JPH06252188A - Method and device for manufacturing resin-encapsulated semiconductor chip - Google Patents

Method and device for manufacturing resin-encapsulated semiconductor chip

Info

Publication number
JPH06252188A
JPH06252188A JP5035877A JP3587793A JPH06252188A JP H06252188 A JPH06252188 A JP H06252188A JP 5035877 A JP5035877 A JP 5035877A JP 3587793 A JP3587793 A JP 3587793A JP H06252188 A JPH06252188 A JP H06252188A
Authority
JP
Japan
Prior art keywords
resin
lead
semiconductor chip
lead wire
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5035877A
Other languages
Japanese (ja)
Inventor
Hiroshi Ito
博史 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP5035877A priority Critical patent/JPH06252188A/en
Publication of JPH06252188A publication Critical patent/JPH06252188A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B28/00Compositions of mortars, concrete or artificial stone, containing inorganic binders or the reaction product of an inorganic and an organic binder, e.g. polycarboxylate cements
    • C04B28/02Compositions of mortars, concrete or artificial stone, containing inorganic binders or the reaction product of an inorganic and an organic binder, e.g. polycarboxylate cements containing hydraulic cements other than calcium sulfates
    • C04B28/04Portland cements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Power Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Abstract

PURPOSE:To prevent axial lead type resin-encapsulating semiconductor chip defects due to lead bending process (peeling and gaps on the interface between the lead wires and the molding resin) and provide the rational manufacturing method and device which reduce the number of the processes on the production line. CONSTITUTION:A manufacturing device is formed by incorporating a punch 7 with a resin molding die 6 composed of a male mold 4 and a female mold 5 as a jig for bending a lead. The lead processing of the lead wires using the punch is performed simultaneously with the injection of casting resin into a cavity 6a under the condition that the combined assembly body composed of a semiconductor chip 1 and the lead wires 2 is set on the die, and in the same process, a resin package 3 is formed with the formation of a bending part 2a on the lead wires.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ダイオードなどを対象
としたアキシャルリード形の樹脂封止型半導体素子の製
造方法および製造装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for manufacturing an axial lead type resin-sealed semiconductor element for a diode or the like.

【0002】[0002]

【従来の技術】まず、本発明の実施対象となるアキシャ
ルリード形の樹脂封止型半導体素子の構造を図3(a),
(b)および図4(a),(b)に示す。図において、1
は半導体チップ、2は半導体チップ1の両端に接合して
軸方向に引出したリード線、3は半導体チップ1の周域
を封止した樹脂パッケージ、2aはリード線上に形成し
た折り曲げ部、2bはスタンドオフである。
2. Description of the Related Art First, a structure of an axial lead type resin-sealed semiconductor element, which is an object of the present invention, is shown in FIG.
4B and FIGS. 4A and 4B. In the figure, 1
Is a semiconductor chip, 2 is a lead wire that is joined to both ends of the semiconductor chip 1 and is drawn out in the axial direction, 3 is a resin package that seals the peripheral area of the semiconductor chip 1, 2a is a bent portion formed on the lead wire, and 2b is It is a standoff.

【0003】すなわち、前記のアキシャルリード形の半
導体素子は、プリント配線板にピン挿入実装するため
に、通常は図3で示すようにリード線2にリード加工を
施して途中箇所にL字形の折り曲げ部2aを形成してい
る。また、ピン挿入実装の際にリード線2の挿入深さを
規制するために、図4で示すようにリード線2の先端側
にあらかじめ偏平なスタンドオフ2bを形成するものも
ある。
That is, in order to insert and mount the above-mentioned axial lead type semiconductor element into a printed wiring board by pins, normally, as shown in FIG. 3, a lead wire 2 is subjected to lead processing and an L-shaped bend is made in the middle thereof. The portion 2a is formed. Further, in order to regulate the insertion depth of the lead wire 2 at the time of pin insertion mounting, as shown in FIG. 4, a flat standoff 2b is previously formed on the tip side of the lead wire 2.

【0004】一方、かかる構造の半導体素子は次のよう
な方法で製造される。まず、半導体チップ1にリード線
2を別な工程で半田接合した後、この組立体をトランス
ファモールド法により樹脂パッケージ3を形成して半導
体チップ1を樹脂封止する。続くリード加工工程ではリ
ード加工用の治具を用いて直線状のリード線2に曲げ加
工を施し、図3のような折り曲げ部2aを形成する。ま
た、スタンドオフ2bを形成する場合にはリード加工を
二つの工程に分け、最初にスタンドオフ2bをプレス加
工した後、折り曲げ部2aをフォーミングする。
On the other hand, a semiconductor device having such a structure is manufactured by the following method. First, after the lead wire 2 is soldered to the semiconductor chip 1 in another step, a resin package 3 is formed on this assembly by a transfer molding method to seal the semiconductor chip 1 with resin. In the subsequent lead processing step, a linear lead wire 2 is bent using a lead processing jig to form a bent portion 2a as shown in FIG. Further, when forming the standoffs 2b, the lead processing is divided into two steps, the standoffs 2b are first pressed, and then the bent portions 2a are formed.

【0005】[0005]

【発明が解決しようとする課題】ところで、前記のよう
に樹脂パッケージ3を成形した後にリード2のリード曲
げ加工を行うと、曲げ加工に伴う応力が樹脂パッケージ
3から引出したリード線2の根元部分にも加わり、これ
が原因でリード線2とモールド樹脂3との間の界面が剥
離してこの部分に隙間の生じることがある。しかも、こ
のような隙間が生じると、外部からパッケージ内に湿気
が侵入して特性劣化を来すなど製品の信頼性に重大な影
響を与える。
By the way, when the lead 2 is bent after the resin package 3 is molded as described above, the stress caused by the bending causes the root portion of the lead wire 2 pulled out from the resin package 3. In addition, the interface between the lead wire 2 and the mold resin 3 may peel off due to this, and a gap may be formed in this portion. Moreover, if such a gap is created, moisture will intrude into the package from the outside, resulting in characteristic deterioration, which will seriously affect the reliability of the product.

【0006】本発明は上記の点にかんがみなされたもの
であり、その目的は前記課題を解決してリード曲げ加工
に伴う製品の欠陥(リード線と樹脂パッケージとの界面
の剥離,隙間発生)を回避し、併せて生産ラインの工程
数を削減できるようにした生産性の面で合理的な樹脂封
止型半導体素子の製造方法,および製造装置を提供する
ことにある。
The present invention has been made in view of the above points, and an object thereof is to solve the above problems and to prevent product defects (delamination of interface between lead wire and resin package, generation of gap) due to lead bending processing. An object of the present invention is to provide a method for manufacturing a resin-sealed semiconductor element and a manufacturing apparatus which are rational in terms of productivity and which can be avoided and also reduce the number of steps in the production line.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
に、本発明の製造方法によれば、半導体チップにリード
線を接合した組立体を成形金型にセットした状態で、キ
ャビティに注型樹脂を注入する樹脂パッケージの成形
と、リード線をフォーミングするリード加工とを並行し
て行うものとする。
In order to achieve the above object, according to the manufacturing method of the present invention, an assembly in which a lead wire is bonded to a semiconductor chip is set in a molding die, and is then cast into a cavity. The molding of the resin package in which the resin is injected and the lead processing for forming the lead wire are performed in parallel.

【0008】一方、前記方法の実施に用いる本発明の製
造装置は、樹脂成形金型にリード加工用の治具を組み込
んで構成するものとする。また、前記製造装置に対し
て、リード線の曲げ加工用治具、あるいはリード線のス
タンドオフ加工用治具を単独ないし併用して実施するこ
とができる。
On the other hand, the manufacturing apparatus of the present invention used for carrying out the above method is constructed by incorporating a lead processing jig into a resin molding die. In addition, a lead wire bending jig or a lead wire standoff jig can be used alone or in combination with the manufacturing apparatus.

【0009】[0009]

【作用】上記のように、半導体チップとリード線との組
立体を樹脂成形金型にセットした状態で、樹脂パッケー
ジの成形とリード線のフォーミングを並行して行うこと
により、リード加工中はキャビティに注入した注型樹脂
が未硬化の状態にあり、リード線が所定の形状にフォー
ミングされた後に樹脂が硬化する。したがって、リード
曲げ加工に伴う機械的応力が原因でリード線と樹脂との
界面に剥離,隙間が発生するおそれが確実に回避され
る。
As described above, by molding the resin package and forming the lead wire in parallel with the assembly of the semiconductor chip and the lead wire set in the resin molding die, the cavity is formed during the lead processing. The casting resin injected into is in an uncured state, and the resin is cured after the lead wire is formed into a predetermined shape. Therefore, it is possible to reliably avoid the possibility of peeling and gaps at the interface between the lead wire and the resin due to the mechanical stress caused by the lead bending process.

【0010】また、樹脂パッケージの成形とリード線の
加工を同時に行うので、その分だけ生産ラインでの工程
数を削減できて生産性の合理化が図れる。
Further, since the molding of the resin package and the processing of the lead wire are performed at the same time, the number of steps on the production line can be reduced by that much, and the productivity can be rationalized.

【0011】[0011]

【実施例】以下、本発明の実施例を図面に基づいて説明
する。なお、各実施例で図3,図4に対応する同一部材
には同じ符号が付してある。 実施例1:図1(a)〜(c)において、上型4と下型
5との組合わせからなる樹脂成形金型6に対し、上型4
にはリード曲げ加工用の治具として一対のポンチ7が左
右両側に組み込まれ、かつ該ポンチ7に対向して下型5
の左右両端部がダイスを形成するような形に作られてお
り、この樹脂成形金型6とポンチ7とで本発明による半
導体素子の製造装置を構成している。なお、図中で6a
は金型6のキャビティ、6bは注型樹脂を注入するゲー
トである。
Embodiments of the present invention will be described below with reference to the drawings. In each embodiment, the same members corresponding to those in FIGS. 3 and 4 are designated by the same reference numerals. Example 1 In FIGS. 1A to 1C, an upper die 4 is used with respect to a resin molding die 6 including a combination of an upper die 4 and a lower die 5.
Has a pair of punches 7 incorporated on both left and right sides as a jig for lead bending, and the lower die 5 is opposed to the punches 7.
The left and right ends of the are formed in a shape to form a die, and the resin molding die 6 and the punch 7 constitute a semiconductor device manufacturing apparatus according to the present invention. In addition, 6a in the figure
Is a cavity of the mold 6, and 6b is a gate for injecting a casting resin.

【0012】次に、前記構成の製造装置による半導体素
子の製造方法を述べる。まず、別な工程で組立てた半導
体チップ1とリード線2との接合組立体を、(a)図の
ように下型5に対し所定位置にセットし、続いて(b)
図のように金型6を閉じて型締めする。この型締め状態
では、リード線2が上型4と下型5との合わせ面(実際
の金型では上型と下型との合わせ面にリード線2の入り
込む溝が設けてある)に挟持される。次に(b)図の型
締め状態で、上型のゲート6bを通じてキャビティ6a
に注型樹脂を注入開始するとともに、これと並行して
(c)図のようにポンチ7に加圧力を加えて突出し操作
する。これにより、いままで直線状であったリード線2
は下型5の側面に沿ってL字形に折れ曲がり、この部分
に折り曲げ部2aがフォーミングされる。そして、キャ
ビティ6aに注入した樹脂が固まったところで、金型を
開いて製品を取り出せば、図3に示したリード加工済み
の樹脂封止型半導体素子と同じものが得られる。
Next, a method of manufacturing a semiconductor element by the manufacturing apparatus having the above structure will be described. First, the joining assembly of the semiconductor chip 1 and the lead wire 2 assembled in another step is set at a predetermined position with respect to the lower die 5 as shown in FIG.
As shown in the figure, the mold 6 is closed and the mold is clamped. In this mold clamping state, the lead wire 2 is sandwiched by the mating surface of the upper die 4 and the lower die 5 (in the actual die, a groove into which the lead wire 2 is inserted is provided on the mating surface of the upper die and the lower die). To be done. Next, in the mold clamped state shown in (b), the cavity 6a is passed through the upper mold gate 6b.
At the same time as the injection of the casting resin is started, the punch 7 is operated by ejecting pressure to the punch 7 as shown in FIG. As a result, the lead wire 2 which was straight until now
Is bent into an L shape along the side surface of the lower die 5, and the bent portion 2a is formed in this portion. Then, when the resin injected into the cavity 6a is solidified, the mold is opened and the product is taken out, whereby the same lead-molded resin-sealed semiconductor element as shown in FIG. 3 is obtained.

【0013】実施例2:図2は樹脂パッケージ3の成形
と並行して、リード線2に図4に示したスタンドオフ2
bをフォーミングするようにした製造装置を示すもので
あり、樹脂成形金型6の上型4と下型5の左右両側に
は、スタンドオフ加工用治具として上下に対向し合う各
一対のポンチ8,9が組み込まれている。
Embodiment 2 FIG. 2 shows the standoff 2 shown in FIG. 4 on the lead wire 2 in parallel with the molding of the resin package 3.
1 shows a manufacturing apparatus configured to form b, and a pair of punches vertically opposed to each other as jigs for standoff processing are provided on both left and right sides of an upper die 4 and a lower die 5 of a resin molding die 6. 8 and 9 are incorporated.

【0014】かかる装置に対し、実施例1で述べたと同
様に半導体チップ1とリード線2との接合組立体を金型
6にセットして型締めした状態で、金型6のキャビティ
6aに注型樹脂を注入して樹脂パッケージ3を成形する
とともに、これと並行してポンチ8,9を上下から加圧
力を加えて突出し操作すれば、リード線2の先端部に偏
平なスタンドオフ2bがプレス加工される。
With respect to such an apparatus, the bonding assembly of the semiconductor chip 1 and the lead wire 2 is set in the mold 6 and clamped in the same manner as described in the first embodiment, and then poured into the cavity 6a of the mold 6. Mold resin is injected to mold the resin package 3, and at the same time, the punches 8 and 9 are pressed upward and downward to project, and the flat standoff 2b is pressed at the tip of the lead wire 2. Is processed.

【0015】なお、樹脂成形金型6に対し、実施例1で
述べたリード曲げ加工用のポンチ7と、実施例2で述べ
たスタンドオフ加工用のポンチ8,9とを併用し(な
お、この場合には下型側のポンチ9を、スタンドオフ加
工後にリード曲げ加工の邪魔にならない位置に退避させ
る)、金型キャビティへの注型樹脂の注入操作と並行し
てリード線2にスタンドオフ2b,折り曲げ部2aの順
でリード加工を行えば、図3と図4を組み合わせた半導
体装置を同じ工程で製作することができる。
For the resin molding die 6, the lead bending punch 7 described in the first embodiment and the standoff punches 8 and 9 described in the second embodiment are used together (note that In this case, the punch 9 on the lower die side is retracted to a position where it does not interfere with the lead bending after standoff processing), and the standoff to the lead wire 2 is performed in parallel with the injection operation of the casting resin into the mold cavity. By performing lead processing in the order of 2b and the bent portion 2a, a semiconductor device in which FIG. 3 and FIG. 4 are combined can be manufactured in the same process.

【0016】[0016]

【発明の効果】以上述べたように、本発明の製造方法,
製造装置によれば次記の効果が得られる。 (1)リード線のフォーミング、特にリード曲げ加工に
伴う応力が原因で樹脂パッケージとリード線との界面に
剥離,隙間の生じることが回避されるので、これにより
半導体素子の信頼性が大幅に向上する。
As described above, the manufacturing method of the present invention,
According to the manufacturing apparatus, the following effects can be obtained. (1) It is possible to avoid peeling and gaps at the interface between the resin package and the lead wire due to the stress caused by the lead wire forming, especially the lead bending process, and thus the reliability of the semiconductor element is significantly improved. To do.

【0017】(2)樹脂パッケージの成形工程で同時に
リード加工を行うので、生産ラインでの工程数が削減で
きて生産性の合理化が図れる。
(2) Since lead processing is simultaneously performed in the resin package molding step, the number of steps in the production line can be reduced and the productivity can be rationalized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1に対応する製造装置の構成,
並びに製造方法の工程図を示すものであり、(a)は金
型に素子組立体をセットした状態図、(b)は樹脂パッ
ケージの成形途中の状態図、(c)はリード加工の状態
FIG. 1 is a configuration of a manufacturing apparatus corresponding to a first embodiment of the present invention,
And (a) is a state diagram in which an element assembly is set in a mold, (b) is a state diagram during molding of a resin package, and (c) is a lead processing state diagram.

【図2】本発明の実施例2に対応する製造装置の構成図FIG. 2 is a configuration diagram of a manufacturing apparatus corresponding to a second embodiment of the present invention.

【図3】リード線にリード曲げ加工を施したアキシャル
リード形の樹脂封止型半導体素子の構造図であり、
(a)は側断面図、(b)は(a)図の端面図
FIG. 3 is a structural diagram of an axial lead type resin-sealed semiconductor element in which a lead wire is bent.
(A) is a side sectional view, (b) is an end view of (a)

【図4】リード線にスタンドオフを形成したアキシャル
リード形の樹脂封止型半導体素子の構造図であり、
(a)は側面図、(b)は(a)図の端面図
FIG. 4 is a structural diagram of an axial lead type resin-sealed semiconductor element in which a standoff is formed on a lead wire,
(A) is a side view, (b) is an end view of (a)

【符号の説明】[Explanation of symbols]

1 半導体チップ 2 リード線 2a 折り曲げ部 2b スタンドオフ 3 樹脂パッケージ 4 上型 5 下型 6 樹脂成形金型 6a キャビティ 6b ゲート 7 ポンチ(リード曲げ加工用治具) 8,9 ポンチ(スタンドオフ加工用治具) 1 semiconductor chip 2 lead wire 2a bent portion 2b standoff 3 resin package 4 upper mold 5 lower mold 6 resin molding die 6a cavity 6b gate 7 punch (lead bending jig) 8, 9 punch (standoff jig) Ingredient

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】半導体チップと、半導体チップの両端に接
合して軸方向に引出したリード線と、半導体チップの周
域を封止した樹脂パッケージとからなるアキシャルリー
ド形の樹脂封止型半導体素子の製造方法であって、半導
体チップにリード線を接合した組立体を成形金型にセッ
トした状態で、キャビティに注型樹脂を注入する樹脂パ
ッケージの成形と、リード線をフォーミングするリード
加工を並行して行うことを特徴とする樹脂封止型半導体
素子の製造方法。
1. An axial lead type resin-sealed semiconductor element comprising a semiconductor chip, a lead wire joined to both ends of the semiconductor chip and extended in an axial direction, and a resin package sealing the peripheral region of the semiconductor chip. In the manufacturing method of, a semiconductor package in which a lead wire is joined to a semiconductor chip is set in a molding die, and molding of a resin package in which a casting resin is injected into a cavity and lead processing for forming the lead wire are performed in parallel. And a method of manufacturing a resin-sealed semiconductor element.
【請求項2】樹脂成形金型にリード加工用の治具を組み
込んだことを特徴とする請求項1記載の製造方法に用い
る樹脂封止型半導体装置の製造装置。
2. A resin-encapsulated semiconductor device manufacturing apparatus used in the manufacturing method according to claim 1, wherein a jig for lead processing is incorporated in the resin molding die.
【請求項3】請求項2記載の製造装置において、治具が
リード線の曲げ加工用治具であることを特徴とする樹脂
封止型半導体装置の製造装置。
3. The manufacturing apparatus for a resin-sealed semiconductor device according to claim 2, wherein the jig is a jig for bending a lead wire.
【請求項4】請求項2記載の製造装置において、治具が
リード線のスタンドオフ加工用治具であることを特徴と
する樹脂封止型半導体装置の製造装置。
4. The manufacturing apparatus for a resin-sealed semiconductor device according to claim 2, wherein the jig is a lead-off stand-off processing jig.
JP5035877A 1993-02-25 1993-02-25 Method and device for manufacturing resin-encapsulated semiconductor chip Pending JPH06252188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5035877A JPH06252188A (en) 1993-02-25 1993-02-25 Method and device for manufacturing resin-encapsulated semiconductor chip

Publications (1)

Publication Number Publication Date
JPH06252188A true JPH06252188A (en) 1994-09-09

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998008251A1 (en) * 1996-08-20 1998-02-26 Hitachi, Ltd. Semiconductor and method for manufacturing the same
JP2002329827A (en) * 2001-05-02 2002-11-15 Nippon Inter Electronics Corp Forming method for axial lead-type electronic component, metal mold for use therein, and axial lead-type electronic component
JP2006196531A (en) * 2005-01-11 2006-07-27 Denso Corp Apparatus and method for manufacturing sensor
CN102059303A (en) * 2010-10-26 2011-05-18 中国航天科技集团公司第五研究院第五一○研究所 Device for bending lead of element
EP2388123A1 (en) * 2010-05-21 2011-11-23 Cie Automotive, S.A. Method and device for overmolding of metal parts
CN104368730A (en) * 2014-09-25 2015-02-25 江苏海天微电子科技有限公司 Diode bending and shaping tool

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998008251A1 (en) * 1996-08-20 1998-02-26 Hitachi, Ltd. Semiconductor and method for manufacturing the same
JP2002329827A (en) * 2001-05-02 2002-11-15 Nippon Inter Electronics Corp Forming method for axial lead-type electronic component, metal mold for use therein, and axial lead-type electronic component
JP2006196531A (en) * 2005-01-11 2006-07-27 Denso Corp Apparatus and method for manufacturing sensor
JP4507883B2 (en) * 2005-01-11 2010-07-21 株式会社デンソー Sensor manufacturing apparatus and sensor manufacturing method
EP2388123A1 (en) * 2010-05-21 2011-11-23 Cie Automotive, S.A. Method and device for overmolding of metal parts
CN102059303A (en) * 2010-10-26 2011-05-18 中国航天科技集团公司第五研究院第五一○研究所 Device for bending lead of element
CN104368730A (en) * 2014-09-25 2015-02-25 江苏海天微电子科技有限公司 Diode bending and shaping tool

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