JPS6256665B2 - - Google Patents

Info

Publication number
JPS6256665B2
JPS6256665B2 JP1451583A JP1451583A JPS6256665B2 JP S6256665 B2 JPS6256665 B2 JP S6256665B2 JP 1451583 A JP1451583 A JP 1451583A JP 1451583 A JP1451583 A JP 1451583A JP S6256665 B2 JPS6256665 B2 JP S6256665B2
Authority
JP
Japan
Prior art keywords
brazing
lead frame
brazing material
lead
solder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1451583A
Other languages
Japanese (ja)
Other versions
JPS59141256A (en
Inventor
Tetsuo Myoshi
Masao Sekihashi
Yoshuki Oosawa
Masakatsu Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1451583A priority Critical patent/JPS59141256A/en
Publication of JPS59141256A publication Critical patent/JPS59141256A/en
Publication of JPS6256665B2 publication Critical patent/JPS6256665B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4846Leads on or in insulating or insulated substrates, e.g. metallisation
    • H01L21/4853Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3405Edge mounted components, e.g. terminals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明はセラミツク基板等にリードフレームを
ろう付接続するための方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a method for brazing a lead frame to a ceramic substrate or the like.

〔従来技術〕[Prior art]

従来技術によるリードフレームの一例を第1図
に示す。リードフレーム1はつなぎ部材2によつ
て連結され、その相互間隔(ピツチ)を一定に保
たれている。セラミツク基板3には、リードフレ
ームと同一ピツチでろう付用端子4がその端辺に
設けられている。今、この両者をろう付により接
続するには、リボン状、あるいはワイヤ状のろう
材5をリードフレーム1とセラミツク基板3の端
子4との間にはさみ込み、これら相互間が動かな
いように、側面図第2図の矢印6で示すように加
圧力を加えながら、ろう付温度まで温度をあげ
て、ろう材5を融かすことによつて、リードフレ
ーム1とセラミツク基板の端子4の間にぬれ拡が
らせ、この両者の間をろう接する。ろう接用のろ
う材としては、例えば、銀ろう、あるいは鉛−錫
はんだ、金−錫はんだなどが使用され、それぞ
れ、ろう接温度としては、700〜800℃,200〜300
℃,300〜400℃の範囲の温度が使用される。リー
ドフレーム1と、セラミツク基板3、ろう材5を
相互に位置あわせし保持するために、適正に設計
された保持治具を使用する必要があり銀ろう付け
の場合、カーボン(黒鉛)固体により製作される
ことが多い。
An example of a lead frame according to the prior art is shown in FIG. The lead frames 1 are connected by connecting members 2, and their mutual spacing (pitch) is kept constant. Brazing terminals 4 are provided on the edge of the ceramic substrate 3 at the same pitch as the lead frame. Now, in order to connect these two by brazing, a ribbon-shaped or wire-shaped brazing material 5 is inserted between the lead frame 1 and the terminal 4 of the ceramic substrate 3, so that they do not move. By increasing the temperature to the brazing temperature while applying pressure as shown by the arrow 6 in the side view of FIG. Wet and spread and solder the two. As the brazing material for soldering, for example, silver solder, lead-tin solder, gold-tin solder, etc. are used, and the soldering temperatures are 700-800℃ and 200-300℃, respectively.
℃, temperatures in the range 300-400℃ are used. In order to align and hold the lead frame 1, ceramic substrate 3, and brazing material 5 with each other, it is necessary to use an appropriately designed holding jig.In the case of silver brazing, it is necessary to use a holding jig made of solid carbon (graphite). It is often done.

このようにしてろう接された後の外観及びその
側面図を第3図、第4図に示す。中央部の端子7
では良好な接続が得られるが、両端部でか端子8
と端子9の間、あるいは端子10と端子11の間
で図のようにロウ材のブリツジによるシヨートが
発生してしまうことが多い。これは、第1図に示
すように、ろう材のリボンあるいはワイヤ5の両
端部12,13がとけて、第3図に示す端子8,
11に過剰にたまるためである。ろう材5の長さ
を短かくすることによつてこのような不良はある
程度防ぐことができるが、そうすると、ろう材5
が左右に動いた時リードフレーム1からはずれ易
くなり、結果としてろう接不良が発生してしまう
問題がある。
The external appearance and side view after soldering in this manner are shown in FIGS. 3 and 4. Terminal 7 in the center
A good connection can be obtained with the terminal 8 at both ends.
As shown in the figure, shoots often occur between the terminals 9 and 9 or between the terminals 10 and 11 due to bridging of the brazing material. As shown in FIG. 1, both ends 12 and 13 of the brazing material ribbon or wire 5 are melted, and the terminals 8 and 13 shown in FIG.
This is because an excessive amount accumulates in 11. Such defects can be prevented to some extent by shortening the length of the brazing filler metal 5, but in this case, the length of the brazing filler metal 5
When the lead frame moves from side to side, it tends to come off from the lead frame 1, resulting in a problem of poor soldering.

〔発明の目的〕[Purpose of the invention]

本発明の目的は以上説明した従来技術の問題点
を解決するため、ろう材の左右方向への位置きめ
が容易な程度の長さのろう材を使用してもセラミ
ツク基板の端部において、余剰ろう材によるブリ
ツジ(シヨート)の発生を防止できるようなリー
ドフレームのろう接方法を提供することにある。
An object of the present invention is to solve the problems of the prior art as explained above, and to solve the problems of the prior art described above. It is an object of the present invention to provide a lead frame brazing method that can prevent the occurrence of bridges (shoots) caused by the brazing material.

〔発明の概要〕[Summary of the invention]

本発明は、リード列の両外側に余剰ろう材を吸
収するダミーリードを設け、ここに余剰ろう材を
吸収することを特徴とする。
The present invention is characterized in that dummy leads are provided on both outer sides of the lead row to absorb excess brazing material.

〔発明の実施例〕[Embodiments of the invention]

第5図に本発明によるリードフレームの実施例
を示す。リードフレーム1は、その外側に余剰ろ
う材吸収用の幅の広いリード14,15を備えて
いる。ろう材5の余剰部12,13はそれぞれ幅
の広いリード14,15に接するように保持さ
れ、ろう付温度にまで加熱される。第7図にろう
付の完了した状況を示す。余剰ろう吸収用リード
14,15の先端18,19には余剰のろう材1
2,13が溶融付着しており、余剰ろう量がここ
に吸収されたために、従来技術ではブリツジの生
じた端子16,17にも正常にろう付される端子
7と同一量のろうが付着するためブリツジが発生
せず、正常なろう付が行なわれる。しかる後に切
断線20,21に添つてリードつなぎ部材2を切
断し、余剰ろう吸収用リード14,15を切り離
すことによつて、第9図に示すように全ての端子
4がブリツジすることなく正常にろう付されたリ
ード付きセラミツク基板が得られる。なお、余剰
ろう吸収用リード14,15は、リードフレーム
ろう付工程中での取り扱いミスによるリード1の
曲がり等の損傷防止のための保護としても働く。
FIG. 5 shows an embodiment of a lead frame according to the present invention. The lead frame 1 is provided with wide leads 14 and 15 on the outside thereof for absorbing excess brazing material. Excess portions 12 and 13 of the brazing material 5 are held in contact with wide leads 14 and 15, respectively, and heated to a brazing temperature. Figure 7 shows the state of completion of brazing. Excess brazing material 1 is placed on the tips 18 and 19 of the excess brazing absorbing leads 14 and 15.
2 and 13 are melted and adhered thereto, and the excess amount of solder is absorbed there. Therefore, in the prior art, the same amount of solder adheres to the terminals 16 and 17 where bridging occurred as to the normally soldered terminal 7. Therefore, no bridging occurs and normal brazing is performed. After that, by cutting the lead connecting member 2 along the cutting lines 20 and 21 and separating the excess solder absorbing leads 14 and 15, all the terminals 4 are normal without bridging as shown in FIG. A ceramic substrate with leads soldered to the ceramic substrate is obtained. Note that the excess solder absorbing leads 14 and 15 also serve as protection to prevent damage such as bending of the lead 1 due to handling errors during the lead frame brazing process.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、従来技術で発生していた余剰
ろう材によるブリツジの発生をなくすることが可
能であり、従来技術で余剰ろう量をできるだけ減
らすためにろう材5の長さを短くした場合に発生
する、ろう材とセラミツク基板とリードフレーム
相互間の位置あわせの難かしさを解消することが
可能となる。
According to the present invention, it is possible to eliminate the occurrence of bridging due to surplus solder metal that occurs in the conventional technology, and when the length of the solder metal 5 is shortened in order to reduce the amount of surplus solder material as much as possible in the conventional technology. This makes it possible to eliminate the difficulty in aligning the brazing material, ceramic substrate, and lead frame with each other, which occurs during the process.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来技術によるリードフレーム及びそ
れをろう付する前のセラミツク基板及びろう材と
の保持関係を示す平面図、第2図は第1図の側面
図、第3図は従来技術によるリードフレームを使
用してろう付し終つた状態を示す平面図、第4図
は第3図の側面図、第5図は本発明の一実施例に
よるリードフレーム及びそれをろう付する前のセ
ラミツク基板及びろう材との保持関係を示す平面
図、第6図は第5図の側面図、第7図はリードフ
レームを使用してろう付し終つた状態を示す平面
図、第8図は第7図の側面図、第9図は余剰ろう
吸収用リードを除去した状態を示す平面図、第1
0図は第9図の側面図である。 符号の説明、1……リードフレーム、2……リ
ードのつなぎ部材、3……セラミツク基板、4…
…セラミツク基板の端子、5……ロウ材(リボン
又はワイヤ)、14,15……余剰ろう吸収用リ
ード。
Fig. 1 is a plan view showing a lead frame according to the prior art and its holding relationship with a ceramic substrate and brazing material before being brazed, Fig. 2 is a side view of Fig. 1, and Fig. 3 is a lead frame according to the prior art. 4 is a side view of FIG. 3, and FIG. 5 is a lead frame according to an embodiment of the present invention and a ceramic substrate before brazing it. 6 is a side view of FIG. 5, FIG. 7 is a plan view showing the state after brazing using a lead frame, and FIG. 8 is a side view of FIG. Fig. 9 is a side view, Fig. 9 is a plan view showing the state in which the excess solder absorption lead has been removed, and Fig.
Figure 0 is a side view of Figure 9. Explanation of symbols: 1... Lead frame, 2... Lead connecting member, 3... Ceramic substrate, 4...
... Ceramic board terminal, 5 ... Brazing material (ribbon or wire), 14, 15 ... Lead for absorbing excess solder.

Claims (1)

【特許請求の範囲】[Claims] 1 ろう付けによつて被接続端子列とリードフレ
ームを接続する方法において、リード列の両外側
に、余剰ろう材を吸収するために本来接続に要す
るリード以外のリードを設け、ここに余剰ろう材
を吸収することを特徴とするリードフレームのろ
う付け方法。
1 In a method of connecting a terminal row to be connected and a lead frame by brazing, leads other than the leads originally required for connection are provided on both outsides of the lead row in order to absorb excess brazing material, and the excess brazing material is placed here. A lead frame brazing method characterized by absorbing.
JP1451583A 1983-02-02 1983-02-02 Brazing method of lead frame Granted JPS59141256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1451583A JPS59141256A (en) 1983-02-02 1983-02-02 Brazing method of lead frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1451583A JPS59141256A (en) 1983-02-02 1983-02-02 Brazing method of lead frame

Publications (2)

Publication Number Publication Date
JPS59141256A JPS59141256A (en) 1984-08-13
JPS6256665B2 true JPS6256665B2 (en) 1987-11-26

Family

ID=11863220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1451583A Granted JPS59141256A (en) 1983-02-02 1983-02-02 Brazing method of lead frame

Country Status (1)

Country Link
JP (1) JPS59141256A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0789577B2 (en) * 1986-07-14 1995-09-27 京セラ株式会社 Manufacturing method of package for storing semiconductor devices
JPH01121945U (en) * 1988-02-12 1989-08-18
JPH0241452U (en) * 1988-09-09 1990-03-22
US5358169A (en) * 1994-01-14 1994-10-25 Caddock Electronics, Inc. Method of soldering leads to electrical components

Also Published As

Publication number Publication date
JPS59141256A (en) 1984-08-13

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