JPS6290948A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS6290948A
JPS6290948A JP60134900A JP13490085A JPS6290948A JP S6290948 A JPS6290948 A JP S6290948A JP 60134900 A JP60134900 A JP 60134900A JP 13490085 A JP13490085 A JP 13490085A JP S6290948 A JPS6290948 A JP S6290948A
Authority
JP
Japan
Prior art keywords
region
type
transistor
type mos
buffer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60134900A
Other languages
Japanese (ja)
Inventor
Masahiro Ueda
昌弘 植田
Takahiko Arakawa
荒川 隆彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP60134900A priority Critical patent/JPS6290948A/en
Publication of JPS6290948A publication Critical patent/JPS6290948A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118Masterslice integrated circuits
    • H01L27/11803Masterslice integrated circuits using field effect technology
    • H01L27/11807CMOS gate arrays

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To effectively utilize an inner gate region by removing a buffer region formed heretofore, enlarging the inner gate region, composing to alternately disposing P-type and N-type MOS transistor rows, and constructing a buffer circuit of the transistor arrays for the inner gate, thereby omitting the waste in the buffer region. CONSTITUTION:A semiconductor integrated circuit device has a transistor array region (inner gate substrate) 1 and a pad region 3 only. The array region 1 is alternately arranged with the rows of P-type, N-type MOS transistors. P-type and N-type MOS transistor regions 15, 16 are formed of 2 MOS transistors in such a manner that the sources or the drains of two transistors are composite. Terminals 18, 19 are connected with a power source VDD and a ground point. When P-type MOS transistors T1-T6, N-type MOS transistors T7-T12 are wired suitably in parallel, an output buffer is formed. Similarly, an input buffer is composed by the transistors of the region 1.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、論理ゲートを構成するためのトランジスタ
をアレイ状に配したマスク・スライス方式の相補MOS
(0MOS)形集積回路装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a mask-sliced complementary MOS in which transistors are arranged in an array to form a logic gate.
(0MOS) type integrated circuit device.

〔従来の技術〕[Conventional technology]

短期間に多くの品種の論理集積回路装置を実現する方法
として、マスク・スライス方式の製造方法によるゲート
・アレイが知られている0マスク・スライス方式とは、
マスタ工程であらかじめ各品種共通のトランジスタを形
成しておき、スライス工程でトランジスタ間に品種毎の
所要の結線を施して所望の論理集積回路装置を実現する
ものであるO 第2図(a)は、従来から公知のCMOS形ゲート・ア
レイのチップ構成例を示す図である。第2図(a)にお
いて、(1)は論理回路を構成するための内部ゲート領
域、(2)は半導体チップ内部と外部との整合を取るた
めのバッファ領域、(3)はこの半導体チップを塔載す
るパッケージ(図示せず)との接続用のパッドである。
The 0-mask slicing method is known as a method for realizing many types of logic integrated circuit devices in a short period of time by manufacturing gate arrays using the mask slicing method.
In the mastering process, transistors common to each type are formed in advance, and in the slicing process, the required connections for each type of transistor are made between the transistors to realize the desired logic integrated circuit device. , is a diagram showing an example of a chip configuration of a conventionally known CMOS type gate array. In FIG. 2(a), (1) is an internal gate area for configuring a logic circuit, (2) is a buffer area for matching the inside and outside of the semiconductor chip, and (3) is an internal gate area for configuring this semiconductor chip. This is a pad for connection to a mounted package (not shown).

内部ゲート領域(1)は、第2図(b)に示すV口<C
MOSゲートを構成するための複数列のトランジスタ列
(IQ及びトランジスタ列a0相互間の結線をするため
の配線領域α])!こよって構成される。
The internal gate region (1) has V<C as shown in FIG. 2(b).
Multiple transistor rows for configuring MOS gates (wiring area α for interconnection between IQ and transistor rows a0])! It is composed of this.

トランジスタ列αQ相互間の結線には、第1#配線@、
第2層配線(至)及び第1.第2層配線連絡用のスルー
ホールα4か用いられる。ゲート・アレイでは、所定の
広さの配線領域に対して許容される配線本数かあらかじ
め決められるので、複雑な論理を構成する場合でも配線
できるように広く設定されて2す、これは、物理的に固
定されている。従って、簡単な配線で可能な論理構成の
場合、使用されない広い配線領域(ロ)は全(無駄でめ
った。また、トランジスタ列QQで構成される論理ゲー
トをできる限り多く作るためには、トランジスタ列αQ
を多く設ける必要かある。このように配線領域の無駄を
省き、多くのトランジスタ列αqを構成するために、第
2図(c)に示すように内部ゲート領域(1)を全面ト
ランジスタ列(10とし、任意のトランジスタ列Of)
’Y配線領域として使用するトランジスタアレイ方式が
4u−[されている(例えば1982年VLSIシンポ
ジウム[116−17)。この方式によれば、少ない配
線の場合は少しのトランジスタ列00を、多くの配線を
必要とする場合は多くのトランジスタ列QQを配線領域
として刷り当てれば良く、配線領域を固定することなく
、論理構成によって自由に変えられるので、簡単な配線
の調理回路であれは非常に多(の論理ゲートを構成する
ことが可能と である。第2図(b)へ同じ構成に適用した場合を例示
すると、第2図(c)のように、配線の長さも短くなり
、な2かつ、同じff1li積により多くの論理回路を
塔載することが可能となっている。
The first # wiring @,
2nd layer wiring (to) and 1st layer wiring. A through hole α4 for connecting the second layer wiring is used. In gate arrays, the number of wires permissible for a given wiring area is determined in advance, so the number of wires allowed in a gate array is set wide enough to allow wiring even when configuring complex logic2. Fixed. Therefore, in the case of a logic configuration that is possible with simple wiring, the large unused wiring area (b) is completely wasted (wasteful and rare. Also, in order to create as many logic gates as possible consisting of transistor arrays αQ
Is it necessary to provide a large number of In order to avoid wasting the wiring area and configure many transistor rows αq, as shown in FIG. )
'The transistor array method used as the Y wiring area has been described in 4u-[ (for example, 1982 VLSI Symposium [116-17)]. According to this method, when a small number of wirings are needed, a small number of transistor rows 00 are printed, and when a large number of wirings are required, many transistor rows QQ are printed as a wiring area, and the wiring area is not fixed and the logic Since it can be changed freely depending on the configuration, it is possible to configure a very large number of logic gates in a cooking circuit with simple wiring. Figure 2 (b) shows an example of the case where the same configuration is applied. , as shown in FIG. 2(c), the length of the wiring is shortened, and moreover, it is possible to mount more logic circuits with the same ff1li product.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、従来のゲートアレイ、トランジスタ。 However, traditional gate arrays, transistors.

アレイにおいては、第2図(a)に示すように必す内部
ゲート領域以外に物理的に固定されたバッファ領域を持
っているので1例えは、 200個の入力および出力バ
ッファを用意していて、スライス工程で20個の入力及
び出カバソファしか使用しなかったとすると、残り18
0個のバッファの領域は無駄になっていた。
As shown in Figure 2(a), the array has a physically fixed buffer area in addition to the necessary internal gate area, so for example, 200 input and output buffers are prepared. , if only 20 input and output sofas were used in the slicing process, the remaining 18
Space in 0 buffers was wasted.

本発明は、このようなバッファ領域での無駄を省き、半
導体チップ内の内部ゲート領域を有効に利用できるアレ
イ構成の半導体集積回路装置を得ることを目的としてい
る。
It is an object of the present invention to provide a semiconductor integrated circuit device having an array configuration that can eliminate such waste in the buffer area and effectively utilize the internal gate area within the semiconductor chip.

〔問題点を解決するための手段〕[Means for solving problems]

本発明によるトランジスタ・アレイは、第1図(a)に
示すように、従未設けられていたバッファ領域を取り除
き、内部ゲート領域(1)を拡大するとともにp形MO
Sトランジスタ列とn形MOSI−ランジスタ列との交
互配置で構成し、バッファ回路を内部ゲート用のトラン
ジスタ列で構成できるようにしたものである。
The transistor array according to the present invention, as shown in FIG.
It is constructed by alternately arranging S-transistor rows and n-type MOSI-transistor rows, so that the buffer circuit can be constructed from transistor rows for internal gates.

〔作 用〕[For production]

本発明によるトランジスタ・アレイの入力及び出力バッ
ファは、内部ゲート領域のトランジスタ列により構成さ
れるので、従来のトランジスタ・プレイで必要であった
バッファ領域を内部ゲート領域に置換でき、使用するバ
ッファの数が少ない場合は、従来に較べて内部ゲートか
多く構成できる0 〔発明の実施例〕 第1図(a)はこの発明の一実施例の全体構成を示す概
略図で、トランジスタのアレイ領域(内部ゲートd域)
(1)とバッド領域(3)とのみ本7成っている。
Since the input and output buffers of the transistor array according to the present invention are constituted by transistor rows in the internal gate area, the buffer area required in the conventional transistor play can be replaced with the internal gate area, and the number of buffers used can be reduced. [Embodiment of the Invention] FIG. 1(a) is a schematic diagram showing the overall configuration of an embodiment of the present invention. gate d area)
The book 7 consists only of (1) and bad area (3).

そして、プレイ領域(1)は第1図(b)以下で示すよ
うにp形MOSトランジスタの列’%n形MOS?ラン
ジスタの列とが交互に配列されている。
The play area (1) is a row of p-type MOS transistors as shown in FIG. 1(b) and below. Rows of transistors are arranged alternately.

次に、このプレイ領域(1)のMOSトランジスタ列で
バッファを構成する場合につぃ゛C説明する。
Next, the case where a buffer is formed by the MOS transistor array in this play area (1) will be explained in detail.

第1図(b)は出力バッ7アの構成を示すパターン−に
)はp形MOSトランジスタ領域、σ・はn形1viO
8トランジスタ領域、α加tMOSl−ランジスタのゲ
ート、明はp形MOSトランジスタの基板取出し口、α
gはn 形MOSトランジスタの基板取出し口である。
In FIG. 1(b), a pattern showing the configuration of the output buffer 7) is a p-type MOS transistor region, and σ is an n-type 1viO
8 transistor area, α + tMOSl-transistor gate, light is substrate outlet of p-type MOS transistor, α
g is the substrate outlet of the n-type MOS transistor.

MOSトランジスタ領域(へ)及びα呻はそれぞれ2つ
のMOSトランジスタからなり、2つのトランジスタの
ソースまたはドレインが複合された形になってぃる。端
子四及び119はそれぞれ電源VDD及び接地点に接続
されているO p形MOSトランジスタT1〜T6、n形MOSトラン
ジスタT7〜TI2を第1図(b)に示すようにそれぞ
れ適宜並列に結線すれば、第1図(c)に等価回路を示
す出カバソファを構成できることは容易に理解できるで
あろう。
The MOS transistor region and α region each consist of two MOS transistors, and are in the form of a composite of the sources or drains of the two transistors. Terminals 4 and 119 are connected to the power supply VDD and the ground point, respectively.P-type MOS transistors T1 to T6 and n-type MOS transistors T7 to TI2 are connected in parallel as appropriate as shown in FIG. 1(b). , it is easy to understand that it is possible to construct an output sofa whose equivalent circuit is shown in FIG. 1(c).

第1図(d)は人力バッファの構成例を示すノくターン
図、第1図(e)はその等価回路図で、第1図(d)左
端のp形MO3)279222個及びn形MOS)27
9222個のゲート電極層を入力保護抵抗Rとして用い
、その次のp形及びn形MOSトランジスタのソース・
トVイ/と基板との接合をそれぞれダイオードD、及び
島として用いており、右端から3個のp形MOSトラン
ジスタは遊ばせてl、)る。
Fig. 1(d) is a cross-sectional diagram showing an example of the configuration of a manual buffer, and Fig. 1(e) is its equivalent circuit diagram. )27
The 9222 gate electrode layers are used as input protection resistors R, and the sources and
The junction between V and the substrate is used as a diode D and an island, respectively, and the three p-type MOS transistors from the right end are left open.

このようにして、入力及び出カッ(ツファがアレイ領域
(1)のトランジスタを用いて自由に構成できる0 〔発明の効果〕 以上のように本発明によれば、従来ゲートアレイ、トラ
ンジスタアレイで専用の領域として設けたバッファ領域
を取り除き、バッファ回路を内部ゲート領域に存在する
トランジスタを用いて構成したので、同一チップ面積で
あれは、従来より多くの内部ゲートか構成できる効果が
ある0
In this way, the input and output signals can be freely configured using the transistors in the array area (1). [Effects of the Invention] As described above, according to the present invention, the Since the buffer area provided as the area was removed and the buffer circuit was configured using transistors existing in the internal gate area, it is possible to configure more internal gates than before with the same chip area.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)は本発明の一実施例の全体構成を示す概略
図、第1図(b)はこの実施例のトランジスタアレイ領
域のMOSトランジスタ列で構成した出カバソファの例
を示すパターン図、第1図(C)はその等価回路図、第
1図(d)は同じく入力バッファの構成例を示すパター
ン図、第1図(b)はその等価回路図、第2図(a)は
従来のゲートアレイのチップ構成図。 第2図(b)はその内部ケート領域に配線領域を設けた
例を示す構成図、第2図(c)は配線領域を設けない内
部ゲート領域の例を示す構成図である。 図において、(1)はトランジスタのアレイ領域、(3
)はパッド領域、に)はp形MOSトランジスタ領域、
α呻はn形MOS)う/ジスタ領域、αηはゲート電極
、Rは入力保護用抵抗である。 なお、図中同一符号は同一、または相当部分を示す。
FIG. 1(a) is a schematic diagram showing the overall configuration of an embodiment of the present invention, and FIG. 1(b) is a pattern diagram showing an example of an output sofa constructed of MOS transistor arrays in the transistor array region of this embodiment. , FIG. 1(C) is its equivalent circuit diagram, FIG. 1(d) is a pattern diagram showing a configuration example of the input buffer, FIG. 1(b) is its equivalent circuit diagram, and FIG. 2(a) is its equivalent circuit diagram. A chip configuration diagram of a conventional gate array. FIG. 2(b) is a configuration diagram showing an example in which a wiring area is provided in the internal gate area, and FIG. 2(c) is a configuration diagram showing an example of an internal gate area in which no wiring area is provided. In the figure, (1) is the transistor array area, (3
) is a pad region, 2) is a p-type MOS transistor region,
α is an n-type MOS transistor region, αη is a gate electrode, and R is an input protection resistor. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (3)

【特許請求の範囲】[Claims] (1)p形MOSトランジスタを一列に並べて形成した
p形MOSトランジスタ列と、n形MOSトランジスタ
を一列に並べて形成したn形MOSトランジスタ列とを
交互に複数列配設したトランジスタのアレイ領域と、パ
ツケージへの接続のためのパット領域とのみを備え、上
記アレイ領域の内部に構成される論理ゲートと外部回路
との間の整合のための入力または出力バッファを上記ア
レイ領域のMOSトランジスタで構成するようにしたこ
とを特徴とする半導体集積回路装置。
(1) a transistor array region in which a plurality of p-type MOS transistor rows formed by arranging p-type MOS transistors in a row and n-type MOS transistor rows formed by arranging n-type MOS transistors in a row are alternately arranged; a pad area for connection to a package, and an input or output buffer for matching between a logic gate configured inside the array area and an external circuit is configured by a MOS transistor in the array area. A semiconductor integrated circuit device characterized by:
(2)出力バッファは必要に応じて複数のMOSトラン
ジスタを並列に接続して構成するようにしたことを特徴
とする特許請求の範囲第1項記載の半導体集積回路装置
(2) The semiconductor integrated circuit device according to claim 1, wherein the output buffer is constructed by connecting a plurality of MOS transistors in parallel as necessary.
(3)入力バッファの入力保護用抵抗をp形及びn形M
OSトランジスタのゲート電極層を用いるようにしたこ
とを特徴とする特許請求の範囲第1項または第2項記載
の半導体集積回路装置。
(3) Set the input protection resistance of the input buffer to p-type and n-type M.
3. The semiconductor integrated circuit device according to claim 1, wherein a gate electrode layer of an OS transistor is used.
JP60134900A 1985-06-20 1985-06-20 Semiconductor integrated circuit device Pending JPS6290948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60134900A JPS6290948A (en) 1985-06-20 1985-06-20 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60134900A JPS6290948A (en) 1985-06-20 1985-06-20 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6290948A true JPS6290948A (en) 1987-04-25

Family

ID=15139144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60134900A Pending JPS6290948A (en) 1985-06-20 1985-06-20 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6290948A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63177440A (en) * 1987-01-16 1988-07-21 Nec Corp Semiconductor integrated circuit
JPS6490549A (en) * 1987-10-01 1989-04-07 Seiko Epson Corp Wiring method for metallic oxide film semiconductor type high breakdown-voltage driver
JPH01220859A (en) * 1988-02-29 1989-09-04 Nec Corp Semiconductor integrated circuit
US4992845A (en) * 1988-12-02 1991-02-12 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device having input/output buffer cells each comprising a plurality of transistor regions arranged in a single line
JPH06151704A (en) * 1992-11-11 1994-05-31 Mitsubishi Electric Corp Semiconductor device and configuration-wiring device
JP2007215205A (en) * 2007-03-08 2007-08-23 Renesas Technology Corp Semiconductor integrated circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63177440A (en) * 1987-01-16 1988-07-21 Nec Corp Semiconductor integrated circuit
JPS6490549A (en) * 1987-10-01 1989-04-07 Seiko Epson Corp Wiring method for metallic oxide film semiconductor type high breakdown-voltage driver
JPH01220859A (en) * 1988-02-29 1989-09-04 Nec Corp Semiconductor integrated circuit
US4992845A (en) * 1988-12-02 1991-02-12 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit device having input/output buffer cells each comprising a plurality of transistor regions arranged in a single line
JPH06151704A (en) * 1992-11-11 1994-05-31 Mitsubishi Electric Corp Semiconductor device and configuration-wiring device
JP2007215205A (en) * 2007-03-08 2007-08-23 Renesas Technology Corp Semiconductor integrated circuit

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