JPS6317474U - - Google Patents

Info

Publication number
JPS6317474U
JPS6317474U JP11033386U JP11033386U JPS6317474U JP S6317474 U JPS6317474 U JP S6317474U JP 11033386 U JP11033386 U JP 11033386U JP 11033386 U JP11033386 U JP 11033386U JP S6317474 U JPS6317474 U JP S6317474U
Authority
JP
Japan
Prior art keywords
wiring board
burn
stand
test unit
lower wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11033386U
Other languages
Japanese (ja)
Other versions
JPH058532Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986110333U priority Critical patent/JPH058532Y2/ja
Publication of JPS6317474U publication Critical patent/JPS6317474U/ja
Application granted granted Critical
Publication of JPH058532Y2 publication Critical patent/JPH058532Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来のＩＣバーンイン試験用ユニツト
の側面図、第２図は他の従来例を示すＩＣバーン
イン試験用ユニツトの平面図である。第３図乃至
第６図は本考案の実施例を示し、第３図はＩＣバ
ーンイン試験用ユニツトの斜視図、第４図は第３
図Ａ―Ａ線断面図、第５図は同Ｂ―Ｂ線断面図、
第６図は他例を示す複合ＩＣバーンイン試験用ユ
ニツトの断面図である。 １１…バーンイン用配線基板、１１ａ…カード
エツジ、１２…載台、１３…部品収容スペース、
１４…ＩＣソケツト、１４ａ…ソケツト端子、１
５…スペーサ、１６…螺子、１７…ソケツト端子
挿入用開口。 FIG. 1 is a side view of a conventional IC burn-in test unit, and FIG. 2 is a plan view of another conventional IC burn-in test unit. 3 to 6 show an embodiment of the present invention, FIG. 3 is a perspective view of an IC burn-in test unit, and FIG. 4 is a perspective view of an IC burn-in test unit.
Figure 5 is a sectional view taken along the line A-A, and Figure 5 is a sectional view taken along the line B-B.
FIG. 6 is a sectional view of another example of a composite IC burn-in test unit. 11... Burn-in wiring board, 11a... Card edge, 12... Mounting stand, 13... Parts storage space,
14...IC socket, 14a...socket terminal, 1
5...Spacer, 16...Screw, 17...Socket terminal insertion opening.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] バーンイン用配線基板上位に載台を床高に支架
して二段構造とし、該載台にＩＣソケツトを搭載
してその端子を下位の配線基板に挿入接続すると
共に、下位の配線基板に抵抗等の試験用部品を実
装して配線基板と載台間に配置したことを特徴と
するＩＣバーンイン試験用ユニツト。 A stand is supported at floor height above the burn-in wiring board to create a two-tiered structure, and an IC socket is mounted on the stand, its terminals are inserted and connected to the lower wiring board, and resistors, etc. are connected to the lower wiring board. 1. An IC burn-in test unit characterized by mounting test components and placing them between a wiring board and a mounting table.
JP1986110333U 1986-07-18 1986-07-18 Expired - Lifetime JPH058532Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986110333U JPH058532Y2 (en) 1986-07-18 1986-07-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986110333U JPH058532Y2 (en) 1986-07-18 1986-07-18

Publications (2)

Publication Number Publication Date
JPS6317474U true JPS6317474U (en) 1988-02-05
JPH058532Y2 JPH058532Y2 (en) 1993-03-03

Family

ID=30989247

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986110333U Expired - Lifetime JPH058532Y2 (en) 1986-07-18 1986-07-18

Country Status (1)

Country Link
JP (1) JPH058532Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02241457A (en) * 1989-03-15 1990-09-26 Nippon Seiyaku Kk Integrated nutritious liquid formulation for infusion and bag therefor

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593378U (en) * 1982-06-29 1984-01-10 沖電気工業株式会社 IC test socket jig

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134581A (en) * 1976-12-20 1979-01-16 International Business Machines Corporation Virtual bin collator control

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS593378U (en) * 1982-06-29 1984-01-10 沖電気工業株式会社 IC test socket jig

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02241457A (en) * 1989-03-15 1990-09-26 Nippon Seiyaku Kk Integrated nutritious liquid formulation for infusion and bag therefor

Also Published As

Publication number Publication date
JPH058532Y2 (en) 1993-03-03

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