JPS6220311A - 間隙検出装置 - Google Patents
間隙検出装置Info
- Publication number
- JPS6220311A JPS6220311A JP60158114A JP15811485A JPS6220311A JP S6220311 A JPS6220311 A JP S6220311A JP 60158114 A JP60158114 A JP 60158114A JP 15811485 A JP15811485 A JP 15811485A JP S6220311 A JPS6220311 A JP S6220311A
- Authority
- JP
- Japan
- Prior art keywords
- gap
- wafer
- mask
- pattern
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/703—Gap setting, e.g. in proximity printer
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60158114A JPS6220311A (ja) | 1985-07-19 | 1985-07-19 | 間隙検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60158114A JPS6220311A (ja) | 1985-07-19 | 1985-07-19 | 間隙検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6220311A true JPS6220311A (ja) | 1987-01-28 |
JPH0464453B2 JPH0464453B2 (enrdf_load_stackoverflow) | 1992-10-15 |
Family
ID=15664609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60158114A Granted JPS6220311A (ja) | 1985-07-19 | 1985-07-19 | 間隙検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6220311A (enrdf_load_stackoverflow) |
-
1985
- 1985-07-19 JP JP60158114A patent/JPS6220311A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0464453B2 (enrdf_load_stackoverflow) | 1992-10-15 |
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