JPS6311634Y2 - - Google Patents
Info
- Publication number
- JPS6311634Y2 JPS6311634Y2 JP18313181U JP18313181U JPS6311634Y2 JP S6311634 Y2 JPS6311634 Y2 JP S6311634Y2 JP 18313181 U JP18313181 U JP 18313181U JP 18313181 U JP18313181 U JP 18313181U JP S6311634 Y2 JPS6311634 Y2 JP S6311634Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- magnetic tape
- transmittance
- wavelength
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000002834 transmittance Methods 0.000 claims description 24
- 230000003287 optical effect Effects 0.000 claims description 21
- 238000001514 detection method Methods 0.000 claims description 13
- 238000005259 measurement Methods 0.000 claims description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- 230000001360 synchronised effect Effects 0.000 description 14
- 238000006243 chemical reaction Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981183131U JPS5888147U (ja) | 1981-12-09 | 1981-12-09 | 磁気テ−プの光透過率測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981183131U JPS5888147U (ja) | 1981-12-09 | 1981-12-09 | 磁気テ−プの光透過率測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5888147U JPS5888147U (ja) | 1983-06-15 |
| JPS6311634Y2 true JPS6311634Y2 (de) | 1988-04-05 |
Family
ID=29982120
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1981183131U Granted JPS5888147U (ja) | 1981-12-09 | 1981-12-09 | 磁気テ−プの光透過率測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5888147U (de) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54115061A (en) * | 1978-02-28 | 1979-09-07 | Fujitsu Ltd | Inspection method of semiconductor wafer by infrared rays |
-
1981
- 1981-12-09 JP JP1981183131U patent/JPS5888147U/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54115061A (en) * | 1978-02-28 | 1979-09-07 | Fujitsu Ltd | Inspection method of semiconductor wafer by infrared rays |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5888147U (ja) | 1983-06-15 |
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