JPS6235274A - 回路基板検査用アダプタのピン挿入装置 - Google Patents

回路基板検査用アダプタのピン挿入装置

Info

Publication number
JPS6235274A
JPS6235274A JP17488885A JP17488885A JPS6235274A JP S6235274 A JPS6235274 A JP S6235274A JP 17488885 A JP17488885 A JP 17488885A JP 17488885 A JP17488885 A JP 17488885A JP S6235274 A JPS6235274 A JP S6235274A
Authority
JP
Japan
Prior art keywords
adapter
pin
circuit board
hole
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17488885A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0548868B2 (enrdf_load_stackoverflow
Inventor
Takeshi Hattori
武司 服部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP17488885A priority Critical patent/JPS6235274A/ja
Publication of JPS6235274A publication Critical patent/JPS6235274A/ja
Publication of JPH0548868B2 publication Critical patent/JPH0548868B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP17488885A 1985-08-08 1985-08-08 回路基板検査用アダプタのピン挿入装置 Granted JPS6235274A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17488885A JPS6235274A (ja) 1985-08-08 1985-08-08 回路基板検査用アダプタのピン挿入装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17488885A JPS6235274A (ja) 1985-08-08 1985-08-08 回路基板検査用アダプタのピン挿入装置

Publications (2)

Publication Number Publication Date
JPS6235274A true JPS6235274A (ja) 1987-02-16
JPH0548868B2 JPH0548868B2 (enrdf_load_stackoverflow) 1993-07-22

Family

ID=15986422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17488885A Granted JPS6235274A (ja) 1985-08-08 1985-08-08 回路基板検査用アダプタのピン挿入装置

Country Status (1)

Country Link
JP (1) JPS6235274A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11191698A (ja) * 1997-10-21 1999-07-13 Kazuaki Yamashita ピン装填装置、ピン供給装置、ピンかしめ装置、基板離脱装置およびこれらを備えた基板組立装置
CN105101666A (zh) * 2015-08-21 2015-11-25 苏州斯卡柏通讯技术有限公司 一种贴片机夹紧装置
CN105537894A (zh) * 2015-12-05 2016-05-04 芜湖山野电器有限公司 一种电动车充电站安装用小车

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114777A (ja) * 1982-11-05 1985-06-21 マルテイン マールツエル 印刷配線基板検査用装置及びその使用方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114777A (ja) * 1982-11-05 1985-06-21 マルテイン マールツエル 印刷配線基板検査用装置及びその使用方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11191698A (ja) * 1997-10-21 1999-07-13 Kazuaki Yamashita ピン装填装置、ピン供給装置、ピンかしめ装置、基板離脱装置およびこれらを備えた基板組立装置
CN105101666A (zh) * 2015-08-21 2015-11-25 苏州斯卡柏通讯技术有限公司 一种贴片机夹紧装置
CN105537894A (zh) * 2015-12-05 2016-05-04 芜湖山野电器有限公司 一种电动车充电站安装用小车

Also Published As

Publication number Publication date
JPH0548868B2 (enrdf_load_stackoverflow) 1993-07-22

Similar Documents

Publication Publication Date Title
JP2889781B2 (ja) 自動テストハンドラー用コンタクトアセンブリー
US9417263B2 (en) Testing probe head for wafer level testing, and test probe card
US6586954B2 (en) Probe tile for probing semiconductor wafer
JPS60114777A (ja) 印刷配線基板検査用装置及びその使用方法
EP0141747A1 (en) Adaptor for automatic testing equipment and method
JPH022547B2 (enrdf_load_stackoverflow)
US7424775B2 (en) Captive wired test fixture
JPH0526957A (ja) 電子部品コンタクトアセンブリおよびその接続方法
US20080204059A1 (en) Probe Tile for Probing Semiconductor Wafer
US4700132A (en) Integrated circuit test site
DK0807258T3 (da) Prøveindretning til elektroniske plane moduler
TW201843462A (zh) 檢查治具以及基板檢查裝置
JP4216482B2 (ja) 間隔が密なテスト部位のための走査式試験機
US5682675A (en) Apparatus and method of mounting electronic components
JPS6235274A (ja) 回路基板検査用アダプタのピン挿入装置
US11067601B2 (en) High accuracy electrical test interconnection device and method for electrical circuit board testing
EP1022573A2 (en) Scan test machine for densely spaced test sites
ATE34621T1 (de) Adapter fuer ein leiterplattenpruefgeraet.
EP0989409A1 (en) Scan test machine for densely spaced test sites
JPH02262918A (ja) 部品の整列取出し装置
JPH085503A (ja) 振動試験装置
WO1999049325A1 (en) Automatic fixture building for electrical testing
US3711924A (en) Gravity-fed pin insertion device
JPH0645905Y2 (ja) X―yユニットを有する回路基板検査装置
JPH01213181A (ja) 素子収納用トレイ