JPS6268231U - - Google Patents

Info

Publication number
JPS6268231U
JPS6268231U JP1985159407U JP15940785U JPS6268231U JP S6268231 U JPS6268231 U JP S6268231U JP 1985159407 U JP1985159407 U JP 1985159407U JP 15940785 U JP15940785 U JP 15940785U JP S6268231 U JPS6268231 U JP S6268231U
Authority
JP
Japan
Prior art keywords
polysilicon
opening
semiconductor device
check terminal
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1985159407U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985159407U priority Critical patent/JPS6268231U/ja
Publication of JPS6268231U publication Critical patent/JPS6268231U/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/0212Auxiliary members for bonding areas, e.g. spacers
    • H01L2224/02122Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
    • H01L2224/02163Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
    • H01L2224/02165Reinforcing structures
    • H01L2224/02166Collar structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図a,bは本考案の一実施例を示す平面図
、断面図、第2図a,bは従来構造図である。 1,5……金属、2,7……絶縁酸化膜、3,
6……開口、4……ポリシリコン。
FIGS. 1A and 1B are a plan view and a sectional view showing an embodiment of the present invention, and FIGS. 2A and 2B are conventional structural views. 1,5...Metal, 2,7...Insulating oxide film, 3,
6...Opening, 4...Polysilicon.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] チエツク端子を有する半導体装置において、前
記チエツク端子はポリシリコンで構成され、さら
に、前記ポリシリコンと外部金属を接続する為の
第1の開口と前記集積回路の内部金属と前記ポリ
シリコンと接続する為の第2の開口を有すること
を特徴とする半導体装置。
In a semiconductor device having a check terminal, the check terminal is made of polysilicon, and further includes a first opening for connecting the polysilicon to an external metal, and a first opening for connecting the internal metal of the integrated circuit to the polysilicon. A semiconductor device characterized by having a second opening.
JP1985159407U 1985-10-17 1985-10-17 Pending JPS6268231U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985159407U JPS6268231U (en) 1985-10-17 1985-10-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985159407U JPS6268231U (en) 1985-10-17 1985-10-17

Publications (1)

Publication Number Publication Date
JPS6268231U true JPS6268231U (en) 1987-04-28

Family

ID=31083806

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985159407U Pending JPS6268231U (en) 1985-10-17 1985-10-17

Country Status (1)

Country Link
JP (1) JPS6268231U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5758790A (en) * 1980-09-26 1982-04-08 Yoshikazu Hamamoto Compound shutter for building
JPS5789239A (en) * 1980-11-26 1982-06-03 Seiko Epson Corp Semiconductor integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5758790A (en) * 1980-09-26 1982-04-08 Yoshikazu Hamamoto Compound shutter for building
JPS5789239A (en) * 1980-11-26 1982-06-03 Seiko Epson Corp Semiconductor integrated circuit

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