JPS6227541B2 - - Google Patents

Info

Publication number
JPS6227541B2
JPS6227541B2 JP57051995A JP5199582A JPS6227541B2 JP S6227541 B2 JPS6227541 B2 JP S6227541B2 JP 57051995 A JP57051995 A JP 57051995A JP 5199582 A JP5199582 A JP 5199582A JP S6227541 B2 JPS6227541 B2 JP S6227541B2
Authority
JP
Japan
Prior art keywords
chute
row
semiconductor devices
test
distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57051995A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58168248A (ja
Inventor
Naohiko Urasaki
Masatoshi Mishima
Shigeki Takeo
Iwao Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57051995A priority Critical patent/JPS58168248A/ja
Publication of JPS58168248A publication Critical patent/JPS58168248A/ja
Publication of JPS6227541B2 publication Critical patent/JPS6227541B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57051995A 1982-03-30 1982-03-30 分配シュ−ト装置 Granted JPS58168248A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57051995A JPS58168248A (ja) 1982-03-30 1982-03-30 分配シュ−ト装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57051995A JPS58168248A (ja) 1982-03-30 1982-03-30 分配シュ−ト装置

Publications (2)

Publication Number Publication Date
JPS58168248A JPS58168248A (ja) 1983-10-04
JPS6227541B2 true JPS6227541B2 (en, 2012) 1987-06-15

Family

ID=12902430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57051995A Granted JPS58168248A (ja) 1982-03-30 1982-03-30 分配シュ−ト装置

Country Status (1)

Country Link
JP (1) JPS58168248A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0334452U (en, 2012) * 1989-08-08 1991-04-04

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6079800A (ja) * 1983-10-06 1985-05-07 ローム株式会社 電子部品取り出し装置
JPS619898U (ja) * 1984-06-25 1986-01-21 富士通株式会社 半導体装置の傾斜落下式自動送り装置
JPH0821797B2 (ja) * 1986-07-18 1996-03-04 松下電器産業株式会社 部品装着機の部品供給装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0334452U (en, 2012) * 1989-08-08 1991-04-04

Also Published As

Publication number Publication date
JPS58168248A (ja) 1983-10-04

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