JPS6240851B2 - - Google Patents

Info

Publication number
JPS6240851B2
JPS6240851B2 JP3852182A JP3852182A JPS6240851B2 JP S6240851 B2 JPS6240851 B2 JP S6240851B2 JP 3852182 A JP3852182 A JP 3852182A JP 3852182 A JP3852182 A JP 3852182A JP S6240851 B2 JPS6240851 B2 JP S6240851B2
Authority
JP
Japan
Prior art keywords
mold
resin
runner
air
sealing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3852182A
Other languages
Japanese (ja)
Other versions
JPS58155727A (en
Inventor
Koji Yanagya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3852182A priority Critical patent/JPS58155727A/en
Publication of JPS58155727A publication Critical patent/JPS58155727A/en
Publication of JPS6240851B2 publication Critical patent/JPS6240851B2/ja
Granted legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/26Moulds
    • B29C45/34Moulds having venting means

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Description

【発明の詳細な説明】 この発明は半導体装置の樹脂封止金型に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a resin-sealing mold for a semiconductor device.

半導体装置にあつては、リードフレーム上に半
導体素子をダイボンドすると共に、このリードフ
レームと半導体素子とをワイヤボンドした上で、
この半導体素子を外部からの物理的、機械的圧力
から保護するために、これらを樹脂封止する手段
が一般に用いられている。
In the case of semiconductor devices, the semiconductor element is die-bonded onto the lead frame, and the lead frame and the semiconductor element are wire-bonded, and then
In order to protect these semiconductor elements from external physical and mechanical pressure, means for sealing them with resin is generally used.

こゝでこの種の樹脂封止を行なう従来の樹脂封
止金型を第1図および第2図について説明する。
これらの各図において、符号1,2は一対の下定
盤、上定盤、3はこれらの各定盤相互を上下方向
に案内するポスト、4,5は各定盤の対告面に取
付けられて金型を構成する下型、上型である。し
かして前記下型4にはポツト6を中心にしてラン
ナー7が延長され、各ランナーにそれぞれゲート
8を介して下型キヤビテイ9が設けられており、
また前記上型5には下型キヤビテイに対応して上
型キヤビテイ10が設けられている。
A conventional resin sealing mold for performing this type of resin sealing will now be described with reference to FIGS. 1 and 2.
In each of these figures, numerals 1 and 2 are a pair of lower and upper surface plates, 3 is a post that guides each of these surface plates in the vertical direction, and 4 and 5 are attached to the opposing surfaces of each surface plate. These are the lower mold and the upper mold that make up the mold. The lower die 4 has a runner 7 extending around the pot 6, and each runner is provided with a lower die cavity 9 via a gate 8.
Further, the upper mold 5 is provided with an upper mold cavity 10 corresponding to the lower mold cavity.

そしてこの構成にあつては、前記各キヤビテイ
9,10を含む下型4、上型5間に被成型対象で
あるところの半導体装置11を挾持して型合わせ
したのち、図示省略したプランジヤから加圧供給
される溶融樹脂を、ポツト6、ランナー7からゲ
ート8で絞つて各キヤビテイ9,10間に充填さ
せ、これによつて所期の樹脂封止を行なうのであ
る。
In this configuration, after the semiconductor device 11 to be molded is sandwiched between the lower mold 4 and the upper mold 5 including the cavities 9 and 10 and the molds are matched, a plunger (not shown) is applied. The molten resin supplied under pressure is squeezed by the gate 8 from the pot 6 and the runner 7, and is filled between the cavities 9 and 10, thereby achieving the desired resin sealing.

しかし乍らこの従来構成の場合には、よく知ら
れているように、樹脂封止部分に空気を巻き込ん
でしまうという大きな欠点が伏在している。すな
わち、前記したランナー7、ゲート8および各キ
ヤビテイ9,10内への溶融樹脂充填は、これら
各部内に存在している空気と樹脂との置換にほか
ならず、このとき樹脂内部への空気の巻き込みが
多発するもので、その理由は種々推定し得るが、
いずれにしても前記各部内に空気が存在している
限り解決し難い問題である。そしてこの空気の巻
き込みは、封止される半導体装置の種類の如何を
問わず、耐湿性、耐候性、耐衝撃性などの点から
装置の性能に悪影響を及ぼすもので、他の成型上
の問題点、例えば未注入、バリ発生などに併せて
大きな欠点となつている。
However, as is well known, this conventional configuration has a major drawback in that air is trapped in the resin-sealed portion. In other words, filling the runner 7, gate 8, and cavities 9 and 10 with the molten resin described above is nothing but replacing the air existing in these parts with the resin, and at this time, the air is not drawn into the resin. occurs frequently, and various reasons can be assumed, but
In any case, it is a problem that is difficult to solve as long as air exists in each of the parts. Regardless of the type of semiconductor device being encapsulated, this air entrainment has a negative impact on the performance of the device in terms of moisture resistance, weather resistance, impact resistance, etc., and may cause other molding problems. This is a major drawback, for example, non-injection, burr generation, etc.

この発明は従来の樹脂封止金型のこのような欠
点に鑑み、溶融樹脂の充填と共に内部に存在する
空気を除去し得るようにして、封止時の空気の巻
き込みを阻止したものである。
In view of these drawbacks of conventional resin sealing molds, this invention prevents air from being entrained during sealing by making it possible to remove the air present inside while filling with molten resin.

以下、この発明に係わる樹脂封止金型の一実施
例につき、第3図ないし第8図を参照して詳細に
説明する。
Hereinafter, one embodiment of the resin-sealed mold according to the present invention will be described in detail with reference to FIGS. 3 to 8.

これらの第3図ないし第8図において前記第1
図および第2図と同一符号は同一または相当部分
を示し、また12は前記下型キヤビテイ9のそれ
ぞれに連接されたエアベンド、13はこれらの各
エアベンドを減圧穴14に導く減圧溝、15は前
記ランナー7のそれぞれ端部に設けられたダミー
キヤビテイ、16は各ダミーキヤビテイに連接さ
れた減圧穴、17,18は各減圧穴14,16を
外部の減圧ポンプなどに接続する導管、19は前
記減圧穴16に組み込んで減圧開閉弁を構成する
作動ピンで、通路となる切欠き19aを有し、支
持枠21で支持されたシリンダ20により作動制
御されて矢印A,Bのように上下動されて弁開閉
を行なうようになつており、さらにこれら各部を
囲繞する下型4面にはシール溝22を形成してシ
ール23を配し、上型5面とのシールを行なえる
ようにしたものである。
In these Figures 3 to 8, the first
The same reference numerals as in the figures and FIG. 2 indicate the same or corresponding parts, and 12 is an air bend connected to each of the lower mold cavities 9, 13 is a pressure reducing groove that guides each of these air bends to the pressure reducing hole 14, and 15 is a pressure reducing groove shown in the above. Dummy cavities provided at each end of the runner 7; 16, a vacuum hole connected to each dummy cavity; 17, 18, conduits connecting each vacuum hole 14, 16 to an external vacuum pump, etc.; 19, a vacuum hole 16; It is an operating pin that is assembled into a pressure reduction on-off valve and has a notch 19a that serves as a passage.It is operated and controlled by a cylinder 20 supported by a support frame 21 and is moved up and down as shown by arrows A and B to open and close the valve. Furthermore, seal grooves 22 are formed on the four surfaces of the lower mold surrounding these parts, and seals 23 are disposed thereon so as to be able to seal with the five surfaces of the upper mold.

従つてこの実施例構成では、従来と同様に下型
4、上型5間に半導体装置11を挾持して型合わ
せしたのちは、まず作動ピン19をA方向に上昇
させて減圧弁を開き、各減圧穴14,16を通し
て金型内を減圧する。このとき減圧穴14はエア
ベンド12より主にキヤビテイ9,10内を、ま
た減圧穴16は主にランナー7とこれに連なるポ
ツト6およびゲート8内をそれぞれに減圧するこ
とになる。
Therefore, in the configuration of this embodiment, after the semiconductor device 11 is sandwiched between the lower mold 4 and the upper mold 5 and the molds are aligned as in the conventional case, the operating pin 19 is first raised in the direction A to open the pressure reducing valve. The pressure inside the mold is reduced through the respective pressure reduction holes 14 and 16. At this time, the pressure reducing hole 14 mainly reduces the pressure in the cavities 9 and 10 from the air bend 12, and the pressure reducing hole 16 mainly reduces the pressure in the runner 7, the pot 6 connected thereto, and the gate 8.

ついでこの減圧状態でポツト6から溶融樹脂を
加圧導入するが、このときタイミングをはかつて
シリンダ20により作動ピン19をB方向に下降
させて減圧弁を閉じる。この操作によりランナー
7からダミーキヤビテイ15内に流れ込んだ溶融
樹脂は、その流動が一時停止状態となると共に、
このダミーキヤビテイ15内でその部分の空気を
閉じ込める働きをなし、減圧穴16からの外部へ
の流出はない。そしてこのときにも減圧穴14を
通したキヤビテイ9,10内の減圧は継続されて
おり、続いてゲート8より各キヤビテイ9,10
内に溶融樹脂が導入されて封止を行なうのである
が、この場合、エアベンド12の深さを選択する
ことにより、このエアベンド12側への樹脂の流
出を抑え得る。こゝでエアベンド12の深さとし
ては、封止樹脂がシリコンの場合は、0.03〜0.05
mm、エポキシの場合は0.02〜0.025mmであれば良
好な封止成形が可能である。また下型4、上型5
間のシール23は、この減圧成形時に金型内部へ
の空気の浸入を極力阻止して前記効果を一層助長
し得るのである。
Then, in this reduced pressure state, molten resin is introduced under pressure from the pot 6, but at this time, the timing is such that the cylinder 20 lowers the operating pin 19 in the direction B to close the pressure reducing valve. As a result of this operation, the flow of the molten resin that has flowed into the dummy cavity 15 from the runner 7 is temporarily stopped, and
This dummy cavity 15 functions to confine the air in that area, and does not leak out from the decompression hole 16 to the outside. At this time as well, the pressure inside the cavities 9 and 10 continues to be reduced through the pressure reduction hole 14, and then from the gate 8 into each cavity 9 and 10.
Molten resin is introduced into the air bend 12 for sealing, and in this case, by selecting the depth of the air bend 12, it is possible to prevent the resin from flowing out to the air bend 12 side. Here, the depth of the air bend 12 is 0.03 to 0.05 when the sealing resin is silicon.
mm, and in the case of epoxy, 0.02 to 0.025 mm, good sealing molding is possible. Also, lower mold 4, upper mold 5
The seal 23 in between can further enhance the above effect by preventing air from entering the mold as much as possible during this vacuum molding.

以上詳述したようにこの発明の構成によるとき
は、金型による半導体装置の樹脂封止を減圧成形
によつて行なうようにしたから、樹脂封止に際し
ての空気の巻き込みが解消され、良好な封止成形
が可能になつて樹脂封止された半導体装置の性能
ならびに信頼性を向上でき、併せて生産性を改善
できる。また金型を構成するポツトあるいはラン
ナーの一部に減圧開閉弁を設けて、溶融樹脂の加
圧導入とタイミングを合わせてその開閉制御を行
ない、樹脂の流動を一時停止させる状態でキヤビ
テイへの充填をなすようにし、かつその間、キヤ
ビテイ内の減圧を保持するようにしたので、樹脂
封止部分への空気の巻き込みが確実に阻止でき、
下型、上型間のシール作用と相俟つて前記効果を
充分に裏付け得るものである。
As described in detail above, according to the structure of the present invention, since the resin sealing of the semiconductor device using the mold is performed by vacuum molding, the entrainment of air during resin sealing is eliminated and good sealing is achieved. Since molding becomes possible, the performance and reliability of resin-sealed semiconductor devices can be improved, and productivity can also be improved. In addition, a pressure-reducing on-off valve is installed in a part of the pot or runner that makes up the mold, and its opening and closing is controlled in synchronization with the pressurized introduction of molten resin, so that the cavity is filled with the flow of resin temporarily stopped. During this time, the reduced pressure inside the cavity is maintained, so that air can be reliably prevented from getting into the resin-sealed part.
Together with the sealing action between the lower mold and the upper mold, the above-mentioned effect can be fully supported.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は従来例による樹脂封止金
型の断面図および下型の平面図、第3図および第
4図はこの発明に係わる樹脂封止金型の一実施例
を示す断面図および下型の平面図、第5図および
第6図は同上減圧部のそれぞれ断面図、第7図は
同作動ピンの断面図、第8図は第6図構成の作動
状態を示す断面図である。 4……下型、5……上型、6……ポツト、7…
…ランナー、8……ゲート、9,10……下型、
上型キヤビテイ、11……半導体装置、12……
エアベンド、13……減圧溝、14,16……減
圧穴、15……ダミーキヤビテイ、19……作動
ピン(減圧開閉弁)、22……シール。
1 and 2 are a cross-sectional view and a plan view of a lower mold of a conventional resin-sealed mold, and FIGS. 3 and 4 are cross-sectional views showing an embodiment of a resin-sealed mold according to the present invention. Figures 5 and 6 are sectional views of the depressurizing section, respectively, Figure 7 is a sectional view of the operating pin, and Figure 8 is a sectional view showing the operating state of the configuration shown in Figure 6. It is. 4...Lower mold, 5...Upper mold, 6...Pot, 7...
...Runner, 8...Gate, 9,10...Lower die,
Upper mold cavity, 11... semiconductor device, 12...
Air bend, 13... pressure reducing groove, 14, 16... pressure reducing hole, 15... dummy cavity, 19... actuation pin (pressure reducing opening/closing valve), 22... seal.

Claims (1)

【特許請求の範囲】[Claims] 1 型合わせ可能な下型および上型からなり、こ
れらの両型間に溶融樹脂を加圧導入するポツト、
ポツトに連なるランナー、およびランナーにゲー
トを介してそれぞれに連なるキヤビテイを形成し
た金型において、前記ランナー、ポツトにダミー
キヤビテイを経て連なる減圧開閉弁と、これらの
各部の外周囲を囲繞するシールとを備え、樹脂封
止に際して、前記ダミーキヤビテイ側においては
溶融樹脂の導入にタイミングを合わせて、減圧開
閉弁を閉作動制御し、前記金型内のエアを短時間
で吸引し得るようにしたことを特徴とする半導体
装置の樹脂封止金型。
1. A pot consisting of a lower mold and an upper mold that can be matched, and into which molten resin is introduced under pressure between the two molds;
A mold having a runner connected to the pot and a cavity connected to the runner through a gate, the mold comprising a pressure reducing on-off valve connected to the runner and the pot through a dummy cavity, and a seal surrounding the outer periphery of each of these parts. , when sealing with resin, a pressure reduction on-off valve is controlled to close in synchronization with the introduction of molten resin on the dummy cavity side, so that air in the mold can be sucked in a short time. Resin sealing mold for semiconductor devices.
JP3852182A 1982-03-10 1982-03-10 Mold for resin sealing of semiconductor device Granted JPS58155727A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3852182A JPS58155727A (en) 1982-03-10 1982-03-10 Mold for resin sealing of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3852182A JPS58155727A (en) 1982-03-10 1982-03-10 Mold for resin sealing of semiconductor device

Publications (2)

Publication Number Publication Date
JPS58155727A JPS58155727A (en) 1983-09-16
JPS6240851B2 true JPS6240851B2 (en) 1987-08-31

Family

ID=12527572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3852182A Granted JPS58155727A (en) 1982-03-10 1982-03-10 Mold for resin sealing of semiconductor device

Country Status (1)

Country Link
JP (1) JPS58155727A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064818U (en) * 1983-10-13 1985-05-08 トーワ株式会社 Transfer mold mold equipment
JPS6185829A (en) * 1984-10-03 1986-05-01 Michio Osada Transfer resin molding process of semiconductor element
JPH0729451B2 (en) * 1985-11-13 1995-04-05 株式会社日立製作所 Platen roller manufacturing equipment
JPH0345781Y2 (en) * 1986-11-28 1991-09-27
JP4759259B2 (en) * 2004-12-08 2011-08-31 アピックヤマダ株式会社 Resin mold and resin mold apparatus
NL2000488C2 (en) * 2007-02-15 2008-08-18 Fico Bv Method and device for enveloping electronic components with the aid of underpressure.
JP5138470B2 (en) * 2008-06-06 2013-02-06 アピックヤマダ株式会社 Transfer molding apparatus and transfer molding method using the same
KR100933025B1 (en) 2009-07-08 2009-12-21 동현정공(주) Overflow suctioning mold for plastic casting
KR100930737B1 (en) 2009-07-08 2009-12-09 동현정공(주) Overflow suctioning mold for plastic casting
JP5969883B2 (en) * 2012-10-03 2016-08-17 信越化学工業株式会社 Manufacturing method of semiconductor device
CN106738704A (en) * 2017-01-10 2017-05-31 佛山市顺德区百年科技有限公司 Vacuum injection mould and injection machine

Also Published As

Publication number Publication date
JPS58155727A (en) 1983-09-16

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