JPS593378U - IC test socket jig - Google Patents

IC test socket jig

Info

Publication number
JPS593378U
JPS593378U JP9671382U JP9671382U JPS593378U JP S593378 U JPS593378 U JP S593378U JP 9671382 U JP9671382 U JP 9671382U JP 9671382 U JP9671382 U JP 9671382U JP S593378 U JPS593378 U JP S593378U
Authority
JP
Japan
Prior art keywords
test socket
connector
socket
socket jig
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9671382U
Other languages
Japanese (ja)
Inventor
明 金山
古川　富美
Original Assignee
沖電気工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 沖電気工業株式会社 filed Critical 沖電気工業株式会社
Priority to JP9671382U priority Critical patent/JPS593378U/en
Publication of JPS593378U publication Critical patent/JPS593378U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図ａ、　ｂはそれぞれ従来のＩＣ試験用ソケット治
具の説明図、第２図は本考案ＩＣ試験用ソケット治具の
一実施例を示す正面図である。 ２１・・・フラット形ソケット本体、２２・・・ソケッ
　　　′ト取付基板、２３・・・子側コネ多夕、２４・
・・新制コ　−ネクタ、２５・・・コネクタ取付基板、
２６・・・接続端子、２７・・・ソケット端子、２８・
・・試験回路への導線、２９・・・付加回路部品。FIGS. 1a and 1b are explanatory diagrams of conventional IC test socket jigs, respectively, and FIG. 2 is a front view showing an embodiment of the IC test socket jig of the present invention. 21... Flat type socket body, 22... Socket mounting board, 23... Child side connector data, 24...
...New connector, 25...Connector mounting board,
26...Connection terminal, 27...Socket terminal, 28.
...Conductor to the test circuit, 29...Additional circuit parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 子側としてフラット形ソケット本体をソケット取付基板
に実装し、その基板パターンと電気的に接続したコネク
タ又は接触具を介して別にコネクタを実装した新制のコ
ネクタ取付基板に電気的に接続したことを特徴とするＩ
Ｃ試験用ソケット治具。The main feature is that the flat socket body is mounted on a socket mounting board as the slave side, and electrically connected to a new connector mounting board on which a separate connector is mounted via a connector or contact tool that is electrically connected to the board pattern. I
C test socket jig.
JP9671382U 1982-06-29 1982-06-29 IC test socket jig Pending JPS593378U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9671382U JPS593378U (en) 1982-06-29 1982-06-29 IC test socket jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9671382U JPS593378U (en) 1982-06-29 1982-06-29 IC test socket jig

Publications (1)

Publication Number Publication Date
JPS593378U true JPS593378U (en) 1984-01-10

Family

ID=30230367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9671382U Pending JPS593378U (en) 1982-06-29 1982-06-29 IC test socket jig

Country Status (1)

Country Link
JP (1) JPS593378U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62285379A (en) * 1986-06-03 1987-12-11 ロ−ム株式会社 Adaptor for measurement of ic
JPS6317474U (en) * 1986-07-18 1988-02-05
JPH01223364A (en) * 1988-03-02 1989-09-06 Matsushita Electron Corp Semiconductor device measuring apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54156479A (en) * 1978-05-30 1979-12-10 Mitsubishi Electric Corp Test unit for integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54156479A (en) * 1978-05-30 1979-12-10 Mitsubishi Electric Corp Test unit for integrated circuit device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62285379A (en) * 1986-06-03 1987-12-11 ロ−ム株式会社 Adaptor for measurement of ic
JPS6317474U (en) * 1986-07-18 1988-02-05
JPH01223364A (en) * 1988-03-02 1989-09-06 Matsushita Electron Corp Semiconductor device measuring apparatus

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