JPS6235544A - Resin-sealed semiconductor device - Google Patents
Resin-sealed semiconductor deviceInfo
- Publication number
- JPS6235544A JPS6235544A JP17449185A JP17449185A JPS6235544A JP S6235544 A JPS6235544 A JP S6235544A JP 17449185 A JP17449185 A JP 17449185A JP 17449185 A JP17449185 A JP 17449185A JP S6235544 A JPS6235544 A JP S6235544A
- Authority
- JP
- Japan
- Prior art keywords
- case
- gas
- resin
- outer case
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は樹脂封止形半導体装置に関するものである。[Detailed description of the invention] [Industrial application field] The present invention relates to a resin-sealed semiconductor device.
第3図に従来のタイプの′シ極端子一体成型の外装ケー
スを用いた樹脂封止形半導体装置の斜視図を示す。また
第4図に第3図のIV−f’/線での断面ρ)らの内部
構造を示した断面斜視図である。FIG. 3 shows a perspective view of a resin-sealed semiconductor device using a conventional type outer case integrally molded with a terminal. Further, FIG. 4 is a cross-sectional perspective view showing the internal structure of the cross section ρ) taken along line IV-f'/ in FIG. 3.
両図で、(1)は半導体チップ、(2)はアルミニウム
ワイヤ、(3)はS字形ベンドが施され、後述のケース
と一体成型された電極端子で、(4a)は外装ケース。In both figures, (1) is the semiconductor chip, (2) is the aluminum wire, (3) is the electrode terminal with an S-shaped bend and integrally molded with the case, which will be described later, and (4a) is the outer case.
(5)はモジュール本体を形成する支持板、(6)は封
止樹脂、(7)は半導体ナツプ(1)及びアルミワイヤ
(2)を保護するためのゲルである。(5) is a support plate forming the module body, (6) is a sealing resin, and (7) is a gel for protecting the semiconductor nap (1) and aluminum wire (2).
この例の半導体装置モジュールの組立の順序を簡単に説
明する。まず、支持板上の半導体チップ(1)がろう付
けされる。さらに、この半導体チップ(1)と支持板(
5)上に形成された配線パター7とがアルミワイヤ(2
)で、ワイヤボンド゛により接、絖される。The order of assembly of the semiconductor device module in this example will be briefly explained. First, the semiconductor chip (1) on the support plate is brazed. Furthermore, this semiconductor chip (1) and the support plate (
5) The wiring pattern 7 formed on the aluminum wire (2
) and are connected and bonded with wire bonds.
このあと、電極端子(3)を一体成型した外装ケース(
4a)が、J極とケースか同時に支持板(5)とろう付
接着される。After this, the exterior case (
4a), the J pole and the case are simultaneously brazed and bonded to the support plate (5).
そしてi&後にケース(4&)の上面の開口部からアル
ミワイヤ(2)保護のためのゲル(7)が圧入さn、ゲ
ル(7) CD fl化ののら、樹脂(6)か圧入され
る。After that, the gel (7) for protecting the aluminum wire (2) is press-fitted from the opening on the top of the case (4&), and after the gel (7) is turned into a CD, the resin (6) is press-fitted. .
〔づ6明が解決しようとする問題点〕
上で述べたように樹脂は通常ケース中央部にもつけられ
た開口部から圧入され1周辺部へと広かってゆ(か、外
装ケースが薄形の場合や、特に、′4極端子を薄形ケー
スIこ一体成型した場合は、従来の四角形の開口部では
、ケースの周辺部や、ケースの側面部とt極端子の間の
部分(第1図にAで示す)は閉空間となりやすく樹脂圧
入時も空気がたまったままとなりやすい。[Problems that Zu6mei aims to solve] As mentioned above, the resin is usually press-fitted through an opening in the center of the case and spreads to the periphery (or if the outer case is thin). In this case, or especially when the 4-pole terminal is integrally molded with the thin case I, the conventional rectangular opening does not cover the periphery of the case or the part between the side surface of the case and the t-pole terminal (the (indicated by A in Figure 1) tends to become a closed space, and air tends to remain trapped even when resin is press-fitted.
ぼた、胡脂加熱硬化時着こ発生するガスもこのようP部
分にたまりやすい0このような状態を第5図に上把へ部
の断面図で示し、(8)が貯留気体である。The gas generated during heating and curing of pepper and sesame oil also tends to accumulate in the P part. This state is shown in FIG. 5 as a sectional view of the upper part, and (8) is the stored gas.
このような状態で加熱し樹脂を硬化させると。If you heat the resin in this condition to harden it.
たまったままの空気の膨張や、ガスのさらなる発生で、
ついには加熱中にガス空気がケースの内面をつたわり、
ケースの開口部に達し外にふき出すこの結果封止樹脂の
表面には気体を生じ、外観上も信頼性上も大きな間頌を
生じていた。Due to the expansion of the accumulated air and the further generation of gas,
Finally, during heating, gas air flows through the inner surface of the case,
As a result of this gas reaching the opening of the case and blowing out, gas is generated on the surface of the sealing resin, causing major problems in terms of appearance and reliability.
この発明はl:記の問題点を解消する1こめになされた
もので、止述のようfj空気、ガスの貯留を1よ(し、
信頼性の向上及び外観不良不の低減を達成できる半導体
装置を得ることを目的とする。This invention was made in order to solve the problems mentioned above, and as mentioned above, the fj air and gas storage is
An object of the present invention is to obtain a semiconductor device that can improve reliability and reduce appearance defects.
この発明曇こ係る半導体装置は外装ケースの上面の開口
部の周縁部番こ、ケースと一体成型されたシ極1r支障
か1工い範囲で気体抜き用切欠き部を設けたものである
。In the semiconductor device according to the present invention, a gas venting notch is provided at the periphery of the opening on the upper surface of the outer case, within a range of one part that interferes with the shield 1r integrally molded with the case.
この発明では、外装ケースの上前の開口部の周4縁部に
気体抜き用切欠き部を設けたので、開口部からの樹脂圧
入時の空気の抜けがよく、汁だ、樹脂硬化時の発生ガス
も開口部からすみやかに外部へ逃げ、封止4を脂の表面
部に気泡を発生することはf: (、外観上の不良も少
なくなり、信頼性も向上する。In this invention, gas venting notches are provided on the four edges of the opening at the top of the front of the exterior case, so air can escape easily when the resin is press-fitted from the opening, and fluids can be removed when the resin hardens. The generated gas also quickly escapes from the opening to the outside, and the generation of bubbles on the surface of the seal 4 reduces defects in appearance and improves reliability.
第1図はこの発明の一実施例を示す斜視図、第2図は第
1図のIf−ffI線での断面からの内部構造を示した
Wr面斜視図で、前述の第3図、第4図の従来例と同一
符号は同等部分を示し、その重複説明は避ける。FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a perspective view from the Wr plane showing the internal structure taken along the line If-ffI in FIG. 1, and FIG. The same reference numerals as those in the conventional example shown in FIG. 4 indicate equivalent parts, and redundant explanation thereof will be avoided.
この]4施例における外装ケース(4b)ではその上面
の開口部の周縁部に、このケース(4b)と一体数型さ
れた電極(3)の位置は避けて、電極(3)相互間の中
間部位に気体抜き月切ノ(き部(9)が設けられている
。In the exterior case (4b) in Example 4, the electrodes (3), which are integrated with the case (4b), are placed on the periphery of the opening on the top surface, avoiding the position of the electrodes (3), and between the electrodes (3). A gas venting hole (9) is provided in the middle part.
従って、従来この部分近傍に貯留し易かった気体はこの
切入き部(9)を通っ゛C外部へ逃げ、外装ケース(4
b)の上部開口部の周縁部に気体の貯留することはなく
なり、気体の封止樹脂表面・\の吹き出しによる外観の
不良の発生、更には、これに伴なう信頼性の低下を防ぐ
ことができる。Therefore, the gas that conventionally was easily stored near this part escapes to the outside of the case (4) through this cutout (9).
b) Gas will no longer accumulate around the periphery of the upper opening, thereby preventing appearance defects due to gas blowing out on the sealing resin surface and the resulting deterioration in reliability. Can be done.
なお、上記実施例では電極端子一体数型形外装ケースを
用いた場合について説明したが、薄形外装ケースを用い
7:場合についてもこの発明は適用して同様の効果が期
待できる。In the above embodiment, a case was explained in which an external case with several electrode terminals was used, but the present invention can also be applied to the case where a thin external case is used, and similar effects can be expected.
以上のよう4こ、この発明によれば、樹脂封止形半導体
装置の外装ケースの上面の開口部の周縁部に気体抜き用
切欠き部を設けたので、外装ケース上部周縁部に気体の
貯留することが少なくなり、よって、これらの気体の吹
出しによる外観不良の発生が減少し、半導体装置の信頼
性は向上する。As described above, according to the present invention, a gas venting notch is provided at the periphery of the opening on the upper surface of the outer case of a resin-sealed semiconductor device, so that gas is not stored in the upper periphery of the outer case. Therefore, the occurrence of appearance defects due to the blowing of these gases is reduced, and the reliability of the semiconductor device is improved.
【図面の簡単な説明】
第1図はこの発明の一実施例の外形を示す斜視図、第2
図は第1図の■−■線から見た断面斜視図、第3図は従
来の樹脂封止形半導体装置の外形を示T科視図、第4図
は第3図の■−■線から見た断面斜視図、第5図は従来
装置における気体の貯留状況を示す部分断面図である。
図に2いて、〔1)は半導体チップ、(3)はIE電極
端子(4b)は外装ケース、(6)は封止樹脂、(9)
は気体抜き用切欠きである。
なお、図中同一符号は同一、または相当部分を示す。
第1図
第2図
! 半導)本+し7゜
3、電極鳴子
46θ 、クト戚 リーー又
6、封且#f脂
デ、 り(イ本4才むぎ片91z)欠き都第3図
第4図
第5図[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is a perspective view showing the outline of an embodiment of the present invention;
The figure is a cross-sectional perspective view taken from the line ■-■ in Fig. 1, Fig. 3 is a perspective view showing the external appearance of a conventional resin-sealed semiconductor device, and Fig. 4 is a perspective view taken from the line ■-■ in Fig. 3. FIG. 5 is a partial cross-sectional view showing the state of gas storage in the conventional device. In Figure 2, [1] is the semiconductor chip, (3) is the IE electrode terminal (4b) is the outer case, (6) is the sealing resin, (9)
is a gas vent notch. Note that the same reference numerals in the figures indicate the same or equivalent parts. Figure 1 Figure 2! Semiconductor) book + 7゜3, electrode clapper 46θ, actuator lee again 6, seal #f fat de, ri (I book 4 years old barley piece 91z) missing capital Fig. 3 Fig. 4 Fig. 5
Claims (3)
チップを配置し、上記外装ケース内に樹脂を圧入して、
上記半導体チップを樹脂封止してなるものにおいて、上
記外装ケースの上記開口部の周縁部に気体抜き用切欠き
を設けたことを特徴とする樹脂封止形半導体装置。(1) A semiconductor chip is placed inside an outer case having an opening at the top, and a resin is press-fitted into the outer case,
A resin-sealed semiconductor device comprising the semiconductor chip sealed with a resin, wherein a gas venting notch is provided at a peripheral edge of the opening of the outer case.
気体抜き用切欠きは上記電極端子に支障のない部分に設
けたことを特徴とする特許請求の範囲第1項記載の樹脂
封止形半導体装置。(2) The external case has electrode terminals integrally molded,
2. The resin-sealed semiconductor device according to claim 1, wherein the gas venting notch is provided in a portion that does not interfere with the electrode terminal.
する特許請求の範囲第1項記載の樹脂封止形半導体装置
。(3) The resin-sealed semiconductor device according to claim 1, wherein the outer case is a thin outer case.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60174491A JPH063830B2 (en) | 1985-08-08 | 1985-08-08 | Resin-sealed semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60174491A JPH063830B2 (en) | 1985-08-08 | 1985-08-08 | Resin-sealed semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6235544A true JPS6235544A (en) | 1987-02-16 |
JPH063830B2 JPH063830B2 (en) | 1994-01-12 |
Family
ID=15979416
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60174491A Expired - Lifetime JPH063830B2 (en) | 1985-08-08 | 1985-08-08 | Resin-sealed semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH063830B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110800105A (en) * | 2017-07-03 | 2020-02-14 | 三菱电机株式会社 | Semiconductor device with a plurality of semiconductor chips |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5311965U (en) * | 1976-07-12 | 1978-01-31 |
-
1985
- 1985-08-08 JP JP60174491A patent/JPH063830B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5311965U (en) * | 1976-07-12 | 1978-01-31 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110800105A (en) * | 2017-07-03 | 2020-02-14 | 三菱电机株式会社 | Semiconductor device with a plurality of semiconductor chips |
Also Published As
Publication number | Publication date |
---|---|
JPH063830B2 (en) | 1994-01-12 |
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