JPS62250629A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS62250629A JPS62250629A JP61093245A JP9324586A JPS62250629A JP S62250629 A JPS62250629 A JP S62250629A JP 61093245 A JP61093245 A JP 61093245A JP 9324586 A JP9324586 A JP 9324586A JP S62250629 A JPS62250629 A JP S62250629A
- Authority
- JP
- Japan
- Prior art keywords
- film
- single crystal
- scanning
- manufacturing
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Recrystallisation Techniques (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61093245A JPS62250629A (ja) | 1986-04-24 | 1986-04-24 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61093245A JPS62250629A (ja) | 1986-04-24 | 1986-04-24 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62250629A true JPS62250629A (ja) | 1987-10-31 |
| JPH0523492B2 JPH0523492B2 (enExample) | 1993-04-02 |
Family
ID=14077122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61093245A Granted JPS62250629A (ja) | 1986-04-24 | 1986-04-24 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62250629A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5953597A (en) * | 1995-02-21 | 1999-09-14 | Semicondutor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
-
1986
- 1986-04-24 JP JP61093245A patent/JPS62250629A/ja active Granted
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5953597A (en) * | 1995-02-21 | 1999-09-14 | Semicondutor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6204099B1 (en) | 1995-02-21 | 2001-03-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6265745B1 (en) * | 1995-02-21 | 2001-07-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6709905B2 (en) * | 1995-02-21 | 2004-03-23 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US6921686B2 (en) * | 1995-02-21 | 2005-07-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US7045403B2 (en) * | 1995-02-21 | 2006-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
| US7615423B2 (en) | 1995-02-21 | 2009-11-10 | Semiconductor Energy Laboratory Co., Ltd. | Method for producing insulated gate thin film semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0523492B2 (enExample) | 1993-04-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |