JPS62184752A - 荷電粒子ビ−ム測長機 - Google Patents

荷電粒子ビ−ム測長機

Info

Publication number
JPS62184752A
JPS62184752A JP61025525A JP2552586A JPS62184752A JP S62184752 A JPS62184752 A JP S62184752A JP 61025525 A JP61025525 A JP 61025525A JP 2552586 A JP2552586 A JP 2552586A JP S62184752 A JPS62184752 A JP S62184752A
Authority
JP
Japan
Prior art keywords
mcp
sample
charged particle
detected
particle beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61025525A
Other languages
English (en)
Japanese (ja)
Other versions
JPH051584B2 (cg-RX-API-DMAC10.html
Inventor
Masashi Ataka
正志 安宅
Ryuzo Aihara
相原　竜三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP61025525A priority Critical patent/JPS62184752A/ja
Publication of JPS62184752A publication Critical patent/JPS62184752A/ja
Publication of JPH051584B2 publication Critical patent/JPH051584B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP61025525A 1986-02-07 1986-02-07 荷電粒子ビ−ム測長機 Granted JPS62184752A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61025525A JPS62184752A (ja) 1986-02-07 1986-02-07 荷電粒子ビ−ム測長機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61025525A JPS62184752A (ja) 1986-02-07 1986-02-07 荷電粒子ビ−ム測長機

Publications (2)

Publication Number Publication Date
JPS62184752A true JPS62184752A (ja) 1987-08-13
JPH051584B2 JPH051584B2 (cg-RX-API-DMAC10.html) 1993-01-08

Family

ID=12168464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61025525A Granted JPS62184752A (ja) 1986-02-07 1986-02-07 荷電粒子ビ−ム測長機

Country Status (1)

Country Link
JP (1) JPS62184752A (cg-RX-API-DMAC10.html)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05502220A (ja) * 1989-12-07 1993-04-22 ザ ユニバーシティ オブ ブリティッシュ コロンビア チアルブリン抗真菌および抗生剤
WO2004093120A3 (en) * 2003-04-17 2004-12-09 Politechnika Wroclawska Secondary electron detector unit for a scanning electron microscope
WO2005071710A1 (en) * 2004-01-21 2005-08-04 Politechnika Wroclawska Method and system for the directional detection of electrons in a scanning electron microscope
US7531812B2 (en) 2003-10-27 2009-05-12 Politechnika Wroclawska Method and system for the directional detection of electrons in a scanning electron microscope
WO2016047538A1 (ja) * 2014-09-24 2016-03-31 国立研究開発法人物質・材料研究機構 エネルギー弁別電子検出器及びそれを用いた走査電子顕微鏡

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60124852U (ja) * 1984-02-01 1985-08-22 日本電子株式会社 電子線装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60124852U (ja) * 1984-02-01 1985-08-22 日本電子株式会社 電子線装置

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05502220A (ja) * 1989-12-07 1993-04-22 ザ ユニバーシティ オブ ブリティッシュ コロンビア チアルブリン抗真菌および抗生剤
WO2004093120A3 (en) * 2003-04-17 2004-12-09 Politechnika Wroclawska Secondary electron detector unit for a scanning electron microscope
US7425708B2 (en) 2003-04-17 2008-09-16 Politechnika Wrolawska Secondary electron detector unit for a scanning electron microscope
US7531812B2 (en) 2003-10-27 2009-05-12 Politechnika Wroclawska Method and system for the directional detection of electrons in a scanning electron microscope
WO2005071710A1 (en) * 2004-01-21 2005-08-04 Politechnika Wroclawska Method and system for the directional detection of electrons in a scanning electron microscope
WO2016047538A1 (ja) * 2014-09-24 2016-03-31 国立研究開発法人物質・材料研究機構 エネルギー弁別電子検出器及びそれを用いた走査電子顕微鏡
JPWO2016047538A1 (ja) * 2014-09-24 2017-07-20 国立研究開発法人物質・材料研究機構 エネルギー弁別電子検出器及びそれを用いた走査電子顕微鏡
US10121633B2 (en) 2014-09-24 2018-11-06 National Institute For Materials Science Energy discriminating electron detector and scanning electron microscope using the same

Also Published As

Publication number Publication date
JPH051584B2 (cg-RX-API-DMAC10.html) 1993-01-08

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term