JPS6296578U - - Google Patents

Info

Publication number
JPS6296578U
JPS6296578U JP18758185U JP18758185U JPS6296578U JP S6296578 U JPS6296578 U JP S6296578U JP 18758185 U JP18758185 U JP 18758185U JP 18758185 U JP18758185 U JP 18758185U JP S6296578 U JPS6296578 U JP S6296578U
Authority
JP
Japan
Prior art keywords
pin
contact probe
board
conductor
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18758185U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0521020Y2 (hr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985187581U priority Critical patent/JPH0521020Y2/ja
Publication of JPS6296578U publication Critical patent/JPS6296578U/ja
Application granted granted Critical
Publication of JPH0521020Y2 publication Critical patent/JPH0521020Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP1985187581U 1985-12-05 1985-12-05 Expired - Lifetime JPH0521020Y2 (hr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985187581U JPH0521020Y2 (hr) 1985-12-05 1985-12-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985187581U JPH0521020Y2 (hr) 1985-12-05 1985-12-05

Publications (2)

Publication Number Publication Date
JPS6296578U true JPS6296578U (hr) 1987-06-19
JPH0521020Y2 JPH0521020Y2 (hr) 1993-05-31

Family

ID=31138170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985187581U Expired - Lifetime JPH0521020Y2 (hr) 1985-12-05 1985-12-05

Country Status (1)

Country Link
JP (1) JPH0521020Y2 (hr)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163952A (ja) * 1988-12-16 1990-06-25 Sanyo Electric Co Ltd 半導体装置の測定装置
WO2003067268A1 (fr) * 2002-02-07 2003-08-14 Yokowo Co., Ltd. Sonde de type a charge capacitive, et montage d'essai utilisant la sonde
JP2004523757A (ja) * 2001-03-13 2004-08-05 スリーエム イノベイティブ プロパティズ カンパニー 高帯域幅プローブアセンブリ
JP2007178163A (ja) * 2005-12-27 2007-07-12 Yokowo Co Ltd 検査ユニットおよびそれに用いる検査プローブ用外皮チューブ組立体
JP2008145238A (ja) * 2006-12-08 2008-06-26 Micronics Japan Co Ltd 電気接続器及びこれを用いた電気的接続装置
JP2008177554A (ja) * 2006-12-21 2008-07-31 Ngk Spark Plug Co Ltd 多層配線基板、及び多層配線基板埋込用の給電構造体
JP2011252766A (ja) * 2010-06-01 2011-12-15 3M Innovative Properties Co 接触子ホルダ
WO2017060946A1 (ja) * 2015-10-05 2017-04-13 ユニテクノ株式会社 検査用基板
WO2020137863A1 (ja) * 2018-12-26 2020-07-02 株式会社日本マイクロニクス 電気的接続装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728379U (hr) * 1980-07-23 1982-02-15
JPS5839574U (ja) * 1981-09-09 1983-03-15 クラリオン株式会社 プリント基板検査用治具
JPS58175273A (ja) * 1982-04-07 1983-10-14 沖電気工業株式会社 同軸型可動接触プロ−ブ
JPS5974364U (ja) * 1982-11-12 1984-05-19 日本電気株式会社 回路基板の導通検査用アダプタ
JPS6082271U (ja) * 1983-11-09 1985-06-07 株式会社アドバンテスト 同軸プロ−ブコンタクト
JPS60160136U (ja) * 1984-04-04 1985-10-24 株式会社　みかど育種農場 植物栽培用被覆材

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE806098A (fr) * 1973-03-28 1974-02-01 Siemens Ag Procede de fabrication de silicium ou autre matiere semi-conductrice tres pure
GB1573154A (en) * 1977-03-01 1980-08-13 Pilkington Brothers Ltd Coating glass

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728379U (hr) * 1980-07-23 1982-02-15
JPS5839574U (ja) * 1981-09-09 1983-03-15 クラリオン株式会社 プリント基板検査用治具
JPS58175273A (ja) * 1982-04-07 1983-10-14 沖電気工業株式会社 同軸型可動接触プロ−ブ
JPS5974364U (ja) * 1982-11-12 1984-05-19 日本電気株式会社 回路基板の導通検査用アダプタ
JPS6082271U (ja) * 1983-11-09 1985-06-07 株式会社アドバンテスト 同軸プロ−ブコンタクト
JPS60160136U (ja) * 1984-04-04 1985-10-24 株式会社　みかど育種農場 植物栽培用被覆材

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02163952A (ja) * 1988-12-16 1990-06-25 Sanyo Electric Co Ltd 半導体装置の測定装置
JP2004523757A (ja) * 2001-03-13 2004-08-05 スリーエム イノベイティブ プロパティズ カンパニー 高帯域幅プローブアセンブリ
WO2003067268A1 (fr) * 2002-02-07 2003-08-14 Yokowo Co., Ltd. Sonde de type a charge capacitive, et montage d'essai utilisant la sonde
US7233156B2 (en) 2002-02-07 2007-06-19 Yokowo Co., Ltd. Capacity load type probe, and test jig using the same
JP2007178163A (ja) * 2005-12-27 2007-07-12 Yokowo Co Ltd 検査ユニットおよびそれに用いる検査プローブ用外皮チューブ組立体
JP2008145238A (ja) * 2006-12-08 2008-06-26 Micronics Japan Co Ltd 電気接続器及びこれを用いた電気的接続装置
JP2008177554A (ja) * 2006-12-21 2008-07-31 Ngk Spark Plug Co Ltd 多層配線基板、及び多層配線基板埋込用の給電構造体
US8911266B2 (en) 2010-06-01 2014-12-16 3M Innovative Properties Company Contact holder
JP2011252766A (ja) * 2010-06-01 2011-12-15 3M Innovative Properties Co 接触子ホルダ
WO2017060946A1 (ja) * 2015-10-05 2017-04-13 ユニテクノ株式会社 検査用基板
WO2020137863A1 (ja) * 2018-12-26 2020-07-02 株式会社日本マイクロニクス 電気的接続装置
JP2020106296A (ja) * 2018-12-26 2020-07-09 株式会社日本マイクロニクス 電気的接続装置
TWI723698B (zh) * 2018-12-26 2021-04-01 日商日本麥克隆尼股份有限公司 電性連接裝置
KR20210095677A (ko) * 2018-12-26 2021-08-02 가부시키가이샤 니혼 마이크로닉스 전기적 접속 장치
CN113260868A (zh) * 2018-12-26 2021-08-13 日本麦可罗尼克斯股份有限公司 电连接装置
US11828773B2 (en) 2018-12-26 2023-11-28 Kabushiki Kaisha Nihon Micronics Electrical connecting device

Also Published As

Publication number Publication date
JPH0521020Y2 (hr) 1993-05-31

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