JPS6218715A - 反射型投影露光機 - Google Patents
反射型投影露光機Info
- Publication number
- JPS6218715A JPS6218715A JP60159011A JP15901185A JPS6218715A JP S6218715 A JPS6218715 A JP S6218715A JP 60159011 A JP60159011 A JP 60159011A JP 15901185 A JP15901185 A JP 15901185A JP S6218715 A JPS6218715 A JP S6218715A
- Authority
- JP
- Japan
- Prior art keywords
- alignment
- optical system
- mirror
- mask
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 52
- 239000000758 substrate Substances 0.000 abstract description 29
- 238000001514 detection method Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 241000269400 Sirenidae Species 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60159011A JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60159011A JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6218715A true JPS6218715A (ja) | 1987-01-27 |
JPH0528487B2 JPH0528487B2 (enrdf_load_stackoverflow) | 1993-04-26 |
Family
ID=15684292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60159011A Granted JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6218715A (enrdf_load_stackoverflow) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5356975A (en) * | 1976-11-01 | 1978-05-23 | Hitachi Ltd | Exposure apparatus |
JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
-
1985
- 1985-07-18 JP JP60159011A patent/JPS6218715A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5356975A (en) * | 1976-11-01 | 1978-05-23 | Hitachi Ltd | Exposure apparatus |
JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0528487B2 (enrdf_load_stackoverflow) | 1993-04-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |