JPS6253857B2 - - Google Patents
Info
- Publication number
- JPS6253857B2 JPS6253857B2 JP57220333A JP22033382A JPS6253857B2 JP S6253857 B2 JPS6253857 B2 JP S6253857B2 JP 57220333 A JP57220333 A JP 57220333A JP 22033382 A JP22033382 A JP 22033382A JP S6253857 B2 JPS6253857 B2 JP S6253857B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- bit
- random
- instruction
- operand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57220333A JPS59127157A (ja) | 1982-12-17 | 1982-12-17 | テストデ−タ発生装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57220333A JPS59127157A (ja) | 1982-12-17 | 1982-12-17 | テストデ−タ発生装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59127157A JPS59127157A (ja) | 1984-07-21 |
JPS6253857B2 true JPS6253857B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-11-12 |
Family
ID=16749499
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57220333A Granted JPS59127157A (ja) | 1982-12-17 | 1982-12-17 | テストデ−タ発生装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59127157A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2618387B2 (ja) * | 1987-02-19 | 1997-06-11 | 日本電信電話株式会社 | 情報処理装置の試験方法 |
JPH02244338A (ja) * | 1989-03-17 | 1990-09-28 | Hitachi Ltd | データ処理装置の試験方式 |
US7308571B2 (en) * | 2004-10-06 | 2007-12-11 | Intel Corporation | Overriding processor configuration settings |
-
1982
- 1982-12-17 JP JP57220333A patent/JPS59127157A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59127157A (ja) | 1984-07-21 |
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