JPH0233509B2 - JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA - Google Patents

JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA

Info

Publication number
JPH0233509B2
JPH0233509B2 JP2150882A JP2150882A JPH0233509B2 JP H0233509 B2 JPH0233509 B2 JP H0233509B2 JP 2150882 A JP2150882 A JP 2150882A JP 2150882 A JP2150882 A JP 2150882A JP H0233509 B2 JPH0233509 B2 JP H0233509B2
Authority
JP
Japan
Prior art keywords
resin
mold
runner
lower mold
sealed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2150882A
Other languages
Japanese (ja)
Other versions
JPS58138608A (en
Inventor
Keigo Ikeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2150882A priority Critical patent/JPH0233509B2/en
Publication of JPS58138608A publication Critical patent/JPS58138608A/en
Publication of JPH0233509B2 publication Critical patent/JPH0233509B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)

Description

【発明の詳細な説明】 この発明は、IC、トランジスタなどの半導体
装置をボンデイング工程で取り付けたリードフレ
ームを位置決め載置し、上記半導体装置の部分に
樹脂を加圧注入して樹脂封止形半導体装置を成形
する際に用いるモールド金型(以下単に金型と略
称する)に関するものである。
DETAILED DESCRIPTION OF THE INVENTION This invention involves positioning and mounting a lead frame to which semiconductor devices such as ICs and transistors are attached in a bonding process, and injecting resin under pressure into the semiconductor device portion to produce a resin-sealed semiconductor. The present invention relates to a mold die (hereinafter simply referred to as a die) used when molding the device.

第1図aおよびbはそれぞれ樹脂封止形ICの
一例の外形を示す斜視図および側面図である。
1A and 1B are a perspective view and a side view, respectively, showing the outer shape of an example of a resin-sealed IC.

第2図は第1図aおよびbに示す樹脂封止形
ICがリードフレームに成形された状態を示す斜
視図である。
Figure 2 shows the resin-sealed type shown in Figure 1 a and b.
FIG. 3 is a perspective view showing a state in which an IC is molded into a lead frame.

第3図は樹脂封止形IC成形用の従来の下型を
示す平面図、第4図は第3図の−線での断面
図である。
FIG. 3 is a plan view showing a conventional lower mold for molding a resin-sealed IC, and FIG. 4 is a sectional view taken along the - line in FIG. 3.

これらの図において、1は下金型、2は前記下
金型1に加工されたランナ、4は前記下金型1に
加工され第1図に示した樹脂封止形ICの樹脂封
止部の下半分の形状と同一の形状を有したキヤビ
テイ、3は前記下金型1に加工されランナ2から
キヤビテイ4へ樹脂を導くゲート、5は位置決め
ピンで、リードフレーム14に加工された位置決
め穴14aと嵌合しリードフレーム14を下金型
1に正しく位置決めし、フレーム載置面6,7に
載置する。8は空気抜きで、ランナ2の端部に加
工された浅い溝である。9,10は前記下金型1
に付着した樹脂をエジエクトするエジエクタ穴
で、エジエクタ穴9,10にはエジエクタピン1
1,12が摺動可能に挿入されており、モールド
終了後、キヤビテイ面ランナ等をエジエクトし型
より離型する。第1図aおよびbの12a,12
b、第2図の11a,11b,12a,12bは
エジエクタピン跡である。
In these figures, 1 is a lower mold, 2 is a runner processed into the lower mold 1, and 4 is a resin-sealed part of the resin-sealed IC processed into the lower mold 1 and shown in FIG. 3 is a gate machined into the lower mold 1 and guides the resin from the runner 2 to the cavity 4; 5 is a positioning pin, which is a positioning hole machined on the lead frame 14; 14a to correctly position the lead frame 14 on the lower mold 1 and place it on the frame mounting surfaces 6 and 7. 8 is an air vent, which is a shallow groove machined at the end of the runner 2. 9 and 10 are the lower mold 1
Ejector holes 9 and 10 are equipped with ejector pins 1.
1 and 12 are slidably inserted, and after molding is completed, the cavity surface runner etc. are ejected and released from the mold. 12a, 12 in Figure 1 a and b
b, 11a, 11b, 12a, 12b in Fig. 2 are ejector pin marks.

なお、上金型は下金型1のキヤビテイ4と対向
する表面部の部分に第1図に示した樹脂封止形
ICの樹脂封止部の上半分の形状と同一の形状を
有するキヤビテイが形成され、位置決めピン5に
対向する表面部の部分に位置決めピン5を挿入可
能な位置決めピン挿入穴が加工されており、ラン
ナ2、ゲート3、空気抜き8がない状態と同様で
あるので、以下、上金型について図示ならびに説
明は省略し、下金型1についてのみ説明すること
にする。
The upper mold has a resin-sealed mold shown in FIG. 1 on the surface of the lower mold 1 facing the cavity 4.
A cavity having the same shape as the upper half of the resin-sealed portion of the IC is formed, and a positioning pin insertion hole into which the positioning pin 5 can be inserted is machined in the surface portion facing the positioning pin 5. Since this is the same as the state without the runner 2, gate 3, and air vent 8, illustration and description of the upper mold will be omitted, and only the lower mold 1 will be described below.

上記で説明した下金型1と上金型を用いて樹脂
封止形ICを成形するわけであるが、まず使用す
る樹脂、例えばエポキシ樹脂、シリコン樹脂など
の熱硬化性樹脂の成形温度に下金型1および上金
型を昇温し、リードフレーム14を下金型1に正
しく載置しプレスにより下金型1と上金型を型締
めする。
A resin-encapsulated IC is molded using the lower mold 1 and upper mold described above. First, the molding temperature of the resin used, such as a thermosetting resin such as epoxy resin or silicone resin, is lowered. The temperatures of the mold 1 and the upper mold are raised, the lead frame 14 is placed correctly on the lower mold 1, and the lower mold 1 and the upper mold are clamped by a press.

次に、第3図に太線矢印方向から樹脂を注入加
圧すれば樹脂は、順次ランナ2→ゲート3→キヤ
ビテイ4に充填される。樹脂を注入加圧後、樹脂
が硬化するのをまつて型開きをすると、まず上金
型に設けられたエジエクタピンにより上金型に付
着した樹脂が離型され、プレス下死点で下金型1
に設けられたエジエクタピン11,12により樹
脂部が離型され第2図に示すような成形品が得ら
れる。
Next, when resin is injected and pressurized from the direction of the bold arrow in FIG. 3, the resin is filled in the runner 2 → gate 3 → cavity 4 in this order. After injecting the resin and applying pressure, wait for the resin to harden before opening the mold. First, the ejector pin provided on the upper mold releases the resin attached to the upper mold, and the lower mold is released at the bottom dead center of the press. 1
The resin part is released from the mold by ejector pins 11 and 12 provided in the molded parts, and a molded product as shown in FIG. 2 is obtained.

上記従来例による金型構造においては、プレス
下死点での離型時にランナ2の終端面B(第4図)
とエジエクタピン11との間の樹脂付着応力のた
め第4図に示すC間に曲げモーメントが作用し、
ランナ2a(第2図)が離型するとき振動したり、
ランナ2aが折れ残るという現象があつた。
In the mold structure according to the above conventional example, when releasing the mold at the bottom dead center of the press, the terminal end face B of the runner 2 (Fig. 4)
Due to the resin adhesion stress between and the ejector pin 11, a bending moment acts between C shown in FIG.
When the runner 2a (Fig. 2) is released from the mold, it may vibrate or
A phenomenon occurred in which the runner 2a remained broken.

従来の樹脂封止形半導体装置用金型では、この
振動現象やランナ2aの折れ現象のためリードフ
レーム14がランナ2aから外れリードフレーム
14が型に残つたり、折れたランナ2aが型内に
残ることがあつた。そのため成形製品の取出し
や、ランナ2aが型内に残つていないかを点検す
る必要があるなどの欠点があるとともに、樹脂封
止作業の自動化を阻害する原因ともなつていた。
In conventional molds for resin-sealed semiconductor devices, due to this vibration phenomenon and the bending phenomenon of the runner 2a, the lead frame 14 may come off the runner 2a and the lead frame 14 may remain in the mold, or the broken runner 2a may fall into the mold. There was something left to do. Therefore, there are drawbacks such as the need to take out the molded product and check whether the runner 2a remains in the mold, and it also becomes a cause of hindering automation of resin sealing work.

この発明は、上述の問題点にかんがみなされた
もので、ランナの終端面での樹脂の引つかかり振
動をなくし、また、樹脂の折れ残りをなくした樹
脂封止形半導体装置用金型を提供すること目的と
する。以下、第1図に示した樹脂封止形ICの成
形に用いるこの発明の一実施例の金型を第5図、
第6図について説明する。
The present invention has been made in view of the above-mentioned problems, and provides a mold for a resin-sealed semiconductor device that eliminates the vibration caused by the resin being caught at the end surface of the runner, and eliminates the unbent portion of the resin. The purpose is to do. Below, a mold according to an embodiment of the present invention used for molding the resin-sealed IC shown in FIG. 1 is shown in FIG.
FIG. 6 will be explained.

この実施例においても、第3図、第4図に示し
た従来例と同様に上金型は下金型とほぼ同様であ
るので、上金型の説明は省略し、下金についての
み説明する。
In this example as well, the upper mold is almost the same as the lower mold as in the conventional example shown in FIGS. 3 and 4, so the explanation of the upper mold will be omitted and only the lower mold will be explained. .

第5図はこの実施例の下金型を示す平面図、第
6図は第5図の−線での断面図である。これ
らの図において、1〜12は上述した従来例と同
等のものであり、13は前記ランナ2より注入さ
れた樹脂を下金型1から流出するのを封止するた
めの端板、この端板13は下金型1にねじ締め
(図示せず)結合されている。端板13には空気
抜き8が加工されている。15はモールド成形後
ランナ2の終端面と、端板13との接触面から固
着した樹脂が容易に離型するように、端板13と
ランナ2の終端面側の端板13に加工された本発
明の特徴である抜きこう配である。
FIG. 5 is a plan view showing the lower mold of this embodiment, and FIG. 6 is a sectional view taken along the - line in FIG. In these figures, 1 to 12 are equivalent to the conventional example described above, and 13 is an end plate for sealing the resin injected from the runner 2 from flowing out from the lower mold 1; The plate 13 is connected to the lower mold 1 by screws (not shown). An air vent 8 is machined into the end plate 13. 15 is processed into the end plate 13 and the end plate 13 on the end face side of the runner 2 so that the resin stuck to the contact surface between the end face of the runner 2 and the end plate 13 can be easily released from the mold after molding. This is the open slope, which is a feature of the present invention.

上記構成の金型によれば、ランナ2の終端面と
端板13の接触面に加工された抜きこう配15に
より、従来例で説明した発生モーメントを著しく
軽減できる。
According to the mold having the above configuration, the generated moment explained in the conventional example can be significantly reduced due to the draft slope 15 formed on the contact surface between the end face of the runner 2 and the end plate 13.

なお、この発明の説明は、下金型1にランナ2
が設けられたものについて行つたが、上金型にラ
ンナがあつた場合にも、抜きこう配を同様に設け
ることにより同等の作用を行わせることができ
る。
In addition, in the description of this invention, the runner 2 is attached to the lower mold 1.
The same effect can be achieved even if the upper mold is hit by a runner by similarly providing a punching gradient.

以上詳細に説明したように、この発明はモール
ド金型のランナの終端面に抜きこう配を形成した
ので、モールド成形後、固着した樹脂を容易に離
型できるので、作業能率および時間の短縮がはか
れ稼動率を向上できる利点がある。
As explained in detail above, in this invention, the cutout slope is formed on the end face of the runner of the mold, so that the fixed resin can be easily released from the mold after molding, resulting in work efficiency and time reduction. This has the advantage of improving the operating rate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図a、bはそれぞれ樹脂封止形ICの一例
の外形を示す斜視図および側面図、第2図は第1
図に示す樹脂封止形ICがリードフレームに成形
された状態を示す斜視図、第3図は従来例におけ
る下金型の平面図、第4図は第3図の−線に
よる断面図、第5図はこの発明の一実施例を示す
下金型の平面図、第6図は第5図の−線によ
る断面図である。 図中、1は下金型、2はランナ、3はゲート、
4はキヤビテイ、5は位置決めピン、6,7はフ
レーム載置面、8は空気抜き、9,10はエジエ
クタ穴、11,12はエジエクタピン、13は端
板、14はリードフレーム、15は抜きこう配で
ある。なお、図中の同一符号は同一または相当部
分を示す。
Figures 1a and b are a perspective view and a side view showing an example of the outer shape of a resin-sealed IC, respectively, and Figure 2 is a side view of an example of a resin-sealed IC.
FIG. 3 is a plan view of the lower mold in the conventional example, FIG. 4 is a sectional view taken along the - line in FIG. 3, and FIG. FIG. 5 is a plan view of a lower mold showing an embodiment of the present invention, and FIG. 6 is a sectional view taken along the - line in FIG. 5. In the figure, 1 is the lower mold, 2 is the runner, 3 is the gate,
4 is a cavity, 5 is a positioning pin, 6 and 7 are frame mounting surfaces, 8 is an air vent, 9 and 10 are ejector holes, 11 and 12 are ejector pins, 13 is an end plate, 14 is a lead frame, and 15 is a vent slope. be. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 1 半導体装置が組み立てられたリードフレーム
と、このリードフレームを位置決め載置し前記半
導体装置の部分に樹脂を注入するためのランナ、
ゲートおよびキヤビテイを有する上下一対のモー
ルド金型において、このモールド金型の前記ラン
ナの終端面に抜きこう配を形成したことを特徴と
する樹脂封止形半導体装置用モールド金型。
1. A lead frame on which a semiconductor device is assembled, a runner for positioning and mounting this lead frame and injecting resin into a portion of the semiconductor device,
1. A mold for a resin-sealed semiconductor device, characterized in that a pair of upper and lower molds each have a gate and a cavity, and a recessed slope is formed on the end face of the runner of the mold.
JP2150882A 1982-02-10 1982-02-10 JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA Expired - Lifetime JPH0233509B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2150882A JPH0233509B2 (en) 1982-02-10 1982-02-10 JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2150882A JPH0233509B2 (en) 1982-02-10 1982-02-10 JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA

Publications (2)

Publication Number Publication Date
JPS58138608A JPS58138608A (en) 1983-08-17
JPH0233509B2 true JPH0233509B2 (en) 1990-07-27

Family

ID=12056904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2150882A Expired - Lifetime JPH0233509B2 (en) 1982-02-10 1982-02-10 JUSHIFUSHIGATAHANDOTAISOCHOMOORUDOKANAGATA

Country Status (1)

Country Link
JP (1) JPH0233509B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4769380B2 (en) * 2001-05-18 2011-09-07 ルネサスエレクトロニクス株式会社 Cleaning sheet and method of manufacturing semiconductor device using the same
CN114228017B (en) * 2022-02-24 2022-04-29 南京博兰得电子科技有限公司 Forming device and forming process of DCDC converter and DCDC converter

Also Published As

Publication number Publication date
JPS58138608A (en) 1983-08-17

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