JPS63110730A - Drying method for semiconductor wafer - Google Patents
Drying method for semiconductor waferInfo
- Publication number
- JPS63110730A JPS63110730A JP25757986A JP25757986A JPS63110730A JP S63110730 A JPS63110730 A JP S63110730A JP 25757986 A JP25757986 A JP 25757986A JP 25757986 A JP25757986 A JP 25757986A JP S63110730 A JPS63110730 A JP S63110730A
- Authority
- JP
- Japan
- Prior art keywords
- wafers
- drying
- plate
- sticking plate
- steam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001035 drying Methods 0.000 title claims abstract description 26
- 239000004065 semiconductor Substances 0.000 title claims description 8
- 235000012431 wafers Nutrition 0.000 claims abstract description 43
- 239000003960 organic solvent Substances 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims abstract description 6
- 238000010438 heat treatment Methods 0.000 claims description 2
- 239000007788 liquid Substances 0.000 abstract description 3
- 238000005498 polishing Methods 0.000 abstract description 3
- 239000004744 fabric Substances 0.000 abstract description 2
- PGOSAMIUUGUNNE-UHFFFAOYSA-N Cl[O-].[Th+4].Cl[O-].Cl[O-].Cl[O-] Chemical group Cl[O-].[Th+4].Cl[O-].Cl[O-].Cl[O-] PGOSAMIUUGUNNE-UHFFFAOYSA-N 0.000 abstract 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract 1
- 238000011109 contamination Methods 0.000 abstract 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 239000005708 Sodium hypochlorite Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- SUKJFIGYRHOWBL-UHFFFAOYSA-N sodium hypochlorite Chemical compound [Na+].Cl[O-] SUKJFIGYRHOWBL-UHFFFAOYSA-N 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000010186 staining Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、半導体ウェハーの乾燥方法に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for drying semiconductor wafers.
[従来の技術]
ポリッシングにより鏡面状に研磨されたウェハーは水洗
により研磨液が洗い落され、その後乾燥が行なわれるの
であるが、このとき従来はウェハー1枚毎にアルゴンガ
スを吹付けてウェハーに付着した水分を乾燥させる方法
が用いられていた。[Prior Art] Wafers that have been polished to a mirror-like finish are washed with water to remove the polishing liquid, and then dried. At this time, conventionally, argon gas is sprayed onto each wafer. A method was used to dry the adhering moisture.
[発明が解決しようとする問題点]
上述したように従来のウェハーの乾燥方法では、ウェハ
ー1枚毎にアルゴンガスを吹付けて乾燥させているため
効率が悪く、また、飛散した水滴が乾燥の終了したウェ
ハーに付着してじみや汚れが発生し、洗浄のやり直しを
生ずるなどの問題点があった。[Problems to be Solved by the Invention] As mentioned above, in the conventional wafer drying method, argon gas is sprayed onto each wafer to dry it, which is inefficient, and the scattered water droplets cause a problem in the drying process. There were problems such as stains and stains adhering to the finished wafers, requiring re-cleaning.
本発明の目的は、作業効率を向上する半導体ウェハーの
乾燥方法を提供することにある。An object of the present invention is to provide a semiconductor wafer drying method that improves work efficiency.
[問題点を解決するための手段]
本発明は、鏡面状に研磨され洗浄されたウェハーを乾燥
する半導体ウェハーの乾燥方法において、複数のウェハ
ーが接着された貼付プレートをを機溶剤を加熱して蒸気
を発生する蒸気槽内に挿入し、この有機溶剤の蒸気によ
り、前記複数のウェハーを前記貼付プレートに貼付した
状態で乾燥することを特徴とし、作業効率を向上するよ
うにして目的の達成を計ったものである。[Means for Solving the Problems] The present invention provides a semiconductor wafer drying method for drying a mirror-polished and cleaned wafer, in which a bonding plate to which a plurality of wafers are bonded is heated with a solvent. The wafer is inserted into a steam tank that generates steam, and the plurality of wafers are dried while being attached to the attachment plate by the vapor of the organic solvent, thereby improving work efficiency and achieving the objective. It was measured.
[作 用]
ウェハーを鏡面状に加工する場合は、ウェハー片面を貼
付プレートに接着し、別の片面をポリッシングにより研
磨したのち洗浄し、その後1枚づつ乾燥して仕上げるの
であるが、このとき本発明によるウェハーの乾燥方法で
は、複数のウェハーが貼付されている貼付プレートを有
機溶剤の蒸気の中に挿入し、ウェハーを貼付プレートに
貼付したままの状態で乾燥するようにしであるので、極
めて効率のよい乾燥を行なうことができる。[Function] When processing a wafer into a mirror-like finish, one side of the wafer is glued to an attachment plate, the other side is polished and cleaned, and then dried one by one to finish the wafer. In the method of drying wafers according to the invention, a sticking plate on which a plurality of wafers are stuck is inserted into organic solvent vapor, and the wafers are dried while being stuck to the sticking plate, so it is extremely efficient. Good drying can be achieved.
[実施例] 以下、本発明の一実施例を図により説明する。[Example] Hereinafter, one embodiment of the present invention will be described with reference to the drawings.
第1図は本発明方法を実現する一実施例の蒸気乾燥機の
説明図である。FIG. 1 is an explanatory diagram of an embodiment of a steam dryer that implements the method of the present invention.
図において1は乾燥槽を示す。2は貼付プレート、3は
ヒ化ガリウム(GaAs)ウェハーで、貼付プレート2
にワックスで接着されている。4は有機溶剤、5は有機
溶剤4を加熱するヒータ、6はを機溶剤4の蒸気層を示
す。7は蒸気温度を加減する冷却コイル、8は貼付プレ
ート2を保持するチャックである。In the figure, 1 indicates a drying tank. 2 is a pasting plate, 3 is a gallium arsenide (GaAs) wafer, pasting plate 2
is glued with wax. 4 is an organic solvent, 5 is a heater for heating the organic solvent 4, and 6 is a vapor layer of the organic solvent 4. 7 is a cooling coil that adjusts the steam temperature, and 8 is a chuck that holds the attachment plate 2.
本実施例では、乾燥槽1は寸法が200mmX400a
+mの大きさのもので、貼付プレート2は直径φ304
、厚さt〜15ma+のセラミック(Ag203)製の
ものである。この貼付プレート2に直径φ2°のGaA
sウェハー3を10枚並べてワックスで接着し、このウ
ェハー3をスェードタイプの布と次亜塩素酸ナトリウム
系の研磨液によりポリッシングし、ついで水洗を十分行
った後、乾燥槽1に挿入し、高さ約4001の蒸気層6
の中で約3分間乾燥を行なうことにより、乾燥むらや汚
れを生ぜず良好なウェハーを得ることができる。In this embodiment, the drying tank 1 has dimensions of 200 mm x 400 mm.
+ m in size, and the attachment plate 2 has a diameter of φ304
It is made of ceramic (Ag203) and has a thickness of t~15ma+. GaA with a diameter of φ2° is attached to this pasting plate 2.
Ten S wafers 3 are lined up and glued together with wax, and the wafers 3 are polished using a suede type cloth and a sodium hypochlorite-based polishing liquid. After thoroughly rinsing with water, they are inserted into the drying tank 1 and heated to a high temperature. Vapor layer 6 of about 4001
By drying the wafer for about 3 minutes in the wafer, a good wafer can be obtained without uneven drying or staining.
この場合、ウェハーを接着するワックスは粘度が80c
p以上のものであれば乾燥中にウェハーがずれることは
ない。In this case, the wax used to bond the wafers has a viscosity of 80c.
If it is more than p, the wafer will not shift during drying.
以上、本実施例を用いることにより、多数のウェハーを
貼付プレートに貼付した状態で乾燥することができ、作
業効率を向上して原価低減に寄与することができる。As described above, by using this embodiment, it is possible to dry a large number of wafers while being attached to the attachment plate, improving work efficiency and contributing to cost reduction.
[発明の効果]
本発明によれば、作業効率の向上する半導体ウェハーの
乾燥方法を提供することができる。[Effects of the Invention] According to the present invention, it is possible to provide a semiconductor wafer drying method that improves work efficiency.
第1図は本発明の半導体ウェハーの乾燥方法を実現する
一実施例の蒸気乾燥機の説明図である。
1:乾燥槽、
2:貼付プレート、
3:ウェハー、
4=有機溶剤、
5ニヒータ。
第 1 回
5:ヒー7FIG. 1 is an explanatory diagram of an embodiment of a steam dryer that implements the semiconductor wafer drying method of the present invention. 1: Drying tank, 2: Pasting plate, 3: Wafer, 4 = Organic solvent, 5 Niheater. 1st Round 5: Hee 7
Claims (1)
半導体ウェハーの乾燥方法において、複数のウェハーが
貼付されている貼付プレートを有機溶剤を加熱して蒸気
を発生する蒸気槽内に挿入し、該有機溶剤の蒸気により
、前記複数のウェハーを前記貼付プレートに貼付した状
態で乾燥することを特徴とする半導体ウェハーの乾燥方
法。(1) In a semiconductor wafer drying method of drying a mirror-polished and cleaned wafer, a pasting plate with a plurality of wafers pasted is inserted into a steam bath that generates steam by heating an organic solvent; A method for drying semiconductor wafers, comprising drying the plurality of wafers while attached to the attachment plate using vapor of the organic solvent.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25757986A JPS63110730A (en) | 1986-10-29 | 1986-10-29 | Drying method for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25757986A JPS63110730A (en) | 1986-10-29 | 1986-10-29 | Drying method for semiconductor wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63110730A true JPS63110730A (en) | 1988-05-16 |
Family
ID=17308229
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25757986A Pending JPS63110730A (en) | 1986-10-29 | 1986-10-29 | Drying method for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63110730A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04215878A (en) * | 1990-03-14 | 1992-08-06 | Seiko Epson Corp | Submerged jet washing method and apparatus |
JPH04350934A (en) * | 1991-05-28 | 1992-12-04 | Nikko Kyodo Co Ltd | Manufacture of gaas substrate |
WO2008065820A1 (en) * | 2006-11-30 | 2008-06-05 | Tokyo Ohka Kogyo Co., Ltd. | Processing apparatus, processing method, and surface processing jig |
TWI419222B (en) * | 2011-05-05 | 2013-12-11 | Lextar Electronics Corp | Demount processes |
-
1986
- 1986-10-29 JP JP25757986A patent/JPS63110730A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04215878A (en) * | 1990-03-14 | 1992-08-06 | Seiko Epson Corp | Submerged jet washing method and apparatus |
JPH04350934A (en) * | 1991-05-28 | 1992-12-04 | Nikko Kyodo Co Ltd | Manufacture of gaas substrate |
WO2008065820A1 (en) * | 2006-11-30 | 2008-06-05 | Tokyo Ohka Kogyo Co., Ltd. | Processing apparatus, processing method, and surface processing jig |
JP2008140908A (en) * | 2006-11-30 | 2008-06-19 | Tokyo Ohka Kogyo Co Ltd | Treatment device, treatment method, and surface treatment jig |
US9129999B2 (en) | 2006-11-30 | 2015-09-08 | Tokyo Ohka Kogyo Co., Ltd. | Treatment device, treatment method, and surface treatment jig |
TWI419222B (en) * | 2011-05-05 | 2013-12-11 | Lextar Electronics Corp | Demount processes |
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