JPS62293356A - テスト信号発生回路 - Google Patents

テスト信号発生回路

Info

Publication number
JPS62293356A
JPS62293356A JP61136692A JP13669286A JPS62293356A JP S62293356 A JPS62293356 A JP S62293356A JP 61136692 A JP61136692 A JP 61136692A JP 13669286 A JP13669286 A JP 13669286A JP S62293356 A JPS62293356 A JP S62293356A
Authority
JP
Japan
Prior art keywords
signal
circuit
inverter
output
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61136692A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0548493B2 (enrdf_load_stackoverflow
Inventor
Sukeyuki Tofuku
東福 祐之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP61136692A priority Critical patent/JPS62293356A/ja
Publication of JPS62293356A publication Critical patent/JPS62293356A/ja
Publication of JPH0548493B2 publication Critical patent/JPH0548493B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
JP61136692A 1986-06-11 1986-06-11 テスト信号発生回路 Granted JPS62293356A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61136692A JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61136692A JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Publications (2)

Publication Number Publication Date
JPS62293356A true JPS62293356A (ja) 1987-12-19
JPH0548493B2 JPH0548493B2 (enrdf_load_stackoverflow) 1993-07-21

Family

ID=15181236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61136692A Granted JPS62293356A (ja) 1986-06-11 1986-06-11 テスト信号発生回路

Country Status (1)

Country Link
JP (1) JPS62293356A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015170146A (ja) * 2014-03-07 2015-09-28 アルプス電気株式会社 電子回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015170146A (ja) * 2014-03-07 2015-09-28 アルプス電気株式会社 電子回路

Also Published As

Publication number Publication date
JPH0548493B2 (enrdf_load_stackoverflow) 1993-07-21

Similar Documents

Publication Publication Date Title
KR910000738B1 (ko) 동작 테스트실행에 적합한 반도체 집적회로
JP2005514595A5 (enrdf_load_stackoverflow)
US6061282A (en) Semiconductor memory having an improved test circuit
US6242948B1 (en) Semiconductor integrated circuit device
KR100468675B1 (ko) 스태틱램자기테스트회로의어드레스발생기및어드레스발생방법
KR900001492B1 (ko) 내부회로의 동작모드 스위칭 기능을 갖는 반도체 집적회로
JPH0541088A (ja) 半導体集積回路
JPH0743399B2 (ja) 半導体回路
JPS5928986B2 (ja) 半導体集積回路
JPS62293356A (ja) テスト信号発生回路
US20100164559A1 (en) Power-on circuit
US4287442A (en) Edge sense latch
JP3076267B2 (ja) 半導体集積回路
JP2001228220A (ja) 半導体装置のテスト回路
KR100760948B1 (ko) 입력 변화 감지 회로
US3728552A (en) Control device for a selective matrix of a data memory with selective access
KR100192583B1 (ko) 출력버퍼회로
JPS6310538A (ja) テスト回路内蔵型集積回路
JPH0536775A (ja) 半導体装置
JPH0331013B2 (enrdf_load_stackoverflow)
JPH0425779A (ja) 半導体集積回路内のテストモード設定回路
JPH04369490A (ja) 半導体集積回路
JPS58225416A (ja) 電子回路のオ−トクリア方法
JPH0750341A (ja) 入力セル
JPH0843501A (ja) モード設定回路