JPS5839868Y2 - Resin sealing mold - Google Patents

Resin sealing mold

Info

Publication number
JPS5839868Y2
JPS5839868Y2 JP15737680U JP15737680U JPS5839868Y2 JP S5839868 Y2 JPS5839868 Y2 JP S5839868Y2 JP 15737680 U JP15737680 U JP 15737680U JP 15737680 U JP15737680 U JP 15737680U JP S5839868 Y2 JPS5839868 Y2 JP S5839868Y2
Authority
JP
Japan
Prior art keywords
resin
cull
runner
cavity
gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15737680U
Other languages
Japanese (ja)
Other versions
JPS5781118U (en
Inventor
勝啓 前田
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP15737680U priority Critical patent/JPS5839868Y2/en
Publication of JPS5781118U publication Critical patent/JPS5781118U/ja
Application granted granted Critical
Publication of JPS5839868Y2 publication Critical patent/JPS5839868Y2/en
Expired legal-status Critical Current

Links

Landscapes

  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Details Of Resistors (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Description

【考案の詳細な説明】 本考案は樹脂封止金型の改良に関する。[Detailed explanation of the idea] The present invention relates to improvement of resin sealing molds.

従来公知の樹脂封止方法としてキャスティング、トラン
スファなと種々の方法があって、このうちトランスファ
樹脂封止法は量産性や作業性などの面から半導体装置の
封止方法として一般的に採用されている。
There are various conventional resin encapsulation methods such as casting and transfer, and among these, the transfer resin encapsulation method is generally adopted as a method for encapsulating semiconductor devices due to its mass productivity and workability. There is.

樹脂封止形半導体装置の製造において、リードフレーム
に固定した回路素子や回路素子と外部リードとを接続し
たワイヤ等を樹脂でモールドする工程がある。
In the manufacture of resin-sealed semiconductor devices, there is a step of molding circuit elements fixed to a lead frame, wires connecting the circuit elements and external leads, etc. with resin.

このとき用いられるのが樹脂封止金型(以下金型と略称
する)であって、金型は上型と下型とで形成され、空間
部であるギヤヒ゛ティに、樹脂封止される半導体素子が
内蔵されるように半導体素子に取付けられたリードフレ
ームを挾持する。
What is used at this time is a resin sealing mold (hereinafter abbreviated as the mold), which is formed by an upper mold and a lower mold, and the semiconductor element to be resin-sealed is placed in the gear body, which is a space. The lead frame attached to the semiconductor element is held in such a way that the semiconductor element is incorporated therein.

樹脂封止するには、上型のチャンバに熱硬化性樹脂を入
れ、プランジャを降下させて樹脂を押圧し、下型のカル
に樹脂が入り、予め加熱された金型によって軟化され、
ランナを通って移送され、樹脂が複数のキャビティにゲ
ートから加圧注入される。
To seal with resin, a thermosetting resin is placed in the chamber of the upper mold, the plunger is lowered to press the resin, the resin enters the cull of the lower mold, and is softened by the preheated mold.
Transferred through a runner, resin is injected under pressure into a plurality of cavities through a gate.

その後樹脂が硬化し、上型下型を開いて樹脂封止された
半導体装置を取り出す。
Thereafter, the resin is cured, and the upper and lower molds are opened to take out the resin-sealed semiconductor device.

樹脂封止するときに、樹脂のキャビティに充填される時
間がキャビティによって差異を生ずるとキャビティに早
く充填された樹脂は早く硬化してしまうので、まだ充填
しきらないキャビティのあるうちに硬化の進んだキャビ
ティがあることになり、そのキャビティの樹脂は射出プ
ランジャの保圧が十分に負荷されないまま硬化してしま
う。
When sealing with resin, if the time it takes to fill a cavity with resin differs depending on the cavity, the resin that is filled into the cavity faster will harden earlier, so it may be difficult to cure the resin while there are still cavities that are not completely filled. This means that there is a cavity, and the resin in that cavity hardens without being sufficiently loaded with the holding pressure of the injection plunger.

したがって樹脂中に含まれた気泡はエアベントから除去
しきれないまま残留することになって、このような状態
で樹脂封止された半導体装置は耐湿性が劣るものであっ
て、ばらつきが生じてしまう。
Therefore, the air bubbles contained in the resin remain without being fully removed from the air vent, and semiconductor devices sealed with resin in this state have poor moisture resistance, resulting in variations. .

このように多数の半導体装置を樹脂封止するとき、その
何れもが同じように樹脂封止されな(子ればばらつきを
生じ、前記のような不具合を゛起こすので、そのような
不具合を防止するために種々の対策がとられている。
When a large number of semiconductor devices are encapsulated with resin in this way, if they are not encapsulated in the same way, there will be variations and the above-mentioned problems will occur, so it is necessary to prevent such problems. Various measures are being taken to do so.

たとえば樹脂が移送されるランナの断面形状を一定にし
て、ランナの流路長をできるだけ等しくなるようにスプ
ルーを形成して分岐ランナを設けた金型にしたり、又、
ランナにつなか゛るサブランナの方向をランナの延ひ゛
る方向に対し鈍角にして樹脂のキャビティへの流入をよ
くする金型にしたりなど種々の形状の金型が考案されて
いる。
For example, the cross-sectional shape of the runner through which the resin is transferred is made constant, and the sprue is formed so that the length of the flow path of the runner is as equal as possible, so that the mold is equipped with a branch runner.
Various types of molds have been devised, such as molds in which the direction of the sub-runner connected to the runner is at an obtuse angle with respect to the extending direction of the runner to improve the flow of resin into the cavity.

しかしながら前者の場合は、ランナの長さが長くなるの
で射出圧を高くしなければならず、そのため製品にはり
がでやすく、さらにスプルーを設けたので金型の構造が
複雑となり経済的でない。
However, in the former case, the length of the runner becomes longer, so the injection pressure must be increased, which makes the product more likely to be glued, and since the sprue is provided, the structure of the mold becomes complicated, which is not economical.

又、後者の場合は、ランナをはさんだ両側のキャビティ
間の樹脂充填時間のばらつきは少なくなるが、カルから
の充填時間のばらつきは依然残るものであって、各キャ
ビティへの樹脂充填時間の一様性は未だ得られない。
In the latter case, the variation in resin filling time between the cavities on both sides of the runner will be reduced, but the variation in the filling time from the cull will still remain, and the resin filling time for each cavity will be uniform. The condition is still not available.

このように何れにしてもそれぞれのキャビティへの樹脂
充填時間を一定にすることはむつかしく、樹脂封止され
た半導体装置の特性にばらつきが生じ、電気特性を劣化
させ、半導体装置として不良となってしまうものも生ず
るという欠点があった。
In any case, it is difficult to keep the resin filling time constant for each cavity, which causes variations in the characteristics of the resin-sealed semiconductor device, deteriorates the electrical characteristics, and makes the semiconductor device defective. There was a drawback that some things were put away.

本考案はこれらの欠点を除去するためになされたもので
あって、それぞれのキャビティに樹脂をほぼ同時に充填
し終るように金型の形状を改良して樹脂封止品の品質向
上をはかり、また安価に樹脂封止することのできる金型
を提供するものである。
The present invention was developed to eliminate these drawbacks, and improves the quality of resin-sealed products by improving the shape of the mold so that each cavity is filled with resin almost simultaneously. The purpose of the present invention is to provide a mold that can be resin-sealed at low cost.

以下本考案の実施例を図面を参照して説明する。Embodiments of the present invention will be described below with reference to the drawings.

第1図は本考案の金型の下型を示す。1は樹脂の入れら
れるカルにして、カル1から樹脂が流れて行く複数のラ
ンナ2がカル1を中心にして対称的に形成され(本図で
は4本)、それぞれのランナ2に複数のキャビティ3か
らなる樹脂封止部が形成されている。
FIG. 1 shows the lower mold of the mold of the present invention. 1 is a cull into which the resin is placed, and a plurality of runners 2 through which the resin flows from the cull 1 are formed symmetrically around the cull 1 (four in this figure), and each runner 2 has a plurality of cavities. A resin sealing portion consisting of 3 is formed.

すなわちこの樹脂封止部は各ランナ2の両側に一対のキ
ャビティ3,3を対向させて形成し、この一対のキャビ
ティ3,3をランナ2の一部を介して離間配設した構造
に形成されている。
That is, this resin sealing part is formed with a pair of cavities 3, 3 facing each other on both sides of each runner 2, and a structure in which the pair of cavities 3, 3 are spaced apart with a part of the runner 2 interposed therebetween. ing.

なお上記カルから対称的に形成される4本のランナは最
も近いキャビティ3まではそれぞれ同一断面積同一長さ
に形成されている。
The four runners formed symmetrically from the cull have the same cross-sectional area and the same length up to the nearest cavity 3.

このように形成されたランナ2の溝幅は一定にして、溝
深さはカル1から遠のくにしたがって浅くなるように形
成されている。
The groove width of the runner 2 thus formed is constant, and the groove depth is formed to become shallower as the distance from the cull 1 increases.

すなわち第1図のランナの最初のキャビティの入口附近
aがら溝が浅くなりはヒめランナの終点すに至るまで一
定の割合と浅くなっている。
That is, the groove becomes shallow near the entrance of the first cavity of the runner in FIG. 1, and continues to become shallower at a constant rate until it reaches the end point of the runner.

第2図に概略を示す。他の3つのランナも同様である。An outline is shown in Figure 2. The same goes for the other three runners.

又、ランナ2に接続されて形成されているキャビティ3
の入口にあたる部分のゲート4はその長さと深さとはカ
ルに近いものも遠いものも同にであるが、ゲート幅、す
なわち樹脂がランナ中を流れる方向と直角方向の幅はカ
ルに近いものよりカルに遠いものの方が大きく形成され
ている。
Also, a cavity 3 formed connected to the runner 2
The length and depth of the gate 4 at the entrance of the runner are the same whether it is near or far from the cull, but the gate width, that is, the width in the direction perpendicular to the direction in which the resin flows through the runner, is larger than that near the cull. Those farther away from Cal are formed larger.

第1図のCの幅がdの幅よりも小さいものである。The width of C in FIG. 1 is smaller than the width of d.

他の3つのランナにおけるゲート幅についても同様で゛
ある。
The same holds true for the gate widths of the other three runners.

ランナとゲートとが上記のように形e、されているので
樹脂が軟化してプランジャで押し出され、カルからラン
ナ、ゲートを経てキャビティに充填されるとき、樹脂が
ランナを流れているとき一部はゲートを経てキャビティ
に入り込むので、従来はランナの断面が一様であったた
め樹脂の流動速度はカルから離れるにしたがって遅くな
ったが、本考案では深さをカルから遠のくにしたがって
浅くしたので、樹脂の流動速度がカルから離れるにした
がって速くなり、かつゲート幅がカルから遠いキャビテ
ィのゲートはど大きくしであるので、樹脂のキャビティ
への流入が容易となって、それぞれのキャビティへ樹脂
が充填し終るまでの樹脂充填時間を一定にすることがで
きるものである。
Since the runner and gate are shaped as shown above, when the resin is softened and pushed out by the plunger and filled into the cavity from the cull through the runner and gate, a portion of the resin flows through the runner. enters the cavity through the gate. Conventionally, the cross section of the runner was uniform, so the flow rate of the resin slowed down as it moved away from the cull, but in this invention, the depth became shallower as it moved away from the cull. The flow rate of the resin increases as it moves away from the cull, and the gate width of the cavity that is far from the cull is larger, making it easier for resin to flow into the cavities and filling each cavity with resin. This makes it possible to keep the resin filling time constant until the resin filling is completed.

このように本考案の金型を用いると、樹脂がほぼ同時に
全てのキャビティに充填し終り、樹脂封止されたたとえ
ば半導体装置にはミクロボイドの発生が少なく、樹脂に
対する射出圧や硬化するまでに負荷される保圧が均一化
されるので、樹脂内の気泡が脱泡され易く、製品特性を
ばらつきなく向上させることができる。
In this way, when the mold of the present invention is used, the resin fills all the cavities almost simultaneously, and there are fewer microvoids in resin-sealed semiconductor devices, for example. Since the holding pressure applied is uniform, air bubbles in the resin are easily defoamed, and product characteristics can be improved without variation.

又、金型の加工も容易であって、ランナの長さを特別長
くすることもないので使用される樹脂のむだをはぶくこ
とも出来て、経済的である。
Furthermore, the mold is easy to process, and the length of the runner does not have to be particularly long, so the resin used can be used to eliminate waste, making it economical.

なお、上記図示したものばかりでなく、本考案の要旨に
従って、ランナの断面形状については、深さでなく、幅
を一定の割合で狭くしてもよく、又、ゲートも幅だけで
なく、長さもカルから遠いものほど変動させて断面積を
大きくしてもよい。
In addition to what is shown in the drawings above, in accordance with the gist of the present invention, the cross-sectional shape of the runner may be narrowed not only in depth but also in width at a certain rate, and the gate may also be narrowed not only in width but also in length. Alternatively, the cross-sectional area may be increased by varying the distance from the cull.

以上は樹脂封止形半導体装置を例にして説明したが、こ
れに限ることなく、他の樹脂封止品についても適用され
ることはいうまでもなく、又、金型も図示したものばか
りでなく、本考案の要旨にしたがって、変形構造のもの
が得られること勿論である。
The above explanation has been made using a resin-sealed semiconductor device as an example, but it goes without saying that the application is not limited to this and can also be applied to other resin-sealed products, and the molds are not limited to those shown. Of course, a modified structure can be obtained according to the gist of the present invention.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案のl実施例の平面図、第2図は第1図の
ランナをA−A線によって切断して示す断面図である。 1・・・・・・カル、2・・・・・・ランナ、3・・・
・・・キャビティ、4・・・・・・ゲート。
FIG. 1 is a plan view of an embodiment of the present invention, and FIG. 2 is a cross-sectional view of the runner shown in FIG. 1 taken along line A--A. 1... Cal, 2... Runner, 3...
...Cavity, 4...Gate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] カルと、このカルを中心にして対称的に上記カルから延
在する複数のランナと、上記複数のランナ上にそれぞれ
上記ランナの一部およびゲートを介して形成された複数
のキャビティからなる樹脂封止部とを具備し、上記カル
とこのカルに最も近いキャビティとの間の各ランナは同
一断面積同一長さに形成され、上記各ランナ上の複数の
キャビティ間のランナについてはその深さが上記カルに
近いキャビティからつぎのキャビティに向うに従って浅
くなり、上記ゲートについてはその幅が上記カルに近い
キャビティのゲートより上記カルから遠いキャビティの
ゲートの方が広く形成されていることを特徴とする樹脂
封止金型。
A resin seal consisting of a cull, a plurality of runners extending symmetrically from the cull around the cull, and a plurality of cavities formed on the plurality of runners through a part of the runner and a gate, respectively. each runner between the cull and the cavity closest to the cull is formed to have the same cross-sectional area and the same length, and the runner between the plurality of cavities on each runner has a depth. The cavity is shallower from the cavity closest to the cull to the next cavity, and the width of the gate is wider in the cavity farther from the cull than in the gate closer to the cull. Resin sealing mold.
JP15737680U 1980-11-05 1980-11-05 Resin sealing mold Expired JPS5839868Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15737680U JPS5839868Y2 (en) 1980-11-05 1980-11-05 Resin sealing mold

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15737680U JPS5839868Y2 (en) 1980-11-05 1980-11-05 Resin sealing mold

Publications (2)

Publication Number Publication Date
JPS5781118U JPS5781118U (en) 1982-05-19
JPS5839868Y2 true JPS5839868Y2 (en) 1983-09-08

Family

ID=29516492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15737680U Expired JPS5839868Y2 (en) 1980-11-05 1980-11-05 Resin sealing mold

Country Status (1)

Country Link
JP (1) JPS5839868Y2 (en)

Also Published As

Publication number Publication date
JPS5781118U (en) 1982-05-19

Similar Documents

Publication Publication Date Title
JPH04147814A (en) Mold for resin seal molding
JPH0575565B2 (en)
JP3411448B2 (en) Resin sealing mold for semiconductor element and method for manufacturing semiconductor device
JP3727446B2 (en) Resin sealing mold for semiconductor devices
JPS5839868Y2 (en) Resin sealing mold
US6428731B1 (en) Mould part, mould and method for encapsulating electronic components mounted on a carrier
US6696006B2 (en) Mold for flashless injection molding to encapsulate an integrated circuit chip
JP2786197B2 (en) Method for manufacturing semiconductor device
JP2834257B2 (en) Semiconductor device manufacturing method and molding device
JP2598988B2 (en) Resin sealing molding method for electronic parts
JPS6124241A (en) Resin sealing metallic mold of semiconductor device
JPH05175396A (en) Lead frame and molding method
JP2675644B2 (en) Resin mold equipment for semiconductor devices
JPH0629338A (en) Resin sealing die for manufacturing semiconductor device and manufacturing method for the device using same
JP2973901B2 (en) Mold for semiconductor resin sealing
JPS6154633A (en) Metal mold for semiconductor resin sealing
JP2742638B2 (en) Resin sealing molds for semiconductor devices
JPS62125635A (en) Resin-sealed method for resin-sealed semiconductor device
JP2665668B2 (en) Resin encapsulation molding method for electronic parts and mold for resin encapsulation molding
JPS60182141A (en) Molding mold
JPH08156029A (en) Manufacture of semiconductor package, film used therefor, and its mold
JPH0356338Y2 (en)
JP2587539B2 (en) Mold for resin sealing of semiconductor device
JPS6276727A (en) Manufacture of resin-sealed semiconductor device and transfer injection mold using thereof
JPH0687468B2 (en) Method for manufacturing semiconductor device