JPS6246980B2 - - Google Patents

Info

Publication number
JPS6246980B2
JPS6246980B2 JP54084262A JP8426279A JPS6246980B2 JP S6246980 B2 JPS6246980 B2 JP S6246980B2 JP 54084262 A JP54084262 A JP 54084262A JP 8426279 A JP8426279 A JP 8426279A JP S6246980 B2 JPS6246980 B2 JP S6246980B2
Authority
JP
Japan
Prior art keywords
transistor
substrate
current
semiconductor device
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54084262A
Other languages
English (en)
Japanese (ja)
Other versions
JPS568840A (en
Inventor
Yasuaki Hokari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP8426279A priority Critical patent/JPS568840A/ja
Publication of JPS568840A publication Critical patent/JPS568840A/ja
Publication of JPS6246980B2 publication Critical patent/JPS6246980B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP8426279A 1979-07-03 1979-07-03 Monitoring method for deterioration of semiconductor device Granted JPS568840A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8426279A JPS568840A (en) 1979-07-03 1979-07-03 Monitoring method for deterioration of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8426279A JPS568840A (en) 1979-07-03 1979-07-03 Monitoring method for deterioration of semiconductor device

Publications (2)

Publication Number Publication Date
JPS568840A JPS568840A (en) 1981-01-29
JPS6246980B2 true JPS6246980B2 (xx) 1987-10-06

Family

ID=13825532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8426279A Granted JPS568840A (en) 1979-07-03 1979-07-03 Monitoring method for deterioration of semiconductor device

Country Status (1)

Country Link
JP (1) JPS568840A (xx)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944556A (xx) * 1972-09-06 1974-04-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4944556A (xx) * 1972-09-06 1974-04-26

Also Published As

Publication number Publication date
JPS568840A (en) 1981-01-29

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