JPS6229902B2 - - Google Patents

Info

Publication number
JPS6229902B2
JPS6229902B2 JP57126115A JP12611582A JPS6229902B2 JP S6229902 B2 JPS6229902 B2 JP S6229902B2 JP 57126115 A JP57126115 A JP 57126115A JP 12611582 A JP12611582 A JP 12611582A JP S6229902 B2 JPS6229902 B2 JP S6229902B2
Authority
JP
Japan
Prior art keywords
chute
semiconductor devices
row
air cylinder
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57126115A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5917257A (ja
Inventor
Shigeki Takeo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57126115A priority Critical patent/JPS5917257A/ja
Publication of JPS5917257A publication Critical patent/JPS5917257A/ja
Publication of JPS6229902B2 publication Critical patent/JPS6229902B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00—

Landscapes

  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP57126115A 1982-07-20 1982-07-20 固定シユ−ト装置 Granted JPS5917257A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57126115A JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57126115A JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Publications (2)

Publication Number Publication Date
JPS5917257A JPS5917257A (ja) 1984-01-28
JPS6229902B2 true JPS6229902B2 (OSRAM) 1987-06-29

Family

ID=14927002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57126115A Granted JPS5917257A (ja) 1982-07-20 1982-07-20 固定シユ−ト装置

Country Status (1)

Country Link
JP (1) JPS5917257A (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS619898U (ja) * 1984-06-25 1986-01-21 富士通株式会社 半導体装置の傾斜落下式自動送り装置

Also Published As

Publication number Publication date
JPS5917257A (ja) 1984-01-28

Similar Documents

Publication Publication Date Title
US20230228814A1 (en) Device testing architecture, method, and system
JP2604606B2 (ja) 回路試験装置
EP1364436A4 (en) METHOD AND APPARATUS FOR DIAGNOSING FAILURES IN AN INTEGRATED CIRCUIT USING INTEGRATED TROUBLESHOOTING TECHNIQUES
CA2079286A1 (en) Partial-scan built-in self-test technique
JPS6229902B2 (OSRAM)
JPS6227541B2 (OSRAM)
JPS628938B2 (OSRAM)
JPS5666768A (en) Tool for in-circuit tester
US5566186A (en) Test control device
JPS58168247A (ja) 選別シュ−ト装置
US7900107B2 (en) High speed ATPG testing circuit and method
JP2665952B2 (ja) 自動プルテスト装置
Mo et al. A self-diagnostic BIST memory design scheme
Arnold et al. Evaluating ATE-equipment for volume diagnosis
JPS5673354A (en) Testing device for ic
JPS6250265A (ja) 索道握索機の主ばね不良検出方法
Boswell et al. Design of programmable logic arrays for parallel testing.
JPS58168249A (ja) 半導体装置用試験装置
JP2509632Y2 (ja) Ｉｃ試験用搬送装置
JPH0717026Y2 (ja) Ｉｃ試験装置
JPH0399450A (ja) 半導体試験装置
JPS57151874A (en) Testing device for logic circuit
PL67847B1 (OSRAM)
JPS58129274A (ja) Ｌｓｉの試験方式
JPS60149198A (ja) チツプの極性等検測整列装置