JPS62261049A - Printed circuit board inspecting device - Google Patents

Printed circuit board inspecting device

Info

Publication number
JPS62261049A
JPS62261049A JP61104242A JP10424286A JPS62261049A JP S62261049 A JPS62261049 A JP S62261049A JP 61104242 A JP61104242 A JP 61104242A JP 10424286 A JP10424286 A JP 10424286A JP S62261049 A JPS62261049 A JP S62261049A
Authority
JP
Japan
Prior art keywords
circuit board
data
printed circuit
image data
criterion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61104242A
Other languages
Japanese (ja)
Other versions
JPH07107512B2 (en
Inventor
Shunji Utsunomiya
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP61104242A priority Critical patent/JPH07107512B2/en
Publication of JPS62261049A publication Critical patent/JPS62261049A/en
Publication of JPH07107512B2 publication Critical patent/JPH07107512B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method

Abstract

PURPOSE:To enable automatic selection of optimum feature parameters and automatic generation of a criterion reference data, by preparing the criterion reference data based on the distribution of features of part images and those of base circuit board images. CONSTITUTION:An inspecting device is made up of an X-Y table 14 having pins 20a and 20b for positioning printed circuit boards, a photography section 15 having a color TV camera 21 and a processing section 16 which has a teaching table 25, an image processing section 26, a keyboard 30 and the like, all controlled by a CPU31. The CPU31 extracts a part mounted area image data and a part image data separately from an image data as obtained by photographing 15 a base circuit board 9 and a reference printed circuit board 10-1 using a window (for taking in data) while automatically determining the type of a feature parameter used and the value of a criterion reference data from a color distribution of these part mounted area image data and part image data. Then, a printed circuit board 10-2 to be inspected is inspected.
JP61104242A 1986-05-07 1986-05-07 Printed circuit board inspection equipment Expired - Lifetime JPH07107512B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61104242A JPH07107512B2 (en) 1986-05-07 1986-05-07 Printed circuit board inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61104242A JPH07107512B2 (en) 1986-05-07 1986-05-07 Printed circuit board inspection equipment

Publications (2)

Publication Number Publication Date
JPS62261049A true JPS62261049A (en) 1987-11-13
JPH07107512B2 JPH07107512B2 (en) 1995-11-15

Family

ID=14375484

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61104242A Expired - Lifetime JPH07107512B2 (en) 1986-05-07 1986-05-07 Printed circuit board inspection equipment

Country Status (1)

Country Link
JP (1) JPH07107512B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0235342A (en) * 1988-07-25 1990-02-05 Datsuku Eng Kk Visual inspection method
JP2013047648A (en) * 2011-08-29 2013-03-07 Fujitsu Peripherals Ltd Inspection apparatus, inspection method and inspection program
CN108072662A (en) * 2017-11-10 2018-05-25 长春理工大学 Row's pin defect detection method and device based on machine vision

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0235342A (en) * 1988-07-25 1990-02-05 Datsuku Eng Kk Visual inspection method
JP2013047648A (en) * 2011-08-29 2013-03-07 Fujitsu Peripherals Ltd Inspection apparatus, inspection method and inspection program
CN108072662A (en) * 2017-11-10 2018-05-25 长春理工大学 Row's pin defect detection method and device based on machine vision

Also Published As

Publication number Publication date
JPH07107512B2 (en) 1995-11-15

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term