JPS62261050A - Printed circuit board inspecting device - Google Patents

Printed circuit board inspecting device

Info

Publication number
JPS62261050A
JPS62261050A JP61104243A JP10424386A JPS62261050A JP S62261050 A JPS62261050 A JP S62261050A JP 61104243 A JP61104243 A JP 61104243A JP 10424386 A JP10424386 A JP 10424386A JP S62261050 A JPS62261050 A JP S62261050A
Authority
JP
Japan
Prior art keywords
data
circuit board
printed circuit
image data
circuit boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61104243A
Other languages
Japanese (ja)
Other versions
JPH07107513B2 (en
Inventor
Teruhisa Yotsuya
Shunji Utsunomiya
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP61104243A priority Critical patent/JPH07107513B2/en
Publication of JPS62261050A publication Critical patent/JPS62261050A/en
Publication of JPH07107513B2 publication Critical patent/JPH07107513B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Abstract

PURPOSE:To automatically performing a selection of an optimum feature parameter for checking the mounted state of a part and a decision on a criterion reference data, by preparing the judging reference data based on a distribution of features of part images and base circuit boards. CONSTITUTION:An inspecting device is made up of an X-Y table section 14 having pins 20a and 20b for positioning a base circuit board 9 and printed circuit boards 10-1 and 10-2, a photography section 15 having a color TV camera 21, a teaching table 15, an image processing section 26, a keyboard 30 and the like and a processing section 16 having a CPU31 for controlling them. The CPU31 extracts a plurality of part mounted area image data and a plurality of part image data separately from image data obtained by photographing 15 is plurality of base circuit boards 9 and the reference printed circuit board 10-1 using a window (for taking in data) while automatically determining the type of feature parameter used and the value of a criterion reference data from a color distribution of these part mounted area image data and part image data to inspect the printed circuit board 10-2 to be inspected.
JP61104243A 1986-05-07 1986-05-07 Mounted board inspection teaching device and method Expired - Lifetime JPH07107513B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61104243A JPH07107513B2 (en) 1986-05-07 1986-05-07 Mounted board inspection teaching device and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61104243A JPH07107513B2 (en) 1986-05-07 1986-05-07 Mounted board inspection teaching device and method

Publications (2)

Publication Number Publication Date
JPS62261050A true JPS62261050A (en) 1987-11-13
JPH07107513B2 JPH07107513B2 (en) 1995-11-15

Family

ID=14375509

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61104243A Expired - Lifetime JPH07107513B2 (en) 1986-05-07 1986-05-07 Mounted board inspection teaching device and method

Country Status (1)

Country Link
JP (1) JPH07107513B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6332668A (en) * 1986-07-26 1988-02-12 Shigumatsukusu Kk Object recognizing device
JPH0244235A (en) * 1988-08-03 1990-02-14 Matsushita Electric Ind Co Ltd Inspection of polarity for electronic component

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6332668A (en) * 1986-07-26 1988-02-12 Shigumatsukusu Kk Object recognizing device
JPH0244235A (en) * 1988-08-03 1990-02-14 Matsushita Electric Ind Co Ltd Inspection of polarity for electronic component

Also Published As

Publication number Publication date
JPH07107513B2 (en) 1995-11-15

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term