JPS62282246A - 散乱光度測定法 - Google Patents

散乱光度測定法

Info

Publication number
JPS62282246A
JPS62282246A JP12630286A JP12630286A JPS62282246A JP S62282246 A JPS62282246 A JP S62282246A JP 12630286 A JP12630286 A JP 12630286A JP 12630286 A JP12630286 A JP 12630286A JP S62282246 A JPS62282246 A JP S62282246A
Authority
JP
Japan
Prior art keywords
light
test tube
incident
angle
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12630286A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0473740B2 (enExample
Inventor
Tadanori Shirakawa
白川　忠範
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SAAC KK
Original Assignee
SAAC KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SAAC KK filed Critical SAAC KK
Priority to JP12630286A priority Critical patent/JPS62282246A/ja
Publication of JPS62282246A publication Critical patent/JPS62282246A/ja
Publication of JPH0473740B2 publication Critical patent/JPH0473740B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G01N2021/513—Cuvettes for scattering measurements

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP12630286A 1986-05-30 1986-05-30 散乱光度測定法 Granted JPS62282246A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12630286A JPS62282246A (ja) 1986-05-30 1986-05-30 散乱光度測定法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12630286A JPS62282246A (ja) 1986-05-30 1986-05-30 散乱光度測定法

Publications (2)

Publication Number Publication Date
JPS62282246A true JPS62282246A (ja) 1987-12-08
JPH0473740B2 JPH0473740B2 (enExample) 1992-11-24

Family

ID=14931835

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12630286A Granted JPS62282246A (ja) 1986-05-30 1986-05-30 散乱光度測定法

Country Status (1)

Country Link
JP (1) JPS62282246A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2667180A4 (en) * 2011-01-21 2014-06-25 Hitachi High Tech Corp Automatic analysis device
JP2020020706A (ja) * 2018-08-02 2020-02-06 株式会社島津製作所 光散乱検出装置
US20240402203A1 (en) * 2023-05-30 2024-12-05 Shimadzu Corporation Liquid injection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2667180A4 (en) * 2011-01-21 2014-06-25 Hitachi High Tech Corp Automatic analysis device
JP2020020706A (ja) * 2018-08-02 2020-02-06 株式会社島津製作所 光散乱検出装置
US20240402203A1 (en) * 2023-05-30 2024-12-05 Shimadzu Corporation Liquid injection device

Also Published As

Publication number Publication date
JPH0473740B2 (enExample) 1992-11-24

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