JPH0775181B2 - IC measurement adapter - Google Patents

Description

Description: INDUSTRIAL APPLICABILITY The present invention relates to an IC used for measuring electrical characteristics of an IC.
Regarding measurement adapter.

Conventional technology The device for measuring the characteristics of an IC is equipped with a dedicated socket into which the IC is inserted, and the IC is directly inserted into the socket.

DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention However, ICs having the same electrical characteristics and different packages have been developed recently, and if such an IC is used in the conventional measuring device (hereinafter referred to as device),
It is inconvenient because it is necessary to prepare some devices each having a socket dedicated to the IC each time the type of IC changes.

The present invention has been made in view of the above circumstances, and an object thereof is to enable measurement of different types of ICs with one device by using an IC measurement adapter between the IC and the device. .

Means for Solving the Problems An IC measurement adapter according to the present invention includes an IC socket in which an IC whose characteristic is to be measured using a measuring device is mounted, and a first mounting plate for mounting the IC socket on an upper surface. A plug connector that is paired with a measurement signal input connector provided on the measuring device, a second mounting plate for mounting the plug connector on the lower surface, and a space between the first mounting plate and the second mounting plate. A spacer for restricting the distance between the two, a connecting means for electrically connecting the IC socket and the plug connector, and a screw screwed to each corner of the second mounting plate and having its lower end. Is provided with a stem that abuts on the peripheral surface of the measurement signal input connector so as to float the second mounting plate from the surface in a height-adjustable manner.

Action Insert the plug connector of the IC measurement adapter into the measurement signal input connector provided on the measuring device. The height of the stem is adjusted in advance so that the lower end of the stem contacts the peripheral surface of the measurement signal input connector while the plug connector is completely inserted into the measurement signal input connector. Then, even if the plug connector is forcibly inserted into the measurement signal input connector, the large force at this time does not act on the plug connector or the like. Then, the height is adjusted so that the lower end of the stem is raised, and the plug connector is completely inserted into the measurement signal input connector.
After that, when the IC is mounted in the IC socket, the IC is electrically connected to the measuring device through the IC socket, the connecting means, the plug connector, and the measurement signal input connector sequentially. When changing the IC whose characteristics should be measured to another type, remove the IC measurement adapter that is connected to the measurement signal input connector and use another IC measurement that has the IC socket used for the changed IC. Make sure to connect the adapter.

Embodiment FIG. 1 is a perspective view showing an embodiment of an IC measuring adapter according to the present invention, a mini flat package type IC connected to the IC measuring adapter, and a measuring device, and FIG. 2 is a side view of the IC measuring adapter. FIG. 3 is an exploded perspective view of the IC measuring adapter.

The IC measurement adapter shown in these figures includes an IC side socket 21 (corresponding to an IC socket) in which the mini-flat type IC 10 is mounted, and a first mounting plate 22 for mounting the IC side socket 21 on the upper surface. And a device to measure the characteristics of IC10 etc.
A socket 232 (corresponding to a measurement signal input connector) provided in 30 and a socket 232 (corresponding to a plug connector), a second mounting plate 23 for mounting the socket 232 on the lower surface, and a first Mounting plate 22 and second mounting plate 23
A spacer 231B that is provided between the IC side socket 21 and the socket 232 and that restricts the distance between the spacer 231B and the IC side socket 21;
A movable stem that is a screw threaded to each corner of the mounting plate 23 and has its lower end abutting against the peripheral surface of the socket 321 so that the second mounting plate 23 can be floated from the surface in a height-adjustable manner.
It has a basic configuration with 233 and.

Here, the IC side socket 21 is a well-known one, and as shown in FIGS. 1 and 2, a base 211 and a holding plate 211A hinged to both ends of the base 211 and a clamper 211B for clamping the holding plate 21. It consists of and.

The first mounting plate 22 is provided with an opening 221 in the center thereof for the leg portion of the IC side socket 21 to enter.
Around this is provided a screw hole 222 into which a screw 211C for fixing the IC side socket 21 and the socket mounting plate 22 is inserted.
Further, screw insertion holes 224 into which screws 223 are inserted are provided at four corners of the socket mounting plate 22.

The second mounting plate 231 is provided with two rectangular openings 231A in its central portion. The spacer 231B has screws 223
Is provided with a screw hole into which is screwed.

The socket 232 is also known, but this socket 232 is
It does not need to be dedicated to the IC, and may be anything that can be connected to the socket 321 on the device 30 side. The number of the sockets 232 is preferably two, and faces the opening 231A of the second mounting plate 231, and the lead 232A thereof projects downward.
As a preferred embodiment, as shown in FIG. 3, the socket 232 has its opposing contact pieces electrically connected by a conductor 232B. It is not always necessary to provide two sockets 232 in this way. However, by providing two, the electrical connection becomes more reliable.

The movable stem 233 is loosely fitted in four corners of the second mounting plate 231, and a knurl 233A is formed on the head thereof, while a cushioning material 233B such as rubber is attached to the bottom of the foot. The plate 233C is provided. By providing this movable stem 233, the socket on the IC measurement adapter 20 side is provided.
When the 232 is inserted into the socket 321 of the device 30, the socket 23
It prevents the unreasonable force from being added to 2. Therefore, the risk of damaging the socket 232 in the IC measurement adapter 20 is reduced.

The device 30 is composed of a box 31, a measuring circuit (not shown) provided inside the box 31, and a receptacle 32 to which a socket 321 is attached.

W is a lead wire, and this lead wire W penetrates through the opening 221, and electrically connects the IC side socket 21 and the socket 232 as shown in FIG. Although not shown, an appropriate printed wiring board or the like can be used instead of the lead wire W.

Incidentally, FIG. 4 shows an IC measuring adapter 20A having an IC side socket 21A into which a DIP type IC 10A can be mounted. I c
Except for the side socket 21A, the configuration is exactly the same as above.

The IC measuring adapters 20 and 20A thus configured are used in the following procedure.

An IC measurement adapter (for example, IC measurement adapter 20) having a dedicated socket for the IC to be measured is selected, and the socket 232 is inserted into the socket 321 of the device 30. In this case, the movable stem 233 is applied to the box 31 and rotated to adjust the distance between the socket 321 and the socket 232.

Insert the IC into the IC side socket 21 of the IC measurement adapter 20,
Operate the device and measure the characteristics.

As described above, in the case of the IC measurement adapter according to the present invention, if ones having different types of IC sockets are prepared in advance, it is possible to measure the characteristics of different types of ICs with one measuring device. It is possible and very convenient. Moreover, since the height of the peripheral surface of the measurement signal input connector of the measuring device and the second mounting plate can be adjusted by the stem, as long as the height is appropriately adjusted, the plug connector Even if the plug is forcibly inserted into the measurement signal input connector, a large force at this time does not act on the plug connector or the like, and damage can be prevented in advance.

[Brief description of drawings]

FIG. 1 is a perspective view showing an embodiment of an IC measuring adapter according to the present invention, a mini flat package type IC connected to the IC measuring adapter, and a measuring device. FIG. 2 is a side view of the IC measuring adapter. The figure shows the exploded perspective view of the IC measurement adapter, No. 4.
FIG. 1 is a perspective view showing an IC measuring adapter, a DIP type IC and a measuring device. 10, 10A …… IC, 20 …… IC measurement adapter, 21 …… IC side socket, 22 …… First mounting plate, 231 …… Second mounting plate, 231B …… Spacer, 232 …… Socket, 30 …… Device, 321 …… Socket

Claims (1)

[Claims] 1. An IC socket to which an IC whose characteristic is to be measured using a measuring device is mounted, a first mounting plate for mounting the IC socket on an upper surface, and a connector for measuring signal input provided in the measuring device. A pair of plug connector, a second mounting plate for mounting the plug connector on the lower surface, and a spacer that is provided between the first mounting plate and the second mounting plate and regulates the distance between the two. And a connecting means for electrically connecting the IC socket and the plug connector, and a screw screwed to each corner of the second mounting plate, the lower end of which is in contact with the peripheral surface of the measurement signal input connector. An adapter for IC measurement, characterized in that it comprises a stem that allows the second mounting plate to float from the surface in a height-adjustable manner.