JPS6271864U - - Google Patents

Info

Publication number
JPS6271864U
JPS6271864U JP16391685U JP16391685U JPS6271864U JP S6271864 U JPS6271864 U JP S6271864U JP 16391685 U JP16391685 U JP 16391685U JP 16391685 U JP16391685 U JP 16391685U JP S6271864 U JPS6271864 U JP S6271864U
Authority
JP
Japan
Prior art keywords
analysis
point
analysis point
sample
display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16391685U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16391685U priority Critical patent/JPS6271864U/ja
Publication of JPS6271864U publication Critical patent/JPS6271864U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP16391685U 1985-10-25 1985-10-25 Pending JPS6271864U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16391685U JPS6271864U (OSRAM) 1985-10-25 1985-10-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16391685U JPS6271864U (OSRAM) 1985-10-25 1985-10-25

Publications (1)

Publication Number Publication Date
JPS6271864U true JPS6271864U (OSRAM) 1987-05-08

Family

ID=31092556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16391685U Pending JPS6271864U (OSRAM) 1985-10-25 1985-10-25

Country Status (1)

Country Link
JP (1) JPS6271864U (OSRAM)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318054A (ja) * 1987-06-19 1988-12-26 Shimadzu Corp Ｅｐｍａの測定デ−タ表示方法
JPH0334249A (ja) * 1989-06-29 1991-02-14 Shimadzu Corp 電子線マイクロアナライザー
JP2020087513A (ja) * 2018-11-15 2020-06-04 日本電子株式会社 走査電子顕微鏡および画像処理方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5111953A (ja) * 1974-07-19 1976-01-30 Toyo Boseki Netsukasoseigoseisenino karyorikenshukukakoho
JPS59171000A (ja) * 1983-03-17 1984-09-27 富士フアコム制御株式会社 Ｃｒｔトレンド画面のデジタル値変換方式

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5111953A (ja) * 1974-07-19 1976-01-30 Toyo Boseki Netsukasoseigoseisenino karyorikenshukukakoho
JPS59171000A (ja) * 1983-03-17 1984-09-27 富士フアコム制御株式会社 Ｃｒｔトレンド画面のデジタル値変換方式

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63318054A (ja) * 1987-06-19 1988-12-26 Shimadzu Corp Ｅｐｍａの測定デ−タ表示方法
JPH0334249A (ja) * 1989-06-29 1991-02-14 Shimadzu Corp 電子線マイクロアナライザー
JP2020087513A (ja) * 2018-11-15 2020-06-04 日本電子株式会社 走査電子顕微鏡および画像処理方法

Similar Documents

Publication Publication Date Title
US4653109A (en) Image analysis system and method
JPS6435838A (en) Charged particle beam device
KR970071235A (ko) 기록 재료의 편집 방법 및 편집 제어 장치
JP4342016B2 (ja) 画像表示装置
JPS6271864U (OSRAM)
JPS63318054A (ja) Ｅｐｍａの測定デ−タ表示方法
EP0213202A1 (en) Apparatus for displaying a scanning schedule in a computer tomographic apparatus
JP2787924B2 (ja) 電子線マイクロアナライザー
JPH0667838A (ja) 表示処理装置
JP3571542B2 (ja) 自動パターン分析方法
JP2888599B2 (ja) 顕微鏡の表示装置
GB2066953A (en) Route indicating apparatus
JPS63318055A (ja) Ｅｐｍａの測定デ−タ表示方法
JP3516028B2 (ja) 蛍光ｘ線分析方法および装置
EP0281695A1 (en) Image analysis system and method
JP2870891B2 (ja) Ｘ線マイクロアナライザ
JPS6288907U (OSRAM)
JPH1172450A (ja) 蛍光ｘ線分析方法および装置
JPH01319241A (ja) 分析スペクトルの表示方式
JPS6363434A (ja) Ｘ線ｃｔ装置
JPS6162849A (ja) 自動多機能分析装置の濃度線分析方式
JPH0785064B2 (ja) 元素濃度分布測定方法
JPH0644353A (ja) 画像表示装置
JP2751367B2 (ja) 表面分析装置
JPH11160362A (ja) 波形表示装置