JPS629356U - - Google Patents

Info

Publication number
JPS629356U
JPS629356U JP10013485U JP10013485U JPS629356U JP S629356 U JPS629356 U JP S629356U JP 10013485 U JP10013485 U JP 10013485U JP 10013485 U JP10013485 U JP 10013485U JP S629356 U JPS629356 U JP S629356U
Authority
JP
Japan
Prior art keywords
voltage
divided
ion source
sweep
quadrupole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10013485U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0341403Y2 (bg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985100134U priority Critical patent/JPH0341403Y2/ja
Publication of JPS629356U publication Critical patent/JPS629356U/ja
Application granted granted Critical
Publication of JPH0341403Y2 publication Critical patent/JPH0341403Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP1985100134U 1985-07-02 1985-07-02 Expired JPH0341403Y2 (bg)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985100134U JPH0341403Y2 (bg) 1985-07-02 1985-07-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985100134U JPH0341403Y2 (bg) 1985-07-02 1985-07-02

Publications (2)

Publication Number Publication Date
JPS629356U true JPS629356U (bg) 1987-01-20
JPH0341403Y2 JPH0341403Y2 (bg) 1991-08-30

Family

ID=30969666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985100134U Expired JPH0341403Y2 (bg) 1985-07-02 1985-07-02

Country Status (1)

Country Link
JP (1) JPH0341403Y2 (bg)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07230786A (ja) * 1994-02-17 1995-08-29 Shimadzu Corp 元素分析装置
JPH097541A (ja) * 1995-06-21 1997-01-10 Yokogawa Analytical Syst Kk 質量分析装置におけるレンズパラメータの最適化方法及び最適化装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50122985A (bg) * 1974-03-11 1975-09-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50122985A (bg) * 1974-03-11 1975-09-26

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07230786A (ja) * 1994-02-17 1995-08-29 Shimadzu Corp 元素分析装置
JPH097541A (ja) * 1995-06-21 1997-01-10 Yokogawa Analytical Syst Kk 質量分析装置におけるレンズパラメータの最適化方法及び最適化装置

Also Published As

Publication number Publication date
JPH0341403Y2 (bg) 1991-08-30

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