JPS63117436A - Film carrier - Google Patents

Film carrier

Info

Publication number
JPS63117436A
JPS63117436A JP61262770A JP26277086A JPS63117436A JP S63117436 A JPS63117436 A JP S63117436A JP 61262770 A JP61262770 A JP 61262770A JP 26277086 A JP26277086 A JP 26277086A JP S63117436 A JPS63117436 A JP S63117436A
Authority
JP
Japan
Prior art keywords
opening
film carrier
semiconductor chip
carrier
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61262770A
Other languages
Japanese (ja)
Inventor
Yuichiro Iba
伊庭 祐一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP61262770A priority Critical patent/JPS63117436A/en
Publication of JPS63117436A publication Critical patent/JPS63117436A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE:To suppress the displacement of a lead in relation to an electrode pad even when the lead is deformed by external force in such a way that the circumference of an opening which is used for mounting a semiconductor chip is reinforced. CONSTITUTION:A semiconductor chip 3 is mounted on a film carrier 1 from the underside of an opening 5; on one face of the carrier 1, two or more leads 9 composed of a sheet of metal foil are arranged along each side of the opening 5 at prescribed intervals. A reinforcement plate 13 composed of an insulating plastic material is fixed to the other face of the carrier 1; this reinforcement plate 13 is shaped like a frame having an opening 15 whose size is almost the same as that of the opening 5. After the opening 5 has been aligned with the chip 3, a bonding tool 17 is lowered so that the leads 9 can be pressed and bonded to pads 11 by heating. If any force is applied from the outside, the flexible carrier 1 is deformed at the part where the reinforcement plate 13 is not glued, i.e. at the part which is not located at the circumference of the opening 5, the part which is located at the circumference of the opening 5 is difficult to deform because the reinforcement plate 13 is glued. As a result, it is possible to suppress the displacement of the leads 9 in relation to the pads 11 at the chip 3.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) この発明は、例えばテープキャリア方式により半導体チ
ップを実装するフィルムキャリアに関する。
Detailed Description of the Invention [Object of the Invention] (Industrial Application Field) The present invention relates to a film carrier for mounting semiconductor chips using, for example, a tape carrier method.

(従来の技術) 近年、半導体技術の発展により、電子装置を小型で高機
能にする要求から、半導体チップの薄型高密度実装化が
進んでいる。この薄型高密度実装化を実現するための手
段として、例えば半導体チップをフィルムキャリアに取
付けて実装する所謂テープキャリア方式(TAB)があ
る。
(Prior Art) In recent years, with the development of semiconductor technology, semiconductor chips have become thinner and more densely packaged due to the demand for smaller and more highly functional electronic devices. As a means for realizing this thin and high-density packaging, there is, for example, the so-called tape carrier method (TAB) in which a semiconductor chip is mounted on a film carrier.

このようなテープキャリア方式は、例えば第5図に示す
ようにフィルムキャリアに半導体チップを搭載する。す
なわち、フィルムキャリア101には半導体チップ10
3を搭載するための孔部105が形成され、フィルムキ
ャリア101の一面には回路パターンから孔部105に
突出するリード107が設けられている。一方、半導体
チップ103はステージ109上に載置され、孔部10
5との位置合せを行った後、ボンディングツール111
のツール面113によりリード107と電極バッド11
5とが加熱押圧されてフィルムキャリア101に接合さ
れる。なお、117は接&!媒体としてのバンブである
In such a tape carrier method, a semiconductor chip is mounted on a film carrier, as shown in FIG. 5, for example. That is, the semiconductor chip 10 is mounted on the film carrier 101.
A hole 105 is formed for mounting 3, and a lead 107 is provided on one side of the film carrier 101 to protrude from the circuit pattern into the hole 105. On the other hand, the semiconductor chip 103 is placed on the stage 109, and the hole 10
5, the bonding tool 111
Lead 107 and electrode pad 11 are connected by tool surface 113 of
5 are heated and pressed and bonded to the film carrier 101. In addition, 117 is contact &! Bamboo as a medium.

ところで、このような従来のフィルムキャリア101は
ポリイミド等の絶縁性樹脂テープからなっており、可撓
性を有している。このため、フィルムキャリア101の
作業工程におけるハンドリングや他の外力により、フィ
ルムキャリア101rニー時的;曲がり等の変形が生じ
る場合がある。
By the way, such a conventional film carrier 101 is made of an insulating resin tape such as polyimide and has flexibility. For this reason, the film carrier 101r may be deformed, such as bending, due to handling during the work process of the film carrier 101 or other external forces.

一方、半導体チップ103は剛性体であるので、このよ
うな場合、第6図に示すようにフィルムキャリア゛10
1の変形に伴ない、電極パッド115に対するリード1
07の位置がずれて接合がはずれる虞れがある。
On the other hand, since the semiconductor chip 103 is a rigid body, in such a case, as shown in FIG.
Due to the deformation of lead 1, lead 1 to electrode pad 115
There is a risk that the position of 07 may shift and the connection may come off.

(発明が解決しようとする問題点) 上記のように従来のフィルムキャリアは可撓性を有して
いるため、外力により変形した場合は半導体チップの電
極パッドに対するリードの位置がずれて接合がはずれる
虞れがある。
(Problems to be Solved by the Invention) As mentioned above, conventional film carriers have flexibility, so if they are deformed by external force, the positions of the leads relative to the electrode pads of the semiconductor chip will shift and the bond will come off. There is a risk.

この発明は上記問題に着目してなされたもので、外力に
より変形しても電極パッドに対するリードの位置がずれ
るのを抑えることができるフィルムキャリアの提供を目
的とする。
The present invention has been made in view of the above-mentioned problem, and an object of the present invention is to provide a film carrier that can suppress displacement of the lead relative to the electrode pad even if the film carrier is deformed by external force.

[発明の構成] (問題点を解決するための手段) 上記目的を達成するためにこの発明は、半導体チップを
搭載するために形成され、前記半導体チップの電極パッ
ドと接続されるリードが突出する孔部を備えたフィルム
キャリアにおいて、前記孔部付近を補強する構成とした
[Structure of the Invention] (Means for Solving the Problems) In order to achieve the above object, the present invention provides a semiconductor chip formed for mounting a semiconductor chip, with leads protruding to be connected to electrode pads of the semiconductor chip. A film carrier having holes is configured to reinforce the vicinity of the holes.

(作用) 上記構成において、フィルムキャリアが外力により変形
しても、孔部付近は補強されているので、半導体チップ
の電極パッドに対するリードの位置がずれるのを抑える
ことができる。
(Function) In the above structure, even if the film carrier is deformed by an external force, the vicinity of the hole is reinforced, so it is possible to prevent the leads from shifting in position with respect to the electrode pads of the semiconductor chip.

(実施例) 以下図面に基づき、この発明の実施例を詳細に説明する
(Example) Examples of the present invention will be described in detail below based on the drawings.

第1図および第2図は、この発明の一実施例に係わるフ
ィルムキャリアを示している。
1 and 2 show a film carrier according to an embodiment of the present invention.

第1図および第2図において、ポリイミド等の絶縁性樹
脂テープからなる可撓性のフィルムキャリア31には半
導体チップ3を搭載するための孔部5が形成され、半導
体チップ3は孔部5の図中下方からフィルムキャリア1
に搭載される。また、フィルムキャリア1の左右縁部に
は長さ方向に送り孔7が形成され、フィルムキャリア1
は図外の送り装置により孔部5の1コマ毎に移動可能と
なっている。
1 and 2, a hole 5 for mounting a semiconductor chip 3 is formed in a flexible film carrier 31 made of an insulating resin tape such as polyimide, and the semiconductor chip 3 is placed in the hole 5. Film carrier 1 from the bottom in the diagram
will be installed on. Further, feed holes 7 are formed in the left and right edges of the film carrier 1 in the length direction, and the film carrier 1
can be moved frame by frame in the hole 5 by a feeding device (not shown).

フィルムキャリア1の一面(図中上面)には銅等の金属
箔からなるリード9が孔部5の各辺に沿い所定のピッチ
を持って複数個設けられている。
A plurality of leads 9 made of metal foil such as copper are provided on one surface (upper surface in the figure) of the film carrier 1 along each side of the hole 5 at a predetermined pitch.

リード9の基部はフィルムキャリア1上で回路パターン
を構成し、一方、リード9の先端部は半導体チップ3の
電極パッド11との接続部として孔部5に突出して臨ん
でいる。
The bases of the leads 9 constitute a circuit pattern on the film carrier 1, while the tips of the leads 9 protrude into the holes 5 as connection parts with the electrode pads 11 of the semiconductor chip 3.

フィルムキャリア1の他面(図中下面)には絶縁性の合
成樹脂体からなる補強板13が接着剤等により固定され
ている。補強板13は孔部5と略同じ大きさの孔部15
を持った枠状に形成され、フィルムキャリア1に半導体
チップ3を接合するときに与える影響は小さいものとな
っている。これにより、フィルムキャリア1の孔部5付
近が補強され、曲げや他の外力に対する剛性が高められ
る。なお、補強板13を接着する変わりに、同位置に絶
縁性の合成樹脂材を塗布する構成としてもよい。
A reinforcing plate 13 made of an insulating synthetic resin is fixed to the other surface (lower surface in the figure) of the film carrier 1 with an adhesive or the like. The reinforcing plate 13 has a hole 15 approximately the same size as the hole 5.
The semiconductor chip 3 is formed in a frame shape with a . As a result, the vicinity of the hole 5 of the film carrier 1 is reinforced, and its rigidity against bending and other external forces is increased. Incidentally, instead of adhering the reinforcing plate 13, an insulating synthetic resin material may be applied at the same position.

そして、フィルムキャリア1の孔部5と半導体チップ3
との位置合せを行なった後、ボンディングツール17を
下降させてリード9と電極パッド11とを熱圧着接合す
る。なお、19は接続媒体としてのバンブであり、接合
を容易にすると共に接合時の熱から半導体素子を保護す
る。
Then, the hole 5 of the film carrier 1 and the semiconductor chip 3
After alignment with the lead 9 and the electrode pad 11, the bonding tool 17 is lowered to bond the lead 9 and the electrode pad 11 by thermocompression. Note that 19 is a bump as a connecting medium, which facilitates bonding and protects the semiconductor element from heat during bonding.

次に作用を説明する。Next, the action will be explained.

上記構成において、外力が作用すると可撓性のフィルム
キャリア1は、補強板13が接着されていないすなわち
孔部5付近でない部分が変形し、一方、孔部5付近は補
強板13が接着されているので変形しずらい。この結果
、リード9が変形しずらく、従って、リード9の位置が
半導体チップ3の電極パッド11に対してずれるのを抑
えることができる。
In the above configuration, when an external force is applied, the flexible film carrier 1 deforms in the portions where the reinforcing plate 13 is not bonded, that is, in the vicinity of the hole 5, and on the other hand, in the vicinity of the hole 5, the portion where the reinforcing plate 13 is bonded is deformed. It is hard to deform because it is. As a result, the leads 9 are not easily deformed, and therefore, the position of the leads 9 can be prevented from shifting with respect to the electrode pads 11 of the semiconductor chip 3.

第3図および第4図は他の実施例を示している。3 and 4 show other embodiments.

この実施例では、孔部5付近のリード9の厚さdが従来
のものく例えば30μ)より厚く構成されていると共に
、巾Wが従来のものく例えば80μ)より広く構成され
ている。従って、リード9自体の剛性が高まると周鍔に
、リード9が形成されているフィルムキャリア1の剛性
も高まる。上記構成にあっては、フィルムキャリア1に
外力が加わっても、孔部5付近の剛性が高まっているの
で前述の実施例と同様の効果を得ることができる。なお
、リード9は、厚さ又は巾のいずれか一方を厚くするか
又は広くするような構成としても剛性が高まることはい
うまでもない。
In this embodiment, the thickness d of the lead 9 in the vicinity of the hole 5 is thicker than the conventional one (for example, 30 .mu.), and the width W is wider than the conventional one (for example, 80 .mu.). Therefore, when the rigidity of the lead 9 itself increases, the rigidity of the film carrier 1 on which the lead 9 is formed on the periphery also increases. With the above configuration, even if an external force is applied to the film carrier 1, the rigidity near the hole 5 is increased, so that the same effect as in the above embodiment can be obtained. It goes without saying that the rigidity of the lead 9 can also be increased by making either the thickness or the width thicker or wider.

[発明の効果] 以上説明したようにこの発明によれば、半導体チップを
搭載するための孔部付近を補強したため、フィルムキャ
リア3が外力により変形しても、半導体チップの電極パ
ッドに対するリードの位置がずれるのを抑えることがで
き、フィルムキャリアへの半導体チップの接合の信頼性
を高めることができる。
[Effects of the Invention] As explained above, according to the present invention, since the vicinity of the hole for mounting the semiconductor chip is reinforced, even if the film carrier 3 is deformed by external force, the position of the leads relative to the electrode pads of the semiconductor chip is maintained. It is possible to suppress the displacement of the semiconductor chip and improve the reliability of bonding the semiconductor chip to the film carrier.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例に係わるノイルムキャリア
の断面図、第2図は同上面図、第3図は他の実施例の断
面図、第4図は同底面図、第5図は従来例の断面図、第
6図は同作用説明図1・・・フィルムキャリア 3・・・半導体チップ 5・・・孔部 9・・・リード 13・・・補強板
FIG. 1 is a sectional view of a Neulum carrier according to one embodiment of the present invention, FIG. 2 is a top view of the same, FIG. 3 is a sectional view of another embodiment, FIG. 4 is a bottom view of the same, and FIG. 6 is a cross-sectional view of the conventional example, and FIG. 6 is an explanatory diagram of the same function. 1... Film carrier 3... Semiconductor chip 5... Hole 9... Lead 13... Reinforcement plate

Claims (3)

【特許請求の範囲】[Claims] (1)半導体チップを搭載するために形成され、前記半
導体チップの電極パッドと接続されるリードが突出する
孔部を備えたフィルムキャリアにおいて、前記孔部付近
を補強してなることを特徴とするフィルムキャリア。
(1) A film carrier that is formed to mount a semiconductor chip and has a hole from which a lead protrudes to be connected to an electrode pad of the semiconductor chip, the film carrier being reinforced near the hole. film carrier.
(2)前記孔部付近の補強は、絶縁性の補強材を接着又
は塗布することにより行うことを特徴とする特許請求の
範囲第1項記載のフィルムキャリア。
(2) The film carrier according to claim 1, wherein the reinforcement near the hole is performed by adhering or applying an insulating reinforcing material.
(3)前記孔部付近の補強は、前記リードを厚く又は巾
広くして行うことを特徴とする特許請求の範囲第1項記
載のフィルムキャリア。
(3) The film carrier according to claim 1, wherein the reinforcement near the hole is performed by making the lead thicker or wider.
JP61262770A 1986-11-06 1986-11-06 Film carrier Pending JPS63117436A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61262770A JPS63117436A (en) 1986-11-06 1986-11-06 Film carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61262770A JPS63117436A (en) 1986-11-06 1986-11-06 Film carrier

Publications (1)

Publication Number Publication Date
JPS63117436A true JPS63117436A (en) 1988-05-21

Family

ID=17380346

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61262770A Pending JPS63117436A (en) 1986-11-06 1986-11-06 Film carrier

Country Status (1)

Country Link
JP (1) JPS63117436A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0382047A (en) * 1989-08-24 1991-04-08 Nec Corp Film carrier semicodcutor device
JPH03125440A (en) * 1989-10-09 1991-05-28 Rohm Co Ltd Electronic parts

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0382047A (en) * 1989-08-24 1991-04-08 Nec Corp Film carrier semicodcutor device
JPH03125440A (en) * 1989-10-09 1991-05-28 Rohm Co Ltd Electronic parts

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