JPS62876A - 半導体集積回路用試験装置 - Google Patents

半導体集積回路用試験装置

Info

Publication number
JPS62876A
JPS62876A JP60140767A JP14076785A JPS62876A JP S62876 A JPS62876 A JP S62876A JP 60140767 A JP60140767 A JP 60140767A JP 14076785 A JP14076785 A JP 14076785A JP S62876 A JPS62876 A JP S62876A
Authority
JP
Japan
Prior art keywords
semiconductor integrated
integrated circuit
switch means
signal line
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60140767A
Other languages
English (en)
Japanese (ja)
Other versions
JPH054034B2 (enrdf_load_html_response
Inventor
Yoshinari Inoue
井上　義成
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP60140767A priority Critical patent/JPS62876A/ja
Publication of JPS62876A publication Critical patent/JPS62876A/ja
Publication of JPH054034B2 publication Critical patent/JPH054034B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP60140767A 1985-06-27 1985-06-27 半導体集積回路用試験装置 Granted JPS62876A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60140767A JPS62876A (ja) 1985-06-27 1985-06-27 半導体集積回路用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60140767A JPS62876A (ja) 1985-06-27 1985-06-27 半導体集積回路用試験装置

Publications (2)

Publication Number Publication Date
JPS62876A true JPS62876A (ja) 1987-01-06
JPH054034B2 JPH054034B2 (enrdf_load_html_response) 1993-01-19

Family

ID=15276270

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60140767A Granted JPS62876A (ja) 1985-06-27 1985-06-27 半導体集積回路用試験装置

Country Status (1)

Country Link
JP (1) JPS62876A (enrdf_load_html_response)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098282A (enrdf_load_html_response) * 1973-12-26 1975-08-05
JPS5694965U (enrdf_load_html_response) * 1979-12-21 1981-07-28

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098282A (enrdf_load_html_response) * 1973-12-26 1975-08-05
JPS5694965U (enrdf_load_html_response) * 1979-12-21 1981-07-28

Also Published As

Publication number Publication date
JPH054034B2 (enrdf_load_html_response) 1993-01-19

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