、転位が発生しやすい
ので、非常に多くの転位を含んだ結晶となるという問題
点があった。
In this way, when undoped GaAs is heteroepitaxially grown on a foreign substrate, the substrate and GaAs generally have different lattice constants and coefficients of thermal expansion, and stress is generated. Since this phenomenon easily occurs, there is a problem in that the resulting crystal contains a large number of dislocations.

この発明は上記のような問題点を解消するためになされ
たもので、異種基板上に転位の少ないGaAs1ヘテロ
エピタキシヤル成長させる方法を得ることを目的とする
This invention was made to solve the above-mentioned problems, and aims to provide a method for heteroepitaxial growth of GaAs1 on a heterogeneous substrate with fewer dislocations.

〔間四点を解決するための手段〕[Means for solving the four points between]

壷− この発明に係る異種基板上へのGaAaへアロエピタキ
シー法は、異種基板上へGaAsをヘテロエピタキシャ
ル成長させる際に不純物を添加するものである。
Bottle - The alloepitaxy method for GaAs on a heterogeneous substrate according to the present invention is to add impurities when growing GaAs heteroepitaxially on a heterogeneous substrate.

〔作用〕[Effect]

この方法で成長した異種基板上のGaAs i、不純物
添加により、応力に対して転位が生じにくくなるので、
低転位密度となる。
GaAs i on a heterogeneous substrate grown using this method, doping with impurities makes it difficult for dislocations to occur in response to stress.
This results in a low dislocation density.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の一実織例について説明する。 Hereinafter, a weaving example of the present invention will be explained.

基板として31基板を用い、添加不純物としては、In
を用い、GaAsに5 X 10” am−!54Jj
A度添加する。
A 31 substrate was used as the substrate, and In was used as the added impurity.
5 x 10” am-!54Jj on GaAs using
Add degree A.

GaAsはInを5 X 10” am″程度添加する
ことにより、応力に対し転位が導入されにくくなるので
、GaAsと格子定数及び熱膨張係数の異なる81基版
上にGaAsをヘテロエピタキシャル成長させた時、応
力が生じても転位の少ない結晶が得られる。
By adding about 5 x 10"am" of In to GaAs, dislocations are less likely to be introduced due to stress, so when GaAs is heteroepitaxially grown on an 81 substrate having a different lattice constant and coefficient of thermal expansion than GaAs, Even if stress occurs, a crystal with few dislocations can be obtained.

なお、上記実陶例でけ、基板として81基板を用いたが
、基板としてGoなど、他の材料を用いてもよい。また
、上記実施例では、不純物と[、てアイソエレクトロニ
ック(isoelectronic)なInを用いたが
、ドナー不純物である、S、Siなどを用いても同様の
効果を奏する。不純物濃度としては、5 X 1010
1aa’以上が効果的である。
In addition, although the 81 substrate was used as the substrate in the above-mentioned ceramic example, other materials such as Go may be used as the substrate. Further, in the above embodiment, isoelectronic In was used as the impurity, but the same effect can be obtained by using S, Si, etc. as the donor impurity. The impurity concentration is 5 x 1010
1aa' or more is effective.

〔発明の効果〕〔Effect of the invention〕

以上のように、この方法によれば、不純物の添加により
、GaAsに応力に対し転位の導入されにぐい性質が付
加さね、異種基板上に成長じたGaAsにおいて、低転
位のものが得られる効果がある。
As described above, according to this method, the addition of impurities gives GaAs a property that makes it difficult to introduce dislocations under stress, and GaAs grown on a foreign substrate can have low dislocations. effective.

【図面の簡単な説明】[Brief explanation of the drawing]

図は従来技術によって、81基板上にヘテロエピタキシ
ャル成長させた無添加のGaAsの断面透過顕微鏡写真
である。
The figure is a cross-sectional transmission micrograph of additive-free GaAs grown heteroepitaxially on an 81 substrate using the conventional technique.

Claims (1)

【特許請求の範囲】[Claims] GaAs以外の基板上にGaAsをヘテロエピタキシャ
ル成長させるに際して、当該成長層に不純物を添加する
ことを特徴とする異種基板上へのGaAsのヘテロエピ
タキシー法。
A method for heteroepitaxially growing GaAs on a substrate other than GaAs, characterized in that impurities are added to the growth layer when GaAs is heteroepitaxially grown on a substrate other than GaAs.
JP9427986A 1986-04-22 1986-04-22 Heteroepitaxy method of gaas on different type substrate Pending JPS63140520A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9427986A JPS63140520A (en) 1986-04-22 1986-04-22 Heteroepitaxy method of gaas on different type substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9427986A JPS63140520A (en) 1986-04-22 1986-04-22 Heteroepitaxy method of gaas on different type substrate

Publications (1)

Publication Number Publication Date
JPS63140520A true JPS63140520A (en) 1988-06-13

Family

ID=14105817

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9427986A Pending JPS63140520A (en) 1986-04-22 1986-04-22 Heteroepitaxy method of gaas on different type substrate

Country Status (1)

Country Link
JP (1) JPS63140520A (en)

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