JPS6223250B2 - - Google Patents

Info

Publication number
JPS6223250B2
JPS6223250B2 JP54079601A JP7960179A JPS6223250B2 JP S6223250 B2 JPS6223250 B2 JP S6223250B2 JP 54079601 A JP54079601 A JP 54079601A JP 7960179 A JP7960179 A JP 7960179A JP S6223250 B2 JPS6223250 B2 JP S6223250B2
Authority
JP
Japan
Prior art keywords
light
strip
photodetector
mirror
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54079601A
Other languages
English (en)
Japanese (ja)
Other versions
JPS556293A (en
Inventor
Zuitsuku Eruin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ERUBIN JITSUKU OPUTEIKU EREKUTORONIKU
Original Assignee
ERUBIN JITSUKU OPUTEIKU EREKUTORONIKU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ERUBIN JITSUKU OPUTEIKU EREKUTORONIKU filed Critical ERUBIN JITSUKU OPUTEIKU EREKUTORONIKU
Publication of JPS556293A publication Critical patent/JPS556293A/ja
Publication of JPS6223250B2 publication Critical patent/JPS6223250B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP7960179A 1978-06-23 1979-06-23 Detector for surface scratches on strip type element Granted JPS556293A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2827704A DE2827704C3 (de) 1978-06-23 1978-06-23 Optische Vorrichtung zur Bestimmung der Lichtaustrittswinkel

Publications (2)

Publication Number Publication Date
JPS556293A JPS556293A (en) 1980-01-17
JPS6223250B2 true JPS6223250B2 (en:Method) 1987-05-22

Family

ID=6042615

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7960179A Granted JPS556293A (en) 1978-06-23 1979-06-23 Detector for surface scratches on strip type element

Country Status (6)

Country Link
US (1) US4306813A (en:Method)
JP (1) JPS556293A (en:Method)
DE (1) DE2827704C3 (en:Method)
FR (1) FR2434387A2 (en:Method)
GB (1) GB2024415B (en:Method)
SE (1) SE440406B (en:Method)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2917875C2 (de) * 1979-05-03 1982-11-25 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Banknotenzustands-Feststellungsgerät
DE3006072C2 (de) * 1980-02-19 1984-11-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlstellenermittlungsvorrichtung für Materialbahnen
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
DE3408106A1 (de) * 1984-03-05 1985-09-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optischer rauheits-scanner
DE3709500A1 (de) * 1985-09-24 1988-10-06 Sick Optik Elektronik Erwin Optische bahnueberwachungseinrichtung mit zeilenkameras mit gerichteter beleuchtung
DE3626724C2 (de) * 1986-08-07 1994-06-16 Siemens Ag Anordnung zur Oberflächenprüfung
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
DE3741195A1 (de) * 1987-07-23 1989-02-02 Gebhard Birkle Verfahren zur qualitaetskontrolle eines flaechigen objektes, insbesondere zur fehlererkennung bei textilen stoffen, und vorrichtung hierzu
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung
DE3737631C1 (de) * 1987-11-05 1989-03-02 Sick Optik Elektronik Erwin Optische Abstastvorrichtung fuer ebene Oberflaechen
DE3741680A1 (de) * 1987-12-09 1989-06-22 Pagendarm Gmbh Verfahren und vorrichtung zum glaetten der oberflaeche einer papierbahn
NL8901380A (nl) * 1989-02-14 1990-09-03 Heuft Qualiplus Bv Simultane dubbele inspectie.
JP2809422B2 (ja) * 1989-04-12 1998-10-08 株式会社日立製作所 多色蛍光検出型電気泳動装置
JP2902408B2 (ja) * 1989-04-12 1999-06-07 株式会社日立製作所 蛍光検出型電気泳動装置
DE69008623T2 (de) * 1989-06-30 1994-08-18 Jaguar Cars Verfahren und Vorrichtung zur Untersuchung von Oberflächenfehlern.
JPH03185830A (ja) * 1989-12-15 1991-08-13 Toshiba Corp 半導体素子の製造方法
US5150175A (en) * 1991-03-13 1992-09-22 American Research Corporation Of Virginia Optical imaging system for fabric seam detection
FI92255C (fi) * 1992-10-16 1994-10-10 Data Instmsto Oy Laite painokoneella tuotetun painojäljen laadun valvontaan
JP3024742B2 (ja) * 1996-04-09 2000-03-21 株式会社日立製作所 多色蛍光検出型電気泳動装置における蛍光検出方法
US5995235A (en) * 1997-02-13 1999-11-30 Applied Materials, Inc. Bandpass photon detector
US5994712A (en) * 1997-07-29 1999-11-30 Mack; John Edward Belt flaw detector
JP4604900B2 (ja) 2005-07-28 2011-01-05 ソニー株式会社 スピーカ用ダンパー及びスピーカ用ダンパー組み付け方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL279098A (en:Method) * 1961-05-31
US3984189A (en) * 1973-01-19 1976-10-05 Hitachi Electronics, Ltd. Method and apparatus for detecting defects in a surface regardless of surface finish
US3922090A (en) * 1974-06-28 1975-11-25 Teknekron Inc Method and apparatus for authenticating documents
DE2433683C3 (de) * 1974-07-12 1979-02-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn auf Fehlstellen
JPS5210793A (en) * 1975-07-15 1977-01-27 Yaskawa Electric Mfg Co Ltd Fault detector
CH608628A5 (en:Method) * 1975-11-21 1979-01-15 Sick Optik Elektronik Erwin
GB1592449A (en) * 1976-12-01 1981-07-08 Ferranti Ltd Optical inspection apparatus
DE2800351B2 (de) * 1978-01-04 1979-11-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Also Published As

Publication number Publication date
JPS556293A (en) 1980-01-17
DE2827704B2 (de) 1980-04-30
DE2827704C3 (de) 1981-03-19
FR2434387B2 (en:Method) 1984-06-01
US4306813A (en) 1981-12-22
DE2827704A1 (de) 1980-01-17
SE440406B (sv) 1985-07-29
GB2024415A (en) 1980-01-09
SE7905471L (sv) 1979-12-24
GB2024415B (en) 1982-12-22
FR2434387A2 (fr) 1980-03-21

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