JPS6218715A - 反射型投影露光機 - Google Patents
反射型投影露光機Info
- Publication number
- JPS6218715A JPS6218715A JP60159011A JP15901185A JPS6218715A JP S6218715 A JPS6218715 A JP S6218715A JP 60159011 A JP60159011 A JP 60159011A JP 15901185 A JP15901185 A JP 15901185A JP S6218715 A JPS6218715 A JP S6218715A
- Authority
- JP
- Japan
- Prior art keywords
- alignment
- optical system
- mirror
- mask
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60159011A JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60159011A JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6218715A true JPS6218715A (ja) | 1987-01-27 |
| JPH0528487B2 JPH0528487B2 (cg-RX-API-DMAC7.html) | 1993-04-26 |
Family
ID=15684292
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60159011A Granted JPS6218715A (ja) | 1985-07-18 | 1985-07-18 | 反射型投影露光機 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6218715A (cg-RX-API-DMAC7.html) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5356975A (en) * | 1976-11-01 | 1978-05-23 | Hitachi Ltd | Exposure apparatus |
| JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
-
1985
- 1985-07-18 JP JP60159011A patent/JPS6218715A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5356975A (en) * | 1976-11-01 | 1978-05-23 | Hitachi Ltd | Exposure apparatus |
| JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0528487B2 (cg-RX-API-DMAC7.html) | 1993-04-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4414749A (en) | Alignment and exposure system with an indicium of an axis of motion of the system | |
| US5914774A (en) | Projection exposure apparatus with function to measure imaging characteristics of projection optical system | |
| JPH0132649B2 (cg-RX-API-DMAC7.html) | ||
| KR20010031353A (ko) | 사진석판 장치 및 방법 | |
| US4573791A (en) | Step-and-repeat projection alignment and exposure system | |
| US4643579A (en) | Aligning method | |
| US6081320A (en) | Illumination apparatus and exposure apparatus | |
| EP0111661A2 (en) | Photometric printing apparatus | |
| GB2133536A (en) | Sensing alignment | |
| US5929973A (en) | Apparatus and method for simultaneously transferring a mask pattern to both sides of a substrate | |
| JP3379238B2 (ja) | 走査型露光装置 | |
| JP3360744B2 (ja) | アライメント方法、及び走査型露光装置 | |
| GB2133565A (en) | An observation device and an aligner using same | |
| JPH0574684A (ja) | 位置合わせ装置 | |
| JPH09312248A (ja) | 露光装置 | |
| JPS6218715A (ja) | 反射型投影露光機 | |
| JPH0729815A (ja) | マスクとワークとの位置合わせ装置およびそれを使用した位置合わせ方法 | |
| JPH0528892B2 (cg-RX-API-DMAC7.html) | ||
| JPH07295229A (ja) | 拡大投影型露光装置における投影像のアライメント方法 | |
| JP2526617Y2 (ja) | 光学部品の位置合わせ装置 | |
| JP3285105B2 (ja) | ステージ駆動方法、及び走査露光方法 | |
| JP2830868B2 (ja) | 投影露光装置及び走査露光方法 | |
| JPH0259615B2 (cg-RX-API-DMAC7.html) | ||
| JPH11231549A (ja) | 走査型露光装置および露光方法 | |
| JP2986627B2 (ja) | プロキシミティ露光装置におけるマスクとワークの位置合わせ方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |