JPS62167176U - - Google Patents

Info

Publication number
JPS62167176U
JPS62167176U JP5569186U JP5569186U JPS62167176U JP S62167176 U JPS62167176 U JP S62167176U JP 5569186 U JP5569186 U JP 5569186U JP 5569186 U JP5569186 U JP 5569186U JP S62167176 U JPS62167176 U JP S62167176U
Authority
JP
Japan
Prior art keywords
tab
electrode
printed circuit
circuit board
smaller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5569186U
Other languages
Japanese (ja)
Other versions
JPH0518708Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986055691U priority Critical patent/JPH0518708Y2/ja
Publication of JPS62167176U publication Critical patent/JPS62167176U/ja
Application granted granted Critical
Publication of JPH0518708Y2 publication Critical patent/JPH0518708Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案のＴＡＢ―ＩＣ試験治具の模式
的部分縦断面図、第２図はＴＡＢ―ＩＣの一例の
平面図である。第３図は実施例におけるプリント
基板、異方導電性シートＴＡＢ―ＩＣ、押圧板が
位置合わせされる様子を示す。第４図は本考案の
他の実施例を示す部分断面図である。 FIG. 1 is a schematic partial vertical sectional view of the TAB-IC test jig of the present invention, and FIG. 2 is a plan view of an example of the TAB-IC. FIG. 3 shows how the printed circuit board, anisotropically conductive sheet TAB-IC, and press plate are aligned in the example. FIG. 4 is a partial sectional view showing another embodiment of the present invention.

Claims (1)

【実用新案登録請求の範囲】 １ タブＩＣを直接または異方導電性シートを介
してプリント基板上に載せ、タブＩＣの電極パツ
ドと同等もしくはより小さいパターンを凸状部と
して下面に有する板材をタブＩＣ上に対向させて
積載し、プリント基板の下面および板材の上面を
それぞれ剛性盤体で挾持して加圧し、該ＩＣのＩ
／Ｏ電極と該プリント基板のパターン電極を電気
的に接続するようにしたことを特徴とするタブＩ
Ｃ電極用治具。 ２ タブＩＣの電極パツドと同等もしくは、より
小さいパターンを凸状部として有する板材が、銅
張積層板をエツチングして作られたものであるこ
とを特徴とする実用新案登録請求の範囲第１項記
載のタブＩＣ試験用治具。[Claims for Utility Model Registration] 1. A tab IC is mounted on a printed circuit board directly or via an anisotropic conductive sheet, and a plate material having a convex pattern on the lower surface that is equal to or smaller than the electrode pad of the tab IC is called a tab. The lower surface of the printed circuit board and the upper surface of the board are each held between rigid boards and pressure is applied.
A tab I characterized in that the /O electrode and the pattern electrode of the printed circuit board are electrically connected.
Jig for C electrode. 2. Scope of Utility Model Registration Claim 1, characterized in that the plate material having a convex pattern that is equal to or smaller than the electrode pad of a tab IC is made by etching a copper-clad laminate. Tab IC test jig as described.
JP1986055691U 1986-04-14 1986-04-14 Expired - Lifetime JPH0518708Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (en) 1986-04-14 1986-04-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (en) 1986-04-14 1986-04-14

Publications (2)

Publication Number Publication Date
JPS62167176U true JPS62167176U (en) 1987-10-23
JPH0518708Y2 JPH0518708Y2 (en) 1993-05-18

Family

ID=30883824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986055691U Expired - Lifetime JPH0518708Y2 (en) 1986-04-14 1986-04-14

Country Status (1)

Country Link
JP (1) JPH0518708Y2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (en) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd Testing device for integrated circuit component
JPH02156168A (en) * 1988-12-07 1990-06-15 Nec Corp Screening apparatus
JPH02148483U (en) * 1989-05-19 1990-12-17
JPH07113840A (en) * 1993-09-21 1995-05-02 Micron Technol Inc Carrier having replaceable substrate used in test of semiconductor die

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (en) * 1983-06-20 1985-01-07 Ibiden Co Ltd Jig circuit board for inspection of printed circuit board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (en) * 1983-06-20 1985-01-07 Ibiden Co Ltd Jig circuit board for inspection of printed circuit board

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (en) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd Testing device for integrated circuit component
JPH02156168A (en) * 1988-12-07 1990-06-15 Nec Corp Screening apparatus
JPH02148483U (en) * 1989-05-19 1990-12-17
JPH07113840A (en) * 1993-09-21 1995-05-02 Micron Technol Inc Carrier having replaceable substrate used in test of semiconductor die

Also Published As

Publication number Publication date
JPH0518708Y2 (en) 1993-05-18

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