JPS6280655A - フオトマスクブランクおよびフオトマスク - Google Patents
フオトマスクブランクおよびフオトマスクInfo
- Publication number
- JPS6280655A JPS6280655A JP60221225A JP22122585A JPS6280655A JP S6280655 A JPS6280655 A JP S6280655A JP 60221225 A JP60221225 A JP 60221225A JP 22122585 A JP22122585 A JP 22122585A JP S6280655 A JPS6280655 A JP S6280655A
- Authority
- JP
- Japan
- Prior art keywords
- light
- photomask
- thin film
- film
- transparent conductive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
- 
        - G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
 
- 
        - G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/40—Electrostatic discharge [ESD] related features, e.g. antistatic coatings or a conductive metal layer around the periphery of the mask substrate
 
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP60221225A JPS6280655A (ja) | 1985-10-04 | 1985-10-04 | フオトマスクブランクおよびフオトマスク | 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP60221225A JPS6280655A (ja) | 1985-10-04 | 1985-10-04 | フオトマスクブランクおよびフオトマスク | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| JPS6280655A true JPS6280655A (ja) | 1987-04-14 | 
| JPH0414339B2 JPH0414339B2 (OSRAM) | 1992-03-12 | 
Family
ID=16763427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP60221225A Granted JPS6280655A (ja) | 1985-10-04 | 1985-10-04 | フオトマスクブランクおよびフオトマスク | 
Country Status (1)
| Country | Link | 
|---|---|
| JP (1) | JPS6280655A (OSRAM) | 
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS63299124A (ja) * | 1987-05-29 | 1988-12-06 | Hitachi Ltd | X線露光マスクのパターン検査方法 | 
| JPH032756A (ja) * | 1989-05-30 | 1991-01-09 | Hoya Corp | フォトマスクブランク及びフォトマスク | 
| KR20130027440A (ko) * | 2011-09-07 | 2013-03-15 | 호야 가부시키가이샤 | 마스크 블랭크, 전사용 마스크, 및 반도체 디바이스의 제조 방법 | 
| JP2015114356A (ja) * | 2013-12-09 | 2015-06-22 | Hoya株式会社 | 機能膜付き基板の製造方法、多層膜付き基板の製造方法、マスクブランクの製造方法、及び転写用マスクの製造方法 | 
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS55161240A (en) * | 1979-06-04 | 1980-12-15 | Dainippon Printing Co Ltd | Photomask | 
| JPS57205342A (en) * | 1981-06-15 | 1982-12-16 | Seiko Epson Corp | Glass photomask | 
- 
        1985
        - 1985-10-04 JP JP60221225A patent/JPS6280655A/ja active Granted
 
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS55161240A (en) * | 1979-06-04 | 1980-12-15 | Dainippon Printing Co Ltd | Photomask | 
| JPS57205342A (en) * | 1981-06-15 | 1982-12-16 | Seiko Epson Corp | Glass photomask | 
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS63299124A (ja) * | 1987-05-29 | 1988-12-06 | Hitachi Ltd | X線露光マスクのパターン検査方法 | 
| JPH032756A (ja) * | 1989-05-30 | 1991-01-09 | Hoya Corp | フォトマスクブランク及びフォトマスク | 
| KR20130027440A (ko) * | 2011-09-07 | 2013-03-15 | 호야 가부시키가이샤 | 마스크 블랭크, 전사용 마스크, 및 반도체 디바이스의 제조 방법 | 
| JP2013068934A (ja) * | 2011-09-07 | 2013-04-18 | Hoya Corp | マスクブランク、転写用マスク、および半導体デバイスの製造方法 | 
| JP2015114356A (ja) * | 2013-12-09 | 2015-06-22 | Hoya株式会社 | 機能膜付き基板の製造方法、多層膜付き基板の製造方法、マスクブランクの製造方法、及び転写用マスクの製造方法 | 
Also Published As
| Publication number | Publication date | 
|---|---|
| JPH0414339B2 (OSRAM) | 1992-03-12 | 
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Legal Events
| Date | Code | Title | Description | 
|---|---|---|---|
| EXPY | Cancellation because of completion of term |