JPS62285379A - Adaptor for measurement of ic - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

Detailed Description of the Invention 3. Detailed Description of the Invention This invention relates to an IC measurement adapter used in measuring the electrical characteristics of an IC.

A device for measuring the characteristics of an IC is equipped with a special socket into which the IC is inserted, and the IC is directly inserted into the socket.

There will be 2. However, recently, ICs with the same electrical characteristics but different pancages have been developed. This is inconvenient because it is necessary to prepare several devices each having a dedicated socket for the IC.

This invention was made in view of the above circumstances, and its purpose is to make it possible to measure different types of ICs with one device by using an I'C measurement adapter between the IC and the device. shall be.

The IC measurement adapter according to the present invention includes an IC-side socket dedicated to the IC whose characteristics are to be measured, a first mounting plate to which the lC1llll socket is attached, and a first mounting plate to which the first mounting plate is attached. a device-side socket portion, the device-side socket portion including a second mounting plate, a spacer interposed between the socket attached to the second mounting plate and the first mounting plate; and said socket and I CfJI1.
A connection means is provided for electrically connecting one socket to another.

First, select an IC measurement adapter dedicated to the IC you want to measure, and insert the IC into the IC socket. On the other hand, insert the socket of the IC measurement adapter into the socket on the device side. If the Jfl of the IC is different, replace the I (JIJ standard adapter).

Fig. 1 is a perspective view showing an embodiment of an IC measurement adapter according to the present invention and a mini-flat package type RC and measurement device connected thereto, and Fig. 2 is an IC/1III
FIG. 3 is an exploded perspective view of the IC measurement adapter.

In Figure 1, 10 is a mini-flunt type ■Cl2
O is an IC measurement adapter, and 30 is an IC device.

Here, as shown in FIG. 3, the IC measurement adapter 20 includes an IC side socket 21 dedicated to the ICl0, a first mounting plate 22 to which the IC side socket 21 is attached, and a It includes a device-side socket portion 23 that is connected to the device side.

Here, the IC side socket 21 is a well-known one, and as shown in FIGS. 1 and 2, a base 211 and a base 21
1 and a clamper 211B that clamps the presser plate 21.

The first mounting plate 22 has an IC side socket 2 in its center.
An opening 221 is provided into which the leg of the ICIl socket 21 and the socket mounting plate 22 are inserted, and a screw hole 222 is provided around the opening 221 into which a screw 211C for fixing the ICIl socket 21 and the socket mounting plate 22 is inserted. Also, the socket mounting plate 22
Screw insertion holes 224 into which screws 223 are inserted are provided at the four corners.

The device-side socket part 23 includes a second mounting plate 231, two sockets 232, a spacer 231B for spacing a predetermined distance between the first mounting plate 22 and the second mounting plate 231, and a second mounting plate 231.
Movable stem 233 attached to the four corners of the mounting plate 231 of
Contains. The second mounting plate 231 has two rectangular openings 2314 in its center. Note that the spacer 231B is provided with a tapped hole into which the screw 223 is screwed.

Although the socket 232 is also a known one, this socket 2
32 does not need to be dedicated to the IC, and may be anything that can be connected to the socket 321 of the device 30.

Preferably, there are two sockets 232, which face the opening 231A of the second mounting plate 231, and whose leads 232A protrude downward. In a preferred embodiment, as shown in FIG. 3, opposing contact pieces of the socket 232 are electrically connected to each other by a conductor 232B. It is not necessarily necessary to provide two sockets 232 in this way. However, by providing two
Electrical connections become more secure.

The movable stem 233 is loosely fitted with screws at the four corners of the second mounting plate 231, and a roller 233A is formed on its head, while a rubber-like cushioning material 233B is formed on the bottom of its foot. An attached contact plate 233C is provided.

Although this movable stem 233 is not necessarily required in the present invention, by providing it, unreasonable force is applied to the socket 232 when the socket 232 in the IC measurement adapter 20 is inserted into the device side socket 321 of the device 30. It prevents Therefore, IC measurement adapter 20
There is less risk of damaging the socket 232 inside.

The device 30 includes a box 31, a measuring circuit (not shown) provided inside the box 31, and a receptacle 3 to which a device-side socket 321 is attached.
It is composed of 2.

W is a lead wire, and this lead wire W passes through the opening 221 and connects to the IC side socket 21 as shown in FIG.
and the socket 232 are electrically connected. Although not shown, an appropriate printed wiring board or the like may be used instead of the lead wire W.

FIG. 4 is a perspective view showing the I(Jllll circumferential adapter 20A, DIP type ICl0A, and measuring device 30.

In the figure, the IC measurement adapter 20A has the same configuration as the IC measurement adapter 20 except that it has a tC side socket 21A dedicated to the DIP type IClOA.

The IC measurement adapter 20.2°A thus configured is used in the following procedure.

■T that has a dedicated socket for the IC to be measured
C>11 adapter (e.g. IC measurement adapter 20
) and insert the socket 232 into the device-side socket 321 of the device 30. In this case, by applying the movable stem 233 to the box 31 and rotating it, the distance between the device side socket 321 and the socket 232 is adjusted.

■ EC side socket 21 of IC measurement adapter 20
Insert the device into the device, operate the device, and measure the characteristics.

The IC measuring adapter according to this invention is designed specifically for IC.
Although it has a side socket, the device side socket is the same as the device socket, so different types of IC
It is very convenient because there is no need to replace the device when measuring.

[Brief explanation of drawings]

FIG. 1 is a perspective view showing an embodiment of an IC measurement adapter according to the present invention, a mini-flat package type IC connected to it, and a measurement device, FIG. 2 is a side view of the IC measurement adapter, and FIG. 3 is a side view of the IC measurement adapter. The figure is an exploded perspective view of the IC measurement adapter, and Figure 4 shows the IC measurement adapter and DIP type IC.
and a perspective view showing a measuring device. 10.10A...IC, 20...IC measurement adapter, 21...IC side socket, 22...first mounting plate, 23...device side socket part, 231B...
Spacer, 232... Socket, 30... Device.

Claims (1)

[Claims] (1) An IC-side socket dedicated to the IC whose characteristics are to be measured;
The device includes a first mounting plate to which an IC-side socket is attached, and a device-side socket portion to which the first mounting plate is attached, and the device-side socket portion is connected to a second mounting plate and a second mounting plate. A spacer is provided between the socket to be mounted and the first mounting plate, and a connecting means is provided for electrically connecting the socket and the IC-side socket. IC measurement adapter.