JPS62294986A - Apparatus for preparing inspection data - Google Patents

Abstract

PURPOSE:To reduce the processing time, by providing an extracting condition reading means for reading and memorizing extracting conditions for inspection data to be extracted from the results of logical simulation and means for reading the results of logical simulation. CONSTITUTION:First, extracting conditions prepared are read out with an extracting conditions reading routine 5 to register a name of signal to be extracted on a list 6 of signals being extracted, requirement to meet extracting conditions on an extracting conditions table 7 and the signal name entered into the extracting conditions on a list 8 of extracting conditions signals. Then, the name and value of a signal are read with a routine 9 for reading the results of logical simulation and the signal values are stored together into a signal value table 10 for a fixed time when the signal name is determined to belong to the list 6 of signals being extracted or the list 8 of extracting conditions signals. When the meeting of the extracting conditions is judged, a data extraction routine 12 is used to determine extraction time for each signal entered on the list 6 of signals being extracted and at the time thus obtained the signal value is read out from the signal value table 10 to be outputted as inspection data.

Description

[Detailed Description of the Invention] 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a method for creating test data for logic circuits, and in particular for creating functional test data for large-scale logic circuits. The present invention relates to an inspection data creation device suitable for.

[Conventional technology]

The way to check the validity of a logic circuit is to eliminate design defects,
This is carried out in two stages: and removal of manufacturing defects. Figure 1 shows the flow of the conventional method from logic design to inspection data creation. To eliminate design defects, a logic simulator is used in one stage, input data is given, and the circuit is created by software.
This is done by operating 1M and checking whether the output value obtained as a result is appropriate. After the logic verification has been completed, the logic is mounted and manufactured, and inspection data to be provided to the inspection equipment is created in order to eliminate manufacturing defects. The test data referred to here refers to the input value applied from the test device to the logic circuit under test, and the output period when the input value is applied. This is the I value.

As shown in Figure 1, the conventional method of creating inspection data is to make a failure assumption for each component bin based on logical information, and to make a assumption that there will be a significant difference in the output value between when a failure exists and when there is no failure. The purpose was to create data.

[Problem that the invention seeks to solve]

However, this method has problems when the amount of test data increases significantly as the logical scale increases, making it difficult to create the test data, and the processing time required to create the data also increases significantly.

The purpose of the present invention is to enable the creation of a limited amount of test data in a short processing time by extracting data from logic simulation results, mainly for large-scale logic circuits, as shown in Figure 2. The object of the present invention is to provide an inspection data creation device that provides the following features.

[Means for solving problems]

The above purpose is to provide an extraction condition reading means for reading and storing extraction conditions for test data to be extracted from the logic difference results of a logic circuit or a device including the logic circuit, and to store the logic difference results in creating test data for logic circuits. a logical simulation result reading means for reading and storing the logical simulation results; an extraction condition determining means for comparing and determining the extraction conditions with the logical simulation results in order to determine the timing of extraction; and extracting data from the logical simulation results in accordance with the extraction condition determination. This is achieved by providing data extraction means.

[Effect]

Logic simulation results are not used after logic verification is completed, but we focused on the fact that they contain valid data for confirming the functional operation of logic circuits. In order to perform a functional test, test data can be created simply by describing the extraction conditions for the test data to be extracted from the results of a physical simulation.

〔Example〕

Hereinafter, one embodiment of the '4 invention will be described with reference to FIG. 1
is a logic simulation result, which is a result of logic verification of a logic circuit to be tested or a device including a logic circuit to be tested, stored in a file, for example. Reference numeral 2 is an extraction condition, which describes the signal name and extraction timing of test data to be extracted from the logic simulation result 1, and is given in, for example, a card format. 6 is an inspection data extraction routine, which extracts data from the logic simulation result 1 according to extraction conditions 2; Reference numeral 4 denotes extracted test data, which is stored in a file, for example, of input values applied from the test device to the logic circuit under test and expected output values when the input values are applied.

FIG. 4 shows an example of extraction conditions, and FIG. 5 shows extraction timing. The extraction conditions are defined by C0ND in FIG. C3
IG1, C3IG2, and C5IG3 are condition signals that define extraction timing.

5IG1 and 5IG2 are signals to be extracted. Extraction condition C0
The meaning of ND is as follows. C3lG1C5IO2,
When a signal change occurs in any of C3IO2, this condition is checked and C3rG1 is high level and C3IG2 is low level, '! ? , :&tCSIG3 is at a high level, the extraction condition is satisfied. The signal value of 5IG1 10 days after the time when the extraction condition is satisfied and the signal value of 5IG2 1521 days later are extracted as the signal values of 5IG1 and 5IG2, respectively. In the example of FIG. 5, the times i, I, t
2, the extraction conditions are checked at t3 and t4, and it is found that they hold true at t2 and t4. Therefore, time t2
The low level signal value of 5IG1 at time i2+15n8 and the high level signal value of 5IG2 at time i2+15n8 are extracted as signal values for one test of each 5IG1.5IG2. Similarly, at time ta + 10 na,
The high level and low level signal values of 5IG1 and 5IG2 at t4+15 ns are extracted as signal values for one subsequent test.

FIG. 6 is a block diagram showing an example of the configuration of the inspection data extraction routine 5 of FIG. 3. 5 is an extraction condition reading routine, 6 is an extraction condition signal list, 7 is an extraction condition table, 8 is an extraction condition signal list, 9 is a logic simulation result reading routine, 10 is a signal value table, 11 is an extraction condition determination routine, and 12 is an extraction condition determination routine. This is a data extraction routine. First, the extraction conditions prepared in advance are read in the extraction condition reading routine 5, and the extracted signal name is written in the extraction condition table 7, the conditions for the extraction condition are written in the extraction condition table 7, and the signal name described in the extraction condition is registered in the extraction condition signal list 8. Regarding the extraction condition C0ND in FIG. 4, 5IG1.5IG2 is placed in the extracted signal list 6, C3IG1. C3rG2 and C5IO2 are registered in the extraction condition signal list 8, and the signal level 1°0.1 necessary for the extraction condition to be satisfied and the concatenation symbols AND and OR are registered in the extraction condition table 7. Next, read the signal name and signal value in logic simulation result reading routine 9,
When it is determined that the signal name belongs to the extracted signal list 6 or the extraction condition signal list 8, the signal value is stored in the signal value table 10. This signal value table 10 collectively stores signal values for a certain period of time.

FIG. 7 shows an example in which the extraction condition C0ND in FIG. 4 is expanded into a table. Arrows are pointers. The signal value read from the logic simulation result is stored in the area in the signal value table pointed to by each signal registered in the extracted signal list and the extraction condition signal list. Next, in the extraction condition determination routine 11, the signal values of the signals listed in the extraction condition signal list 8 are read from the signal value tape A-10, and the presence or absence of a signal change at each time is detected.

If a signal change is detected, does the extraction condition including the above signal hold? judge. This judgment is based on extraction condition table 7.
, the extraction condition signal list 8 and the signal value table 10. When it is determined that the extraction conditions are met, the data extraction routine 12 determines the extraction time of each signal listed in the extracted signal list B, reads the signal value at the corresponding time from the signal value table 10, and outputs it as test data. FIG. 8 shows the inspection data extracted in the example of FIGS. 4 and 5. Test 1. Test 2 is at time t2゜t.
This is a signal value extracted according to the extraction conditions established in step 4.

By repeating this process of data extraction from logic simulation reading, test data for the logic circuit can be created.

〔Effect of the invention〕

The present invention is mainly effective for testing large-scale logic circuits, and by extracting test data from logic simulation results, the functional operation of logic can be verified. In addition, compared to the conventional test data creation method, it is possible to create test data without considering the logic circuit structure, which requires less processing time, and the test data is created based on the extraction conditions. This has the effect of controlling the amount of

[Brief explanation of the drawing]

Figure 1 is a flowchart of processing and data from logic design to inspection data creation using a conventional method, Figure 2 is a flowchart of an embodiment of the present invention, and Figure 5 is inspection data creation showing an embodiment of the present invention. A block diagram of the method, FIG. 4 is a display diagram of an example of extraction conditions, FIG. 5 is a diagram showing a display example showing the signal waveforms and extraction timing of the condition signal and extracted signal in FIG. 4, and FIG. A block diagram of the inspection data extraction routine in Fig. 3,
FIG. 7 is an explanatory diagram showing the contents of the table in FIG. 6, and FIG. 8 is an explanatory diagram of inspection data. 2... Extraction conditions, 5... Test data extraction routine,
4... Inspection data, 5... Extraction condition reading routine, 6... Signal list to be extracted, 7... Extraction condition table, 10... Signal value table, 12... Data extraction routine. 7, - Representative patent attorney Masaru Ogawa 1 Figure 2 Figure 3 Figure 4 Figure COND: C3l (: rl-1, AND, C3
lCr2 = 0.0 shaku C3lG3 = ISELECT
5lcrl DELAγ(io)SI:1. ECT
5IG2 DALAγ(l!I) Fig. 5 i, Spear 2 ”3 4 Fig. A

Claims (1)

[Claims] 1. In creating test data for a logic circuit, extraction condition reading means reads and stores extraction conditions for test data to be extracted from logic simulation results of the logic circuit or a device including the logic circuit, and reads and stores the logic simulation results. a means for reading the logical simulation results to be stored; an extraction condition determining means for comparing and determining the extraction conditions with the logical simulation results in order to determine the timing of extraction; and extracting data from the logical simulation results in accordance with the extraction condition determination. What is claimed is: 1. An inspection data creation device characterized by comprising: data extraction means.