JPS631250Y2 - - Google Patents

Description

[Detailed explanation of the invention] (1) Technical field of the invention This invention is an integrated circuit tester, more specifically, a socket connector for a semiconductor integrated circuit (IC) test device that takes measures against ground noise (hereinafter referred to as noise). (Also called connector/printed circuit board)
Regarding.

(2) Background of the technology Noise countermeasures are an important issue when testing (measuring) ICs.
Noise countermeasures are especially difficult when testing.

IC testing using an autohandler will be explained with reference to the schematic cross-sectional view in Figure 1. The part indicated by 1 is the autohandler, and the semiconductor integrated circuit package 2 to be tested (hereinafter referred to as the IC under test) is moved by gravity. Autohandler 1 as shown by the arrow
It slides down on a rail (not shown) and is stopped by a stopper 3 at the position shown. to be tested here
Push down the IC to connect its terminals 2a (only a few are shown in the figure) to pins 4a (only a few are shown in the figure) of the contact part 4, then push down the contact part and connect the pins to the socket connector 5. socket 5
a, and this socket is connected to the IC tester 7 by wiring 6 (only a few wires are shown in the figure).
The IC tester 7 performs various tests on the IC under test. The wiring 6 is a pair of wires, which are a ground wire and a signal wire twisted together.

(3) Prior art and problems It was explained above that noise countermeasures are a difficult problem, and the reason for this is that it depends on the wiring length for connecting the signal lines and electrodes taken out from the IC tester 7 to the IC under test 2. This is due to noise caused by inductance.

As one of the noise countermeasures, as shown in the schematic cross-sectional view of FIG.
Application electrode and measurement electrode of IC tester 7 and under test
A method has been proposed to minimize noise by minimizing the inductance between the ground line of the IC tester 7 and the ground line terminal of the IC under test 2 by minimizing the distance between the IC tester 7 and the IC 2. However, in this method, it is necessary to fix the IC tester 7 to the autohandler 1, which requires a separate fixing device, and the IC tester cannot be easily removed.

Instead of the above method, as shown in the schematic cross-sectional view of FIG. 3, a method is used in which a wide copper plate 8 is used to lower the inductance. However, since the wide copper plate 8 is directly attached to the IC tester 7 and the socket connector 5 by soldering, it is vulnerable to the vibrations of the autohandler 1, and the copper plate 8 is subject to stress and may break. Since the socket connector 5 is fixed by the copper plate 8, there is a problem that the operability of the socket connector 5 is deteriorated.

(4) Purpose of the invention In view of the above-mentioned conventional problems, the object of the present invention is to provide a socket connector with noise countermeasures for use in equipment used for testing semiconductor integrated circuits.

(5) Structure of the invention According to the invention, the purpose is to provide a socket that connects the grounding wire of a tester for testing an integrated circuit and the pin of a contact section connected to the tester and connected to the integrated circuit under test. This is achieved by providing an integrated circuit tester characterized in that a grounding wire of a socket connector having a conductive rubber is connected to the grounding wire of the socket connector.

(6) Example of implementation of the idea Embodiments of the present invention will be described in detail below with reference to the drawings.

The inventor of this application considered the problems in the prior art, and considered that the ground wire should not be fixed like the copper plate 8, and that a certain amount of wiring length should be secured in order to maintain the operability of the socket connector. IC tester 7 uses a wide strip of conductive rubber.
We decided to create the same effect as in the case of Figure 2, in which the grounding wire of IC2 and the grounding wire of IC2 under test were connected by the shortest line.

Such conductive rubber is designated by reference numeral 9 in the perspective view of FIG.
Shown with . The conductive rubber 9 is the IC tester 7
Using two copper blocks 10, use scissors and screw 1
Fixed at 1. As shown in the plan view of FIG. 5, the socket connector 5 has two elongated copper blocks 12.
Use scissors and fix with screws 13.

Since the conductive rubber 9 is wide like the copper plate 8, even if it is made long, the inductance and resistance can be kept small as in the case of the copper plate 8, and it is flexible and can be expanded and contracted. Therefore, even if it is fixed to the socket connector, the operability of the socket connector will not deteriorate.
Furthermore, it will not break or come off due to the operation of the autohandler 1. Furthermore, the autohandler 1 and IC tester 7 can be separated using the copper block 1.
This can be easily done by simply removing the conductive rubber 9 sandwiched between the two.

FIG. 6 shows another embodiment of the present invention, FIG. 7 is a view showing the back side of the contactor, and FIG. 8 is a perspective view of the contactor. Also in this embodiment, the ground pattern of the contactor 14 and the ground pattern of the performance board 19 are connected by the conductive rubber 9. FIG. 8 shows the state before assembly, in which the support member 20 of the contactor 14 is attached to the autohandler 1.
It operates as a tester by fixing the tester to the frame and connecting the performance board 19 to the contact pins 16. The conductive rubber 9 is the seventh
Printed board 1 constituting the contactor 14 as shown in the figure
5 ground pattern. and the eighth
As shown in the figure, the IC2 under test is mounted on the carrier 17,
The test is performed by positioning this using the guide pin 18.

(7) Effects of the invention As explained in detail above, according to the present invention,
Noise countermeasures are taken by ensuring a certain wiring length without fixing the grounding wire, and it has the same effect as connecting the grounding wire of the IC tester and the grounding wire of the IC under test with the shortest possible wire.

[Brief explanation of the drawing]

Figure 1 is a schematic sectional view of the main parts of an autohandler and IC tester, Figures 2 and 3 are schematic sectional views of the main parts of a conventional autohandler and IC tester, and Figure 4 is a schematic sectional view of the main parts of a conventional autohandler and IC tester.
The figure is a perspective view of the embodiment of the present invention, FIG. 5 is a plan view of the connecting part of the conductive rubber and socket connector shown in FIG.
FIG. 6 is a sectional view of another embodiment of the present invention, FIG. 7 is a view showing the back side of the contactor, and FIG. 8 is a perspective view of the contactor. 1...Auto handler, 2...IC under test,
2a...terminal, 3...stopper, 4...contact part, 5...socket connector, 5a...socket, 6...wiring, 7...IC tester, 8...copper plate, 9...conductive rubber , 10, 12... Copper block, 11, 13... Screw, 14... Contactor, 15... Printed board, 16... Contact pin, 17... Carrier, 18... Guide pin, 1
9...Performance board.

Claims (1)

[Scope of utility model registration request] Connect the ground wire of a tester that tests an integrated circuit and the ground wire of a socket connector that is connected to the tester and has a socket that connects to the pins of the contact part connected to the integrated circuit under test with conductive rubber. An integrated circuit tester characterized in that the integrated circuit tester is connected using the integrated circuit.