JPS6237325B2 - - Google Patents
Info
- Publication number
- JPS6237325B2 JPS6237325B2 JP20426081A JP20426081A JPS6237325B2 JP S6237325 B2 JPS6237325 B2 JP S6237325B2 JP 20426081 A JP20426081 A JP 20426081A JP 20426081 A JP20426081 A JP 20426081A JP S6237325 B2 JPS6237325 B2 JP S6237325B2
- Authority
- JP
- Japan
- Prior art keywords
- measured
- hologram
- rotation center
- interference fringe
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 9
- 238000001228 spectrum Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000004907 flux Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 230000035559 beat frequency Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Automatic Control Of Machine Tools (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20426081A JPS58105006A (ja) | 1981-12-17 | 1981-12-17 | 回転物体の回転中心位置検出方法 |
| US06/424,629 US4529310A (en) | 1981-12-17 | 1982-09-27 | Device for detection of center of rotation of rotating object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20426081A JPS58105006A (ja) | 1981-12-17 | 1981-12-17 | 回転物体の回転中心位置検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58105006A JPS58105006A (ja) | 1983-06-22 |
| JPS6237325B2 true JPS6237325B2 (enrdf_load_stackoverflow) | 1987-08-12 |
Family
ID=16487510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20426081A Granted JPS58105006A (ja) | 1981-12-17 | 1981-12-17 | 回転物体の回転中心位置検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58105006A (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0629701B2 (ja) * | 1983-07-08 | 1994-04-20 | 新技術事業団 | 非接触直径測定方法及び装置 |
| JPS61159104A (ja) * | 1984-12-29 | 1986-07-18 | Omron Tateisi Electronics Co | 回転中心検出装置 |
-
1981
- 1981-12-17 JP JP20426081A patent/JPS58105006A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58105006A (ja) | 1983-06-22 |
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